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Class Information
Number: 714/724
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Digital logic testing
Description: Subject matter in which the diagnostic test is performed upon a system or element performing a binary logic operation upon a signal having plural distinct discrete states.










Sub-classes under this class:

Class Number Class Name Patents
714/733 Built-in testing circuit (bilbo) 1,557
714/745 Determination of marginal operation limits 260
714/736 Device response compared to expected fault-free response 894
714/737 Device response compared to fault dictionary/truth table 114
714/735 Device response compared to input pattern 383
714/738 Including test pattern generator 1,099
714/725 Programmable logic array (pla) testing 420
714/726 Scan path testing (e.g., level sensitive scan design (lssd)) 1,605
714/732 Signature analysis 440
714/734 Structural (in-circuit test) 746


Patents under this class:

Patent Number Title Of Patent Date Issued
8713391 System and method for testing an integrated circuit embedded in a system on a chip Apr. 29, 2014
8713388 Integrated circuit testing with power collapsed Apr. 29, 2014
8711573 Using interrupted through-silicon-vias in integrated circuits adapted for stacking Apr. 29, 2014
8707113 Method for modeling a device and generating test for that device Apr. 22, 2014
8694843 Clock control of pipelined memory for improved delay fault testing Apr. 8, 2014
8694840 Memory test isolation logic bank with separate test enable input Apr. 8, 2014
8694276 Built-in self-test methods, circuits and apparatus for concurrent test of RF modules with a dynamically configurable test structure Apr. 8, 2014
8689067 Control of clock gate cells during scan testing Apr. 1, 2014
8689063 JTAG apparatus and method for implementing JTAG data transmission Apr. 1, 2014
8683280 Test generator for low power built-in self-test Mar. 25, 2014
8682501 Data processing device, microcontroller, and self-diagnosis method of data processing device Mar. 25, 2014
8667346 Semiconductor integrated circuit device, method of controlling the semiconductor integrated circuit device and information processing system Mar. 4, 2014
8666691 Test apparatus and test method Mar. 4, 2014
8666642 Memory corruption detection in engine control systems Mar. 4, 2014
8661285 Dynamically calibrated DDR memory controller Feb. 25, 2014
8656236 Remote boundary scanning Feb. 18, 2014
8656232 Apparatus and method for testing semiconductor integrated circuits, and a non-transitory computer-readable medium having a semiconductor integrated circuit testing program Feb. 18, 2014
8650519 Automated functional coverage for an integrated circuit design Feb. 11, 2014
8650447 Apparatus and methods for controlled error injection Feb. 11, 2014
8645777 Boundary scan chain for stacked memory Feb. 4, 2014
8639855 Information collection and storage for single core chips to 'N core chips Jan. 28, 2014
8638792 Packet switch based logic replication Jan. 28, 2014
8627160 System and device for reducing instantaneous voltage droop during a scan shift operation Jan. 7, 2014
8627159 Feedback scan isolation and scan bypass architecture Jan. 7, 2014
8624602 Method and apparatus to measure differential phase and frequency modulation distortions for audio equipment Jan. 7, 2014
8621306 Panel driving circuit that generates panel test pattern and panel test method thereof Dec. 31, 2013
8621272 Integrated circuit with error repair and fault tolerance Dec. 31, 2013
8615693 Scan test circuitry comprising scan cells with multiple scan inputs Dec. 24, 2013
8607106 Channel detection device Dec. 10, 2013
8595574 Enhanced diagnosis with limited failure cycles Nov. 26, 2013
8594225 Circuit arrangement, apparatus and process for the serial sending of data via a connection contact Nov. 26, 2013
8589751 Don't-care-bit identification method and don't-care-bit identification program Nov. 19, 2013
8589745 On-die logic analyzer for semiconductor die Nov. 19, 2013
8589744 State machine transitioning between idle, capture, shift-I, and shift-2 states Nov. 19, 2013
8589743 Double data rate signal testing assistant device Nov. 19, 2013
8572448 Apparatus and method for testing and debugging an integrated circuit Oct. 29, 2013
8570881 Transmitter voltage and receiver time margining Oct. 29, 2013
8566068 Trace routing network Oct. 22, 2013
8560906 Timing-aware test generation and fault simulation Oct. 15, 2013
8555120 Target device providing debugging function and test system comprising the same Oct. 8, 2013
8547125 Test apparatus and test module Oct. 1, 2013
8543966 Test path selection and test program generation for performance testing integrated circuit chips Sep. 24, 2013
8543776 On-die logic analyzer for semiconductor die Sep. 24, 2013
8539290 Isolation logic between non-volatile memory and test and wrapper controllers Sep. 17, 2013
8533656 Sorted data outlier identification Sep. 10, 2013
8533544 System for tree sequence testing of a device and method for tree sequence testing of a device in a test framework architecture Sep. 10, 2013
8533543 System for testing connections between chips Sep. 10, 2013
8531322 Time-to-digital converter Sep. 10, 2013
8531197 Integrated circuit die, an integrated circuit package and a method for connecting an integrated circuit die to an external device Sep. 10, 2013
8522099 Embedded processor Aug. 27, 2013











 
 
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