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Class Information
Number: 714/30
Name: Error detection/correction and fault detection/recovery > Data processing system error or fault handling > Reliability and availability > Fault locating (i.e., diagnosis or testing) > Particular access structure > Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path)
Description: Subject matter further including means or steps for testing or diagnostic access using specialized testing or diagnosing hardware permanently built into a component of the system being tested or diagnosed.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7624318 |
Method and apparatus for automatically identifying multiple combinations of operational and non-operational components on integrated circuit chips with a single part number |
Nov. 24, 2009 |
| 7624312 |
System, apparatus, computer program product for performing operational validation with limited CPU use of a communications network |
Nov. 24, 2009 |
| 7620861 |
Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels |
Nov. 17, 2009 |
| 7620840 |
Transactional flow management interrupt debug architecture |
Nov. 17, 2009 |
| 7617425 |
Method for at-speed testing of memory interface using scan |
Nov. 10, 2009 |
| 7617416 |
System, method, and apparatus for firmware code-coverage in complex system on chip |
Nov. 10, 2009 |
| 7613971 |
Semiconductor integrated circuit with delay test circuit, and method for testing semiconductor integrated circuit |
Nov. 3, 2009 |
| 7613965 |
Apparatus and method for high-speed SAS link protocol testing |
Nov. 3, 2009 |
| 7613961 |
CPU register diagnostic testing |
Nov. 3, 2009 |
| 7613955 |
Collecting debug data from a wireless device |
Nov. 3, 2009 |
| 7610537 |
Method and apparatus for testing multi-core microprocessors |
Oct. 27, 2009 |
| 7610533 |
Semiconductor integrated circuit and method for testing the same |
Oct. 27, 2009 |
| 7610527 |
Test output compaction with improved blocking of unknown values |
Oct. 27, 2009 |
| 7610423 |
Service interface to a memory system |
Oct. 27, 2009 |
| 7607057 |
Test wrapper including integrated scan chain for testing embedded hard macro in an integrated circuit chip |
Oct. 20, 2009 |
| 7607044 |
Monitoring of a program execution by the processor of an electronic circuit |
Oct. 20, 2009 |
| 7603598 |
Semiconductor device for testing semiconductor process and method thereof |
Oct. 13, 2009 |
| 7603596 |
Memory device capable of detecting its failure |
Oct. 13, 2009 |
| 7603585 |
Systems and methods for updating field replaceable units |
Oct. 13, 2009 |
| 7596724 |
Quiescence for retry messages on bidirectional communications interface |
Sep. 29, 2009 |
| 7596420 |
Device manufacturing method and computer program product |
Sep. 29, 2009 |
| 7594150 |
Fault-tolerant architecture of flip-flops for transient pulses and signal delays |
Sep. 22, 2009 |
| 7594143 |
Analysis engine for analyzing a computer system condition |
Sep. 22, 2009 |
| 7594140 |
Task based debugger (transaction-event-job-trigger) |
Sep. 22, 2009 |
| 7590912 |
Using a chip as a simulation engine |
Sep. 15, 2009 |
| 7590911 |
Apparatus and method for testing and debugging an integrated circuit |
Sep. 15, 2009 |
| 7590908 |
Semiconductor integrated circuit and method for testing the same |
Sep. 15, 2009 |
| 7590891 |
Debugging circuit and a method of controlling the debugging circuit |
Sep. 15, 2009 |
| 7587202 |
Method for conducting digital interface and baseband circuitry tests using digital loopback |
Sep. 8, 2009 |
| 7584381 |
Semiconductor integrated circuit device, debug system, microcomputer, and electronic apparatus |
Sep. 1, 2009 |
| 7584380 |
Method and system for debugging flow control based designs |
Sep. 1, 2009 |
| 7577874 |
Interactive debug system for multiprocessor array |
Aug. 18, 2009 |
| 7577873 |
Transmission apparatus |
Aug. 18, 2009 |
| 7577560 |
Microcomputer logic development device |
Aug. 18, 2009 |
| 7574643 |
Test apparatus and method for testing a circuit unit |
Aug. 11, 2009 |
| 7574314 |
Spurious signal detection |
Aug. 11, 2009 |
| 7571367 |
Built-in self diagnosis device for a random access memory and method of diagnosing a random access |
Aug. 4, 2009 |
| 7571363 |
Parametric measurement of high-speed I/O systems |
Aug. 4, 2009 |
| 7571357 |
Memory wrap test mode using functional read/write buffers |
Aug. 4, 2009 |
| 7568141 |
Method and apparatus for testing embedded cores |
Jul. 28, 2009 |
| 7568135 |
Use of alternative value in cell detection |
Jul. 28, 2009 |
| 7568061 |
Initializing expansion adapters installed in a computer system having similar expansion adapters |
Jul. 28, 2009 |
| 7565578 |
Optical disc apparatus, and method for self-diagnosis control of optical disc apparatus |
Jul. 21, 2009 |
| 7565576 |
Method and apparatus for obtaining trace data of a high speed embedded processor |
Jul. 21, 2009 |
| 7562276 |
Apparatus and method for testing and debugging an integrated circuit |
Jul. 14, 2009 |
| 7562265 |
Method, apparatus and program storage device for providing self-quiesced logic to handle an error recovery instruction |
Jul. 14, 2009 |
| 7559053 |
Program and system performance data correlation |
Jul. 7, 2009 |
| 7558722 |
Debug method for mismatches occurring during the simulation of scan patterns |
Jul. 7, 2009 |
| 7555686 |
Semiconductor device, test board for testing the same, and test system and method for testing the same |
Jun. 30, 2009 |
| 7555091 |
System and method for providing a clock and data recovery circuit with a self test capability |
Jun. 30, 2009 |
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