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Class Information
Number: 714/733
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Digital logic testing > Built-in testing circuit (bilbo)
Description: Subject matter in which the digital logic testing equipment includes a selectively configurable shift register, structurally a part of the device being tested.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 5394404 |
Flip-flop circuit having diagnostic function |
Feb. 28, 1995 |
| 5392296 |
Testing circuit provided in digital logic circuits |
Feb. 21, 1995 |
| 5388265 |
Method and apparatus for placing an integrated circuit chip in a reduced power consumption state |
Feb. 7, 1995 |
| 5383194 |
Integrated logic circuit including impedance fault detection |
Jan. 17, 1995 |
| 5383195 |
BIST circuit with halt signal |
Jan. 17, 1995 |
| 5381420 |
Decoupled scan path interface |
Jan. 10, 1995 |
| 5379303 |
Maximizing improvement to fault coverage of system logic of an integrated circuit with embedded memory arrays |
Jan. 3, 1995 |
| 5377200 |
Power saving feature for components having built-in testing logic |
Dec. 27, 1994 |
| 5369646 |
Semiconductor integrated circuit device having test circuit |
Nov. 29, 1994 |
| 5369648 |
Built-in self-test circuit |
Nov. 29, 1994 |
| 5365167 |
Integrated circuit device having signal discrimination circuit and method of testing the same |
Nov. 15, 1994 |
| 5361264 |
Mode programmable VLSI data registers |
Nov. 1, 1994 |
| 5357522 |
Test circuit of input/output macrocell of erasable and programmable logic device |
Oct. 18, 1994 |
| 5347520 |
Boundary-scan enable cell with non-critical enable path |
Sep. 13, 1994 |
| 5343479 |
Semiconductor integrated circuit having therein circuit for detecting abnormality of logical levels outputted from input buffers |
Aug. 30, 1994 |
| 5343144 |
Electronic device |
Aug. 30, 1994 |
| 5339028 |
Test circuit for screening parts |
Aug. 16, 1994 |
| 5329167 |
Test flip-flop with an auxillary latch enabling two (2) bits of storage |
Jul. 12, 1994 |
| 5329533 |
Partial-scan built-in self-test technique |
Jul. 12, 1994 |
| 5325367 |
Memory device containing a static ram memory that is adapted for executing a self-test, and integrated circuit containing such a device as an embedded static ram memory |
Jun. 28, 1994 |
| 5321701 |
Method and apparatus for a minimal memory in-circuit digital tester |
Jun. 14, 1994 |
| 5319646 |
Boundary-scan output cell with non-critical enable path |
Jun. 7, 1994 |
| 5317711 |
Structure and method for monitoring an internal cache |
May. 31, 1994 |
| 5304923 |
Integrated circuit device having signal discrimination circuit and method of testing the same |
Apr. 19, 1994 |
| 5301199 |
Built-in self test circuit |
Apr. 5, 1994 |
| 5301156 |
Configurable self-test for embedded RAMs |
Apr. 5, 1994 |
| 5299136 |
Fully testable DCVS circuits with single-track global wiring |
Mar. 29, 1994 |
| 5291425 |
Test mode setting arrangement for use in microcomputer |
Mar. 1, 1994 |
| 5266890 |
Test wafer for diagnosing flaws in an integrated circuit fabrication process that cause A-C defects |
Nov. 30, 1993 |
| 5260950 |
Boundary-scan input circuit for a reset pin |
Nov. 9, 1993 |
| 5260946 |
Self-testing and self-configuration in an integrated circuit |
Nov. 9, 1993 |
| 5258985 |
Combinational data generator and analyzer for built-in self test |
Nov. 2, 1993 |
| 5258986 |
Tightly coupled, low overhead RAM built-in self-test logic with particular applications for embedded memories |
Nov. 2, 1993 |
| 5255271 |
Integrated circuit internal test mode indicator circuit |
Oct. 19, 1993 |
| 5254940 |
Testable embedded microprocessor and method of testing same |
Oct. 19, 1993 |
| 5251228 |
Reliability qualification vehicle for application specific integrated circuits |
Oct. 5, 1993 |
| 5248936 |
Semiconductor integrated circuit and a method of testing the same |
Sep. 28, 1993 |
| 5245615 |
Diagnostic system and interface for a personal computer |
Sep. 14, 1993 |
| 5241266 |
Built-in test circuit connection for wafer level burnin and testing of individual dies |
Aug. 31, 1993 |
| 5239262 |
Integrated circuit chip with built-in self-test for logic fault detection |
Aug. 24, 1993 |
| 5228040 |
Testable implementations of finite state machines and methods for producing them |
Jul. 13, 1993 |
| 5225774 |
Semiconductor integrated circuit |
Jul. 6, 1993 |
| 5214655 |
Integrated circuit packaging configuration for rapid customized design and unique test capability |
May. 25, 1993 |
| 5210759 |
Data processing system having scan testing using set latches for selectively observing test data |
May. 11, 1993 |
| 5199035 |
Logic circuit for reliability and yield enhancement |
Mar. 30, 1993 |
| 5196787 |
Test circuit for screening parts |
Mar. 23, 1993 |
| 5193092 |
Integrated parity-based testing for integrated circuits |
Mar. 9, 1993 |
| 5187712 |
Pseudo-exhaustive self-test technique |
Feb. 16, 1993 |
| 5184162 |
Testing integrated circuit using an A/D converter built in a semiconductor chip |
Feb. 2, 1993 |
| 5173906 |
Built-in self test for integrated circuits |
Dec. 22, 1992 |
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