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Class Information
Number: 714/716
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Transmission facility testing > Test pattern with comparison > Loop-back
Description: Subject matter in which the transmission facility is configured so that the receiver shunts the test pattern back to transmitter for comparison at the transmitter.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7620858 |
Fabric-based high speed serial crossbar switch for ATE |
Nov. 17, 2009 |
| 7620861 |
Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels |
Nov. 17, 2009 |
| 7613125 |
Method and apparatus for temporal alignment of multiple parallel data streams |
Nov. 3, 2009 |
| 7587202 |
Method for conducting digital interface and baseband circuitry tests using digital loopback |
Sep. 8, 2009 |
| 7571363 |
Parametric measurement of high-speed I/O systems |
Aug. 4, 2009 |
| 7565587 |
Background block erase check for flash memories |
Jul. 21, 2009 |
| 7546494 |
Skew-correcting apparatus using dual loopback |
Jun. 9, 2009 |
| 7529975 |
Method for testing processor subassemblies |
May. 5, 2009 |
| 7516374 |
Testing circuit and related method of injecting a time jitter |
Apr. 7, 2009 |
| 7506222 |
System for phase tracking and equalization across a byte group for asymmetric control of high-speed bidirectional signaling |
Mar. 17, 2009 |
| 7506234 |
Signature circuit, semiconductor device having the same and method of reading signature information |
Mar. 17, 2009 |
| 7502975 |
Data transmission apparatus and method |
Mar. 10, 2009 |
| 7500159 |
Data transmission apparatus and method |
Mar. 3, 2009 |
| 7496807 |
Data transmission apparatus and method |
Feb. 24, 2009 |
| 7486121 |
System and method for generating two effective frequencies using a single clock |
Feb. 3, 2009 |
| 7484139 |
Amplifier fault detection circuit |
Jan. 27, 2009 |
| 7484155 |
Analog base-band test apparatus and method by enhanced combination of JTAG and memory in mobile communication system |
Jan. 27, 2009 |
| 7480840 |
Apparatus, system, and method for facilitating port testing of a multi-port host adapter |
Jan. 20, 2009 |
| 7478298 |
Method and system for backplane testing using generic boundary-scan units |
Jan. 13, 2009 |
| 7461312 |
Digital signature generation for hardware functional test |
Dec. 2, 2008 |
| 7447953 |
Lane testing with variable mapping |
Nov. 4, 2008 |
| 7444558 |
Programmable measurement mode for a serial point to point link |
Oct. 28, 2008 |
| 7437628 |
Data transmission apparatus and method |
Oct. 14, 2008 |
| 7426599 |
Systems and methods for writing data with a FIFO interface |
Sep. 16, 2008 |
| 7424649 |
Latch and phase synchronization circuit using same |
Sep. 9, 2008 |
| 7404115 |
Self-synchronising bit error analyser and circuit |
Jul. 22, 2008 |
| 7386767 |
Programmable bit error rate monitor for serial interface |
Jun. 10, 2008 |
| 7380152 |
Daisy chained multi-device system and operating method |
May. 27, 2008 |
| 7373577 |
CAN system |
May. 13, 2008 |
| 7366964 |
Method, system, and apparatus for loopback entry and exit |
Apr. 29, 2008 |
| 7346819 |
Through-core self-test with multiple loopbacks |
Mar. 18, 2008 |
| 7337377 |
Enhanced loopback testing of serial devices |
Feb. 26, 2008 |
| 7325180 |
System and method to test integrated circuits on a wafer |
Jan. 29, 2008 |
| 7310754 |
Integrated test circuit, a test circuit, and a test method for performing transmission and reception processing to and from a first and a second macro block at a first frequency |
Dec. 18, 2007 |
| 7287201 |
Data transmission apparatus and method |
Oct. 23, 2007 |
| 7280302 |
Disk drive using loopback to calibrate transmission amplitude |
Oct. 9, 2007 |
| 7275195 |
Programmable built-in self-test circuit for serializer/deserializer circuits and method |
Sep. 25, 2007 |
| 7272756 |
Exploitive test pattern apparatus and method |
Sep. 18, 2007 |
| 7263286 |
Fast testing system for optical transceiver and testing method thereof |
Aug. 28, 2007 |
| 7251765 |
Semiconductor integrated circuit and method for testing a semiconductor integrated circuit |
Jul. 31, 2007 |
| 7231558 |
System and method for network error rate testing |
Jun. 12, 2007 |
| 7216269 |
Signal transmit-receive device, circuit, and loopback test method |
May. 8, 2007 |
| 7203460 |
Automated test of receiver sensitivity and receiver jitter tolerance of an integrated circuit |
Apr. 10, 2007 |
| 7203872 |
Cache based physical layer self test |
Apr. 10, 2007 |
| 7191371 |
System and method for sequential testing of high speed serial link core |
Mar. 13, 2007 |
| 7165196 |
Method for testing serializers/de-serializers |
Jan. 16, 2007 |
| 7127648 |
System and method for performing on-chip self-testing |
Oct. 24, 2006 |
| 7117402 |
Background block erase check for flash memories |
Oct. 3, 2006 |
| 7111208 |
On-chip standalone self-test system and method |
Sep. 19, 2006 |
| 7093172 |
System and method for determining on-chip bit error rate (BER) in a communication system |
Aug. 15, 2006 |
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