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Class Information
Number: 714/700
Name: Error detection/correction and fault detection/recovery > Pulse or data error handling > Skew detection correction
Description: Subject matter in which an error caused by the time delay between plural parallel bits forming a byte or data word is detected or corrected.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7627457 |
Using highly skewed clocks for application based tracing and application based normalization of processor clocks in an SMP environment |
Dec. 1, 2009 |
| 7627790 |
Apparatus for jitter testing an IC |
Dec. 1, 2009 |
| 7624310 |
System and method for initializing a memory system, and memory device and processor-based system using same |
Nov. 24, 2009 |
| 7624311 |
Method and apparatus for converting interface between high speed data having various capacities |
Nov. 24, 2009 |
| 7624323 |
Method and apparatus for testing an IC device based on relative timing of test signals |
Nov. 24, 2009 |
| 7620857 |
Controllable delay device |
Nov. 17, 2009 |
| 7617431 |
Method and apparatus for analyzing delay defect |
Nov. 10, 2009 |
| 7600162 |
Semiconductor device |
Oct. 6, 2009 |
| 7596173 |
Test apparatus, clock generator and electronic device |
Sep. 29, 2009 |
| 7594146 |
Apparatus, method, and program for correcting time of event trace data |
Sep. 22, 2009 |
| 7594150 |
Fault-tolerant architecture of flip-flops for transient pulses and signal delays |
Sep. 22, 2009 |
| 7587640 |
Method and apparatus for monitoring and compensating for skew on a high speed parallel bus |
Sep. 8, 2009 |
| 7587650 |
Clock jitter detector |
Sep. 8, 2009 |
| 7574632 |
Strobe technique for time stamping a digital signal |
Aug. 11, 2009 |
| 7574633 |
Test apparatus, adjustment method and recording medium |
Aug. 11, 2009 |
| 7571407 |
Semiconductor integrated circuit and method of testing delay thereof |
Aug. 4, 2009 |
| 7571359 |
Clock distribution circuits and methods of operating same that use multiple clock circuits connected by phase detector circuits to generate and synchronize local clock signals |
Aug. 4, 2009 |
| 7565582 |
Circuit for testing the AC timing of an external input/output terminal of a semiconductor integrated circuit |
Jul. 21, 2009 |
| 7562266 |
Method and device for verifying timing in a semiconductor integrated circuit |
Jul. 14, 2009 |
| 7558995 |
Method and apparatus for eliminating noise induced errors during test of a programmable logic device |
Jul. 7, 2009 |
| 7557561 |
Electronic device, circuit and test apparatus |
Jul. 7, 2009 |
| 7558336 |
Semiconductor device, memory device and memory module having digital interface |
Jul. 7, 2009 |
| 7558991 |
Device and method for measuring jitter |
Jul. 7, 2009 |
| 7552366 |
Jitter tolerance testing apparatus, systems, and methods |
Jun. 23, 2009 |
| 7549108 |
Methods and systems for secure control of system modes and sub-modes |
Jun. 16, 2009 |
| 7549092 |
Output controller with test unit |
Jun. 16, 2009 |
| 7546494 |
Skew-correcting apparatus using dual loopback |
Jun. 9, 2009 |
| 7543196 |
Apparatus for testing integrated circuit |
Jun. 2, 2009 |
| 7543209 |
Characterizing jitter sensitivity of a serializer/deserializer circuit |
Jun. 2, 2009 |
| 7543202 |
Test apparatus, adjustment apparatus, adjustment method and adjustment program |
Jun. 2, 2009 |
| 7536610 |
Method for detecting resistive-open defects in semiconductor memories |
May. 19, 2009 |
| 7536579 |
Skew-correcting apparatus using iterative approach |
May. 19, 2009 |
| 7533317 |
Serializer/deserializer circuit for jitter sensitivity characterization |
May. 12, 2009 |
| 7526701 |
Method and apparatus for measuring group delay of a device under test |
Apr. 28, 2009 |
| 7523379 |
Method for time-delayed data protection |
Apr. 21, 2009 |
| 7516379 |
Circuit and method for comparing circuit performance between functional and AC scan testing in an integrated circuit (IC) |
Apr. 7, 2009 |
| 7516374 |
Testing circuit and related method of injecting a time jitter |
Apr. 7, 2009 |
| 7506228 |
Measuring the internal clock speed of an integrated circuit |
Mar. 17, 2009 |
| 7506222 |
System for phase tracking and equalization across a byte group for asymmetric control of high-speed bidirectional signaling |
Mar. 17, 2009 |
| 7502974 |
Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets |
Mar. 10, 2009 |
| 7500155 |
Average time extraction circuit for eliminating clock skew |
Mar. 3, 2009 |
| 7500156 |
Method and apparatus for verifying multi-channel data |
Mar. 3, 2009 |
| 7495465 |
PVT variation detection and compensation circuit |
Feb. 24, 2009 |
| 7496803 |
Method and apparatus for testing an integrated device's input/output (I/O) |
Feb. 24, 2009 |
| 7490273 |
Auto-calibration method for delay circuit |
Feb. 10, 2009 |
| 7484135 |
Semiconductor device having a mode of functional test |
Jan. 27, 2009 |
| 7484161 |
System, method and storage medium for providing fault detection and correction in a memory subsystem |
Jan. 27, 2009 |
| 7484166 |
Semiconductor integrated circuit verification method and test pattern preparation method |
Jan. 27, 2009 |
| 7480838 |
Method, system and apparatus for detecting and recovering from timing errors |
Jan. 20, 2009 |
| 7480882 |
Measuring and predicting VLSI chip reliability and failure |
Jan. 20, 2009 |
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