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Class Information
Number: 714/715
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Transmission facility testing > Test pattern with comparison
Description: Subject matter in which the transmission facility is tested by applying a test pattern to the device under test and comparing the output to a reference test pattern.

Sub-classes under this class:

Class Number Class Name Patents
714/716 Loop-back 262

Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
8654790 Method of remote active testing of a device or network Feb. 18, 2014
8644434 Apparatus and methods for performing sequence detection Feb. 4, 2014
8619589 System and method for removing test packets Dec. 31, 2013
8619599 Packet processor verification methods and systems Dec. 31, 2013
8607103 Transmission/reception device, transmission device, reception device, and data transmission/reception method Dec. 10, 2013
8578221 Method and system for measuring bit error rate and block error rate of device under test Nov. 5, 2013
8565428 Network device and network connecting method for building up network connection via high definition multimedia interface Oct. 22, 2013
8522099 Embedded processor Aug. 27, 2013
8489944 Disabling outbound drivers for a last memory buffer on a memory channel Jul. 16, 2013
8464107 Surrogate circuit for testing an interface Jun. 11, 2013
8443243 Semiconductor integrated circuit device and method for evaluating an eye-opening margin May. 14, 2013
8432178 Testing device and method thereof Apr. 30, 2013
8418004 Back channel communication Apr. 9, 2013
8413117 Systems and methods for focusing product testing based on areas of change within the product between product builds Apr. 2, 2013
8392767 Data channel test apparatus and method thereof Mar. 5, 2013
8381048 Transmission system, method and program Feb. 19, 2013
8370787 Testing security of mapping functions Feb. 5, 2013
8351286 Test method for screening manufacturing defects in a memory array Jan. 8, 2013
8352810 Fault detection using embedded watermarks Jan. 8, 2013
8341508 System for sending signals between modules Dec. 25, 2012
8331470 Communication system Dec. 11, 2012
8327196 Identifying an optimized test bit pattern for analyzing electrical communications channel topologies Dec. 4, 2012
8321733 Optimization of SERDES sampling parameters Nov. 27, 2012
8321736 Transmission system, transmission method and communication device Nov. 27, 2012
8286039 Disabling outbound drivers for a last memory buffer on a memory channel Oct. 9, 2012
8228385 Apparatus for determining information in order to temporally align two information signals Jul. 24, 2012
8214706 Method and apparatus for testing an electronic circuit integrated with a semiconductor device Jul. 3, 2012
8209571 Valid-transmission verifying circuit and a semiconductor device including the same Jun. 26, 2012
8191033 In situ clock jitter measurement May. 29, 2012
8184164 Method for measuring multimedia video communication quality May. 22, 2012
8176371 Embedded processor May. 8, 2012
8171354 Communication system and method for controlling the same May. 1, 2012
8145967 System and method for verifying the receive path of an input/output component Mar. 27, 2012
8127190 Sampling a device bus Feb. 28, 2012
8116363 Method of determining true error vector magnitude in a wireless LAN Feb. 14, 2012
8095912 Testing a context-free language compiler Jan. 10, 2012
8090565 System and method for using model analysis to generate directed test vectors Jan. 3, 2012
8078920 Information processing device and error processing method Dec. 13, 2011
8069378 Method and apparatus for evaluating and optimizing a signaling system Nov. 29, 2011
8065571 Storage area network (SAN) link integrity tester Nov. 22, 2011
8051343 Method of testing a memory module and hub of the memory module Nov. 1, 2011
8051340 System and method for balancing delay of signal communication paths through well voltage adjustment Nov. 1, 2011
8045459 Packet processing method for wireless communications Oct. 25, 2011
8006141 Method for speeding up serial data tolerance testing Aug. 23, 2011
8006154 Semiconductor integrated circuit and method for testing semiconductor integrated circuit Aug. 23, 2011
7992070 Bit-interleaved LDPC-coded modulation for high-speed optical transmission Aug. 2, 2011
7979754 Voltage margin testing for proximity communication Jul. 12, 2011
7979756 Apparatus, system and method for a go/no go link integrity tester Jul. 12, 2011
7979759 Test and bring-up of an enhanced cascade interconnect memory system Jul. 12, 2011
7971113 Method for detecting disturb phenomena between neighboring blocks in non-volatile memory Jun. 28, 2011

1 2 3 4 5 6 7 8

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