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Class Information
Number: 714/724
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Digital logic testing
Description: Subject matter in which the diagnostic test is performed upon a system or element performing a binary logic operation upon a signal having plural distinct discrete states.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 5931963 |
Fault simulation apparatus |
Aug. 3, 1999 |
| 5933619 |
Logic circuit design apparatus |
Aug. 3, 1999 |
| 5928374 |
Scanning device and method for hierarchically forming a scan path for a network |
Jul. 27, 1999 |
| 5930735 |
Integrated circuit tester including at least one quasi-autonomous test instrument |
Jul. 27, 1999 |
| 5926486 |
Automated system for determining the dynamic thresholds of digital logic devices |
Jul. 20, 1999 |
| 5923098 |
Driver board having stored calibration data |
Jul. 13, 1999 |
| 5917834 |
Integrated circuit tester having multiple period generators |
Jun. 29, 1999 |
| 5912900 |
Method and system for testing self-timed circuitry |
Jun. 15, 1999 |
| 5913022 |
Loading hardware pattern memory in automatic test equipment for testing circuits |
Jun. 15, 1999 |
| 5913023 |
Method for automated generation of tests for software |
Jun. 15, 1999 |
| 5909450 |
Tool to reconfigure pin connections between a dut and a tester |
Jun. 1, 1999 |
| 5903577 |
Method and apparatus for analyzing digital circuits |
May. 11, 1999 |
| 5903759 |
Software performance analysis using hardware analyzer |
May. 11, 1999 |
| 5899961 |
Electronic circuit or board tester with compressed data-sequences |
May. 4, 1999 |
| 5900753 |
Asynchronous interface |
May. 4, 1999 |
| 5901154 |
Method for producing test program for semiconductor device |
May. 4, 1999 |
| 5898703 |
Device and method for testing integrated circuit including bi-directional test pin for receiving control data and outputting observation data |
Apr. 27, 1999 |
| 5898711 |
Single event upset detection and protection in an integrated circuit |
Apr. 27, 1999 |
| 5896400 |
Memory circuit with switch for selectively connecting an input/output pad directly to a nonvolatile memory cell |
Apr. 20, 1999 |
| 5894424 |
Semiconductor testing apparatus |
Apr. 13, 1999 |
| 5887028 |
Digital receiver |
Mar. 23, 1999 |
| 5883843 |
Built-in self-test arrangement for integrated circuit memory devices |
Mar. 16, 1999 |
| 5878051 |
Assembly-level bist using field-programmable gate array |
Mar. 2, 1999 |
| 5878052 |
Method and hardware arrangement for replacing defective function blocks in an integrated circuit |
Mar. 2, 1999 |
| 5878053 |
Hierarchial power network simulation and analysis tool for reliability testing of deep submicron IC designs |
Mar. 2, 1999 |
| 5875196 |
Deriving signal constraints to accelerate sequential test generation |
Feb. 23, 1999 |
| 5870408 |
Method and apparatus for on die testing |
Feb. 9, 1999 |
| 5870409 |
Method and apparatus for testing a relatively slow speed component of an intergrated circuit having mixed slow speed and high speed components |
Feb. 9, 1999 |
| 5870411 |
Method and system for testing self-timed circuitry |
Feb. 9, 1999 |
| 5867036 |
Domino scan architecture and domino scan flip-flop for the testing of domino and hybrid CMOS circuits |
Feb. 2, 1999 |
| 5867404 |
Method and apparatus for monitoring railway defects |
Feb. 2, 1999 |
| 5862148 |
Microcontroller with improved debug capability for internal memory |
Jan. 19, 1999 |
| 5856932 |
Method and system for performing quantitative sneak circuit analysis |
Jan. 5, 1999 |
| 5856984 |
Method of and system for generating test cases |
Jan. 5, 1999 |
| 5854797 |
Tester with fast refire recovery time |
Dec. 29, 1998 |
| 5852364 |
System and method for testing integrated circuits connected together |
Dec. 22, 1998 |
| 5844913 |
Current mode interface circuitry for an IC test device |
Dec. 1, 1998 |
| 5844917 |
Method for testing adapter card ASIC using reconfigurable logic |
Dec. 1, 1998 |
| 5844921 |
Method and apparatus for testing a hybrid circuit having macro and non-macro circuitry |
Dec. 1, 1998 |
| 5845234 |
System and method for efficiently generating testing program code for use in automatic test equipment |
Dec. 1, 1998 |
| 5841789 |
Apparatus for testing signal timing and programming delay |
Nov. 24, 1998 |
| 5841790 |
Apparatus for testing an adapter card ASIC with reconfigurable logic |
Nov. 24, 1998 |
| 5838692 |
System and method for extracting realtime debug signals from an integrated circuit |
Nov. 17, 1998 |
| 5835505 |
Semiconductor integrated circuit and system incorporating the same |
Nov. 10, 1998 |
| 5835506 |
Single pass doublet mode integrated circuit tester |
Nov. 10, 1998 |
| 5831990 |
Test-mode control for dynamic logic gates |
Nov. 3, 1998 |
| 5831991 |
Methods and apparatus for electrically verifying a functional unit contained within an integrated cirucuit |
Nov. 3, 1998 |
| 5831994 |
Semiconductor device testing fixture |
Nov. 3, 1998 |
| 5832419 |
Apparatus and method for identifying an integrated device |
Nov. 3, 1998 |
| 5828674 |
Production interface for integrated circuit test system |
Oct. 27, 1998 |
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