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Class Information
Number: 714/715
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Transmission facility testing > Test pattern with comparison
Description: Subject matter in which the transmission facility is tested by applying a test pattern to the device under test and comparing the output to a reference test pattern.


Sub-classes under this class:

Class Number Class Name Patents
714/716 Loop-back 200


Patents under this class:
1 2 3 4 5 6

Patent Number Title Of Patent Date Issued
7620861 Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels Nov. 17, 2009
7617426 Verification method and apparatus Nov. 10, 2009
7613974 Fault detection method and apparatus Nov. 3, 2009
7610526 On-chip circuitry for bus validation Oct. 27, 2009
7610522 Compliance of master-slave modes for low-level debug of serial links Oct. 27, 2009
7603596 Memory device capable of detecting its failure Oct. 13, 2009
7600162 Semiconductor device Oct. 6, 2009
7599301 Communications network tap with heartbeat monitor Oct. 6, 2009
7587645 Input circuit of semiconductor memory device and test system having the same Sep. 8, 2009
7574633 Test apparatus, adjustment method and recording medium Aug. 11, 2009
7571365 Wafer scale testing using a 2 signal JTAG interface Aug. 4, 2009
7559001 Method and apparatus for executing commands and generation of automation scripts and test cases Jul. 7, 2009
7549101 Clock transferring apparatus, and testing apparatus Jun. 16, 2009
7539148 Circuit integrity in a packet-switched network May. 26, 2009
7512854 Method and apparatus for testing, characterizing and monitoring a chip interface using a second data path Mar. 31, 2009
7506222 System for phase tracking and equalization across a byte group for asymmetric control of high-speed bidirectional signaling Mar. 17, 2009
7506311 Test tool for application programming interfaces Mar. 17, 2009
7500046 Abstracted host bus interface for complex high performance ASICs Mar. 3, 2009
7493532 Methods and structure for optimizing SAS domain link quality and performance Feb. 17, 2009
7490275 Method and apparatus for evaluating and optimizing a signaling system Feb. 10, 2009
7487423 Decoding method, medium, and apparatus Feb. 3, 2009
7480839 Qualified anomaly detection Jan. 20, 2009
7478298 Method and system for backplane testing using generic boundary-scan units Jan. 13, 2009
7478304 Apparatus for accelerating through-the-pins LBIST simulation Jan. 13, 2009
7461308 Method for testing semiconductor chips by means of bit masks Dec. 2, 2008
7454676 Method for testing semiconductor chips using register sets Nov. 18, 2008
7447966 Hardware verification scripting Nov. 4, 2008
7447953 Lane testing with variable mapping Nov. 4, 2008
7444558 Programmable measurement mode for a serial point to point link Oct. 28, 2008
7437643 Automated BIST execution scheme for a link Oct. 14, 2008
7434114 Method of compensating for a byte skew of PCI express and PCI express physical layer receiver for the same Oct. 7, 2008
7434118 Parameterized signal conditioning Oct. 7, 2008
7426599 Systems and methods for writing data with a FIFO interface Sep. 16, 2008
7405723 Apparatus for testing display device and method for testing the same Jul. 29, 2008
7404115 Self-synchronising bit error analyser and circuit Jul. 22, 2008
7404114 System and method for balancing delay of signal communication paths through well voltage adjustment Jul. 22, 2008
7395466 Method and apparatus to adjust voltage for storage location reliability Jul. 1, 2008
7386767 Programmable bit error rate monitor for serial interface Jun. 10, 2008
7380152 Daisy chained multi-device system and operating method May. 27, 2008
7373561 Integrated packet bit error rate tester for 10G SERDES May. 13, 2008
7360127 Method and apparatus for evaluating and optimizing a signaling system Apr. 15, 2008
7349506 Semiconductor integrated circuit and method for testing the same Mar. 25, 2008
7340655 Skew adjustment circuit, skew adjustment method, data synchronization circuit, and data synchronization method Mar. 4, 2008
7337376 Method and system of self-test for a single infrared machine Feb. 26, 2008
7331004 Data storage system analyzer having self reset Feb. 12, 2008
7324392 ROM-based memory testing Jan. 29, 2008
7313753 Detector for detecting information carried by a signal having a sawtooth-like shape Dec. 25, 2007
7313738 System and method for system-on-chip interconnect verification Dec. 25, 2007
7280420 Data compression read mode for memory testing Oct. 9, 2007
7274611 Method and architecture to calibrate read operations in synchronous flash memory Sep. 25, 2007

1 2 3 4 5 6


 
 
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