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Class Information
Number: 714/735
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Digital logic testing > Device response compared to input pattern
Description: Subject matter in which the operational condition of a system or device is determined by comparing the system or device response to a test signal input pattern.

Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
8713391 System and method for testing an integrated circuit embedded in a system on a chip Apr. 29, 2014
8707113 Method for modeling a device and generating test for that device Apr. 22, 2014
8638792 Packet switch based logic replication Jan. 28, 2014
8607109 Test circuitry including core output, expected response, and mask circuitry Dec. 10, 2013
8595576 Systems and methods for evaluating and debugging LDPC iterative decoders Nov. 26, 2013
8595574 Enhanced diagnosis with limited failure cycles Nov. 26, 2013
8572446 Output circuitry with tri-state buffer and comparator circuitry Oct. 29, 2013
8572448 Apparatus and method for testing and debugging an integrated circuit Oct. 29, 2013
8549136 System for operating at least one non-safety-critical and at least one safety-critical process Oct. 1, 2013
8531322 Time-to-digital converter Sep. 10, 2013
8533169 Transactional replication Sep. 10, 2013
8522099 Embedded processor Aug. 27, 2013
8515416 Performing testing in a radio device Aug. 20, 2013
8510613 Control method of non-volatile semiconductor device Aug. 13, 2013
8479048 Root cause analysis method, apparatus, and program for IT apparatuses from which event information is not obtained Jul. 2, 2013
8458539 G-ODLAT on-die logic analyzer trigger with parallel vector finite state machine Jun. 4, 2013
8453024 I/O and comparator circuitry with compare gate and mask circuitry May. 28, 2013
8418007 On-chip comparison and response collection tools and techniques Apr. 9, 2013
8418013 Method of using virtual inputs and outputs to automate testing of application software and hardware Apr. 9, 2013
8352794 Control of clock gating Jan. 8, 2013
8335955 System and method for signal reconstruction from incomplete data Dec. 18, 2012
8327309 Verification of design information for controlling manufacture of a system on a chip Dec. 4, 2012
8312330 System and method for testing wireless devices Nov. 13, 2012
8286043 System, computer program product and method for testing a logic circuit Oct. 9, 2012
8278961 Test apparatus and test method Oct. 2, 2012
8214706 Method and apparatus for testing an electronic circuit integrated with a semiconductor device Jul. 3, 2012
8199521 Memory module and method for operating a memory module Jun. 12, 2012
8201035 Testing system and method thereof Jun. 12, 2012
8195995 Integrated circuit and method of protecting a circuit part of an integrated circuit Jun. 5, 2012
8176371 Embedded processor May. 8, 2012
8145967 System and method for verifying the receive path of an input/output component Mar. 27, 2012
8090565 System and method for using model analysis to generate directed test vectors Jan. 3, 2012
8069378 Method and apparatus for evaluating and optimizing a signaling system Nov. 29, 2011
8051343 Method of testing a memory module and hub of the memory module Nov. 1, 2011
8020057 Comparator circuitry connected to input and output of tristate buffer Sep. 13, 2011
8010851 Testing module, testing apparatus and testing method Aug. 30, 2011
8006152 Scan chain fail diagnostics Aug. 23, 2011
8006156 Method of generating test condition for detecting delay faults in semiconductor integrated circuit and apparatus for generating the same Aug. 23, 2011
8001439 Integrated circuit testing module including signal shaping interface Aug. 16, 2011
7996742 Circuit arrangement and method for checking the function of a logic circuit in a circuit arrangement Aug. 9, 2011
7992059 System and method for testing a large memory area during processor design verification and validation Aug. 2, 2011
7991081 Process and devices for transmitting digital signals over buses and computer program product therefore Aug. 2, 2011
7970594 System and method for using model analysis to generate directed test vectors Jun. 28, 2011
7966528 Watchdog mechanism with fault escalation Jun. 21, 2011
7966527 Watchdog mechanism with fault recovery Jun. 21, 2011
7941716 Method for race prevention and a device having race prevention capabilities May. 10, 2011
7934136 Test apparatus, pattern generator, test method and pattern generating method Apr. 26, 2011
7930601 AC ABIST diagnostic method, apparatus and program product Apr. 19, 2011
7930609 Apparatus and method for verifying target circuit Apr. 19, 2011
7925949 Embedded processor Apr. 12, 2011

1 2 3 4 5 6 7 8

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