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Class Information
Number: 714/733
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Digital logic testing > Built-in testing circuit (bilbo)
Description: Subject matter in which the digital logic testing equipment includes a selectively configurable shift register, structurally a part of the device being tested.

Patents under this class:

Patent Number Title Of Patent Date Issued
8713392 Circuitry testing module and circuitry testing device Apr. 29, 2014
8713391 System and method for testing an integrated circuit embedded in a system on a chip Apr. 29, 2014
8713390 JTAG multiplexer with clock/mode input, mode/clock input, and clock output Apr. 29, 2014
8713389 Tap and linking module TDO register, gating for TCK and TMS Apr. 29, 2014
8707115 Micro controller, driving method thereof and display device using the same Apr. 22, 2014
8707113 Method for modeling a device and generating test for that device Apr. 22, 2014
8704529 Circuit test interface and test method thereof Apr. 22, 2014
8694844 AT speed TAP with dual port router and command circuit Apr. 8, 2014
8694842 Configurable Mux-D scan flip-flop design Apr. 8, 2014
8689063 JTAG apparatus and method for implementing JTAG data transmission Apr. 1, 2014
8686753 Partial reconfiguration and in-system debugging Apr. 1, 2014
8683279 Tap instruction register with four bits for TLM selection Mar. 25, 2014
8683278 Semiconductor device Mar. 25, 2014
8677306 Microcontroller controlled or direct mode controlled network-fabric on a structured ASIC Mar. 18, 2014
8677201 Semiconductor integrated circuit and method of retrieving signal to semiconductor integrated circuit Mar. 18, 2014
8677199 Pulse dynamic logic gates with mux-D scan functionality Mar. 18, 2014
8671317 Built-in self test circuit and designing apparatus Mar. 11, 2014
8667354 Computer memory test structure Mar. 4, 2014
8667353 Semiconductor chip and test method Mar. 4, 2014
8645774 Expedited memory drive self test Feb. 4, 2014
8643395 Crosstalk suppression in wireless testing of semiconductor devices Feb. 4, 2014
8639994 Integrated circuit with memory built-in self test (MBIST) circuitry having enhanced features and methods Jan. 28, 2014
8638792 Packet switch based logic replication Jan. 28, 2014
8631293 Trace circuitry connected to TAP domain and address-command port Jan. 14, 2014
8631292 Multi-threading flip-flop circuit Jan. 14, 2014
8627162 Iimplementing enhanced aperture function calibration for logic built in self test (LBIST) Jan. 7, 2014
8621334 Log-likelihood-ratio (LLR) table calibration Dec. 31, 2013
8621306 Panel driving circuit that generates panel test pattern and panel test method thereof Dec. 31, 2013
8621305 Methods systems and apparatus for determining whether built-in-test fault codes are indicative of an actual fault condition or a false alarm Dec. 31, 2013
8621304 Built-in self-test system and method for an integrated circuit Dec. 31, 2013
8621302 Data summing boundary.sub.--cell connected with output and scan chain Dec. 31, 2013
8621301 Method and apparatus for virtual in-circuit emulation Dec. 31, 2013
8621298 Apparatus for protecting against external attack for processor based on arm core and method using the same Dec. 31, 2013
8615691 Process for improving design-limited yield by localizing potential faults from production test data Dec. 24, 2013
8612815 Asynchronous circuit with an at-speed built-in self-test (BIST) architecture Dec. 17, 2013
8612813 Circuit and method for efficient memory repair Dec. 17, 2013
8607110 I-R voltage drop screening when executing a memory built-in self test Dec. 10, 2013
8598922 Semiconductor device and operation mode switch method Dec. 3, 2013
8595576 Systems and methods for evaluating and debugging LDPC iterative decoders Nov. 26, 2013
8595562 Semiconductor integrated circuit, operating method of semiconductor integrated circuit, and debug system Nov. 26, 2013
8595557 Method and apparatus for verifying memory testing software Nov. 26, 2013
8589750 Methods and apparatus for providing a built-in self test Nov. 19, 2013
8589749 Memory content protection during scan dumps and memory dumps Nov. 19, 2013
8584073 Test design optimizer for configurable scan architectures Nov. 12, 2013
8583973 Stored-pattern logic self-testing with serial communication Nov. 12, 2013
8578225 One agumentation instruction register coupled to plural TAP instruction registers Nov. 5, 2013
8572448 Apparatus and method for testing and debugging an integrated circuit Oct. 29, 2013
8572447 Circuitry for built-in self-test Oct. 29, 2013
8566660 Built-in-self-test using embedded memory and processor in an application specific integrated circuit Oct. 22, 2013
8566659 Generator and compactor adaptor for low power divided scan path Oct. 22, 2013

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