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Class Information
Number: 714/733
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Digital logic testing > Built-in testing circuit (bilbo)
Description: Subject matter in which the digital logic testing equipment includes a selectively configurable shift register, structurally a part of the device being tested.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 6658617 |
Handling a 1-hot multiplexer during built-in self-testing of logic |
Dec. 2, 2003 |
| 6658610 |
Compilable address magnitude comparator for memory array self-testing |
Dec. 2, 2003 |
| 6656751 |
Self test method and device for dynamic voltage screen functionality improvement |
Dec. 2, 2003 |
| 6654905 |
Method and apparatus for detecting a fault condition in a computer processor |
Nov. 25, 2003 |
| 6654920 |
LBIST controller circuits, systems, and methods with automated maximum scan channel length |
Nov. 25, 2003 |
| 6654919 |
Automated system for inserting and reading of probe points in silicon embedded testbenches |
Nov. 25, 2003 |
| 6651196 |
Semiconductor device having test mode entry circuit |
Nov. 18, 2003 |
| 6651202 |
Built-in self repair circuitry utilizing permanent record of defects |
Nov. 18, 2003 |
| 6651201 |
Programmable memory built-in self-test combining microcode and finite state machine self-test |
Nov. 18, 2003 |
| 6647524 |
Built-in-self-test circuit for RAMBUS direct RDRAM |
Nov. 11, 2003 |
| 6647511 |
Reconfigurable datapath for processor debug functions |
Nov. 11, 2003 |
| 6646459 |
Method for disabling and re-enabling access to IC test functions |
Nov. 11, 2003 |
| 6643257 |
Verifying performance of a buffering and selection network device |
Nov. 4, 2003 |
| 6643804 |
Stability test for silicon on insulator SRAM memory cells utilizing bitline precharge stress operations to stress memory cells under test |
Nov. 4, 2003 |
| 6642736 |
Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits |
Nov. 4, 2003 |
| 6643811 |
System and method to test internal PCI agents |
Nov. 4, 2003 |
| 6634003 |
Decoding circuit for memories with redundancy |
Oct. 14, 2003 |
| 6629281 |
Method and system for at speed diagnostics and bit fail mapping |
Sep. 30, 2003 |
| 6629280 |
Method and apparatus for delaying ABIST start |
Sep. 30, 2003 |
| 6625769 |
Method for IC fault analysis using programmable built-in self test and optical emission |
Sep. 23, 2003 |
| 6625688 |
Method and circuit for analysis of the operation of a microcontroller using signature analysis of memory |
Sep. 23, 2003 |
| 6622273 |
Scan latch circuit |
Sep. 16, 2003 |
| 6622274 |
Method of micro-architectural implementation on bist fronted state machine utilizing `death logic` state transition for area minimization |
Sep. 16, 2003 |
| 6617869 |
Electrical circuit with a testing device for testing the quality of electronic connections in the electrical circuit |
Sep. 9, 2003 |
| 6615378 |
Method and apparatus for holding failing information of a memory built-in self-test |
Sep. 2, 2003 |
| 6611477 |
Built-in self test using pulse generators |
Aug. 26, 2003 |
| 6609222 |
Methods and circuitry for built-in self-testing of content addressable memories |
Aug. 19, 2003 |
| 6590407 |
Apparatus for disabling and re-enabling access to IC test functions |
Jul. 8, 2003 |
| 6591389 |
Testing system for circuit board self-test |
Jul. 8, 2003 |
| 6587982 |
Method of micro-architectural implementation of interface between bist state machine and tester interface to enable bist cycling |
Jul. 1, 2003 |
| 6587981 |
Integrated circuit with scan test structure |
Jul. 1, 2003 |
| 6583642 |
Apparatus and method for automatic determination of operating frequency with built-in self-test |
Jun. 24, 2003 |
| 6584592 |
Semiconductor testing apparatus for testing semiconductor device including built in self test circuit |
Jun. 24, 2003 |
| 6581172 |
On-board testing circuit and method for improving testing of integrated circuits |
Jun. 17, 2003 |
| 6577979 |
Semiconductor integrated circuit with IP test circuit |
Jun. 10, 2003 |
| 6573742 |
Semiconductor integrated circuit with test points inserted thereinto |
Jun. 3, 2003 |
| 6571363 |
Single event upset tolerant microprocessor architecture |
May. 27, 2003 |
| 6570400 |
Method for disabling and re-enabling access to IC test functions |
May. 27, 2003 |
| 6567942 |
Method and apparatus to reduce the size of programmable array built-in self-test engines |
May. 20, 2003 |
| 6564349 |
Built-in self-test systems and methods for integrated circuit baseband quadrature modulators |
May. 13, 2003 |
| 6560740 |
Apparatus and method for programmable built-in self-test and self-repair of embedded memory |
May. 6, 2003 |
| 6556938 |
Systems and methods for facilitating automated test equipment functionality within integrated circuits |
Apr. 29, 2003 |
| 6557117 |
Built-in self test for PLL module with on-chip loop filter |
Apr. 29, 2003 |
| 6557131 |
Apparatus and method for automated testing of integrated analog to digital converters |
Apr. 29, 2003 |
| 6557130 |
Configuration and method for storing the test results obtained by a BIST circuit |
Apr. 29, 2003 |
| 6553527 |
Programmable array built-in self test method and controller with programmable expect generator |
Apr. 22, 2003 |
| 6553526 |
Programmable array built-in self test method and system for arrays with imbedded logic |
Apr. 22, 2003 |
| 6553525 |
Method and apparatus for selectively enabling and disabling functions on a per array basis |
Apr. 22, 2003 |
| 6550038 |
Semiconductor integrated circuitry |
Apr. 15, 2003 |
| 6550023 |
On-the-fly memory testing and automatic generation of bitmaps |
Apr. 15, 2003 |
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