| Class Number |
Class Name |
No. of Patents |
| 714/100 |
Data processing system error or fault handling |
153 |
| 714/1 |
Reliability and availability |
438 |
| 714/48 |
Error detection or notification |
1135 |
| 714/57 |
Error forwarding and presentation (e.g., operator console, error display) |
447 |
| 714/49 |
State error (i.e., content of instruction, data, or message) |
332 |
| 714/53 |
Address error |
136 |
| 714/50 |
State out of sequence |
75 |
| 714/51 |
Control flow state sequence monitored (e.g., watchdog processor for control-flow checking) |
170 |
| 714/52 |
Error checking code |
279 |
| 714/54 |
Storage content error |
316 |
| 714/55 |
Timing error (e.g., watchdog timer time-out) |
407 |
| 714/56 |
Bus or i/o channel device fault |
210 |
| 714/25 |
Fault locating (i.e., diagnosis or testing) |
1293 |
| 714/37 |
Analysis (e.g., of output, state, or design) |
555 |
| 714/39 |
Monitor recognizes sequence of events (e.g., protocol or logic state analyzer) |
533 |
| 714/38 |
Of computer software |
1450 |
| 714/26 |
Artificial intelligence (e.g., diagnostic expert system) |
331 |
| 714/40 |
Component dependent technique |
121 |
| 714/43 |
Bus, i/o channel, or network path component fault |
862 |
| 714/41 |
For reliability enhancing component (e.g., testing backup spare, or fault injection) |
156 |
| 714/42 |
Memory or storage device component fault |
792 |
| 714/44 |
Peripheral device component fault |
246 |
| 714/46 |
Operator interface for diagnosing or testing |
515 |
| 714/45 |
Output recording (e.g., signature or trace) |
567 |
| 714/27 |
Particular access structure |
281 |
| 714/31 |
Additional processor for in-system fault locating (e.g., distributed diagnosis program) |
353 |
| 714/30 |
Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path) |
1035 |
| 714/28 |
Substituted emulative component (e.g., emulator microprocessor) |
223 |
| 714/29 |
Memory emulator feature |
84 |
| 714/32 |
Particular stimulus creation |
240 |
| 714/33 |
Derived from analysis (e.g., of a specification or by stimulation) |
329 |
| 714/34 |
Halt, clock, or interrupt signal (e.g., freezing, hardware breakpoint, single-stepping) |
284 |
| 714/35 |
Substituted or added instruction (e.g., code instrumenting, breakpoint instruction) |
276 |
| 714/36 |
Test sequence at power-up or initialization |
325 |
| 714/2 |
Fault recovery |
661 |
| 714/3 |
By masking or reconfiguration |
271 |
| 714/5 |
Of memory or peripheral subsystem |
1004 |
| 714/9 |
Access processor affected (e.g., i/o processor, mmu, dma processor) |
177 |
| 714/8 |
Isolating failed storage location (e.g., sector remapping) |
504 |
| 714/6 |
Redundant stored data accessed (e.g., duplicated data, error correction coded data, or other parity-type data) |
2254 |
| 714/7 |
Reconfiguration (e.g., adding a replacement storage component) |
795 |
| 714/4 |
Of network |
1681 |
| 714/14 |
Of power supply |
266 |
| 714/10 |
Of processor |
528 |
| 714/11 |
Concurrent, redundantly operating processors |
712 |
| 714/12 |
Synchronization maintenance of processors |
365 |
| 714/13 |
Prepared backup processor (e.g., initializing cold backup) or updating backup processor (e.g., by checkpoint message) |
563 |
| 714/23 |
Resetting processor |
319 |
| 714/24 |
Safe shutdown |
260 |
| 714/15 |
State recovery (i.e., process or data file) |
867 |
| 714/16 |
Forward recovery (e.g., redoing committed action) |
237 |
| 714/17 |
Reexecuting single instruction or bus cycle |
89 |
| 714/20 |
Plural recovery data sets containing set interrelation data (e.g., time values or log record numbers) |
402 |
| 714/21 |
State validity check |
128 |
| 714/18 |
Transmission data record (e.g., for retransmission) |
204 |
| 714/19 |
Undo record |
121 |
| 714/22 |
With power supply status monitoring |
350 |
| 714/47 |
Performance monitoring for fault avoidance |
1285 |
| | Diagnostic testing (371/15.1) | |
| | Digital data error correction (371/30) | |
| | Digital logic testing (371/22.1) | |
| | Replacement with spare device or system (371/8.1) | |
| | Memory testing (371/21.1) | |
| 714/699 |
Pulse or data error handling |
48 |
| 714/701 |
Data formatting to improve error detection correction capability |
485 |
| 714/702 |
Memory access (e.g., address permutation) |
189 |
| 714/709 |
Data pulse evaluation/bit decision |
147 |
| 714/746 |
Digital data error correction |
587 |
| 714/752 |
Forward correction by block code |
614 |
| 714/774 |
Adaptive error-correcting capability |
341 |
| 714/762 |
Burst error correction |
299 |
| 714/781 |
Code based on generator polynomial |
343 |
| 714/782 |
Bose-chaudhuri-hocquenghem code |
105 |
| 714/783 |
Golay code |
28 |
| 714/784 |
Reed-solomon code |
466 |
| 714/785 |
Syndrome computed |
329 |
| 714/755 |
Double encoding codes (e.g., product, concatenated) |
889 |
| 714/756 |
Cross-interleave reed-solomon code (circ) |
225 |
| 714/753 |
Double error correcting with single error correcting code |
80 |
| 714/758 |
Error correcting code with additional error detection code (e.g., cyclic redundancy character, parity) |
936 |
| 714/754 |
Error correction during refresh cycle |
60 |
| 714/776 |
For packet or frame multiplexed data |
423 |
| 714/777 |
Hamming code |
105 |
| 714/759 |
Look-up table encoding or decoding |
163 |
| 714/763 |
Memory access |
585 |
| 714/766 |
Check bits stored in separate area of memory |
234 |
| 714/767 |
Code word for plural n-bit (n>1) storage units (e.g., x4 dram's) |
84 |
| 714/772 |
Code word parallel access |
54 |
| 714/769 |
Dynamic data storage |
355 |
| 714/770 |
Disk array |
191 |
| 714/771 |
Tape |
66 |
| 714/764 |
Error correct and restore |
260 |
| 714/768 |
Error correction code for memory address |
113 |
| 714/765 |
Error pointer |
132 |
| 714/773 |
Solid state memory |
188 |
| 714/778 |
Nonbinary data (e.g., ternary) |
40 |
| 714/757 |
Parallel generation of check bits |
162 |
| 714/761 |
Random and burst error correction |
204 |
| 714/775 |
Synchronization |
245 |
| 714/760 |
Threshold decoding (e.g., majority logic) |
54 |
| 714/780 |
Using symbol reliability information (e.g., soft decision) |
221 |
| 714/779 |
Variable length data |
81 |
| 714/786 |
Forward error correction by tree code (e.g., convolutional) |
577 |
| 714/796 |
Branch metric calculation |
360 |
| 714/788 |
Burst error |
142 |
| 714/794 |
Maximum likelihood |
513 |
| 714/790 |
Puncturing |
216 |
| 714/787 |
Random and burst errors |
75 |
| 714/791 |
Sequential decoder (e.g., fano or stack algorithm) |
43 |
| 714/789 |
Synchronization |
116 |
| 714/793 |
Syndrome decodable (e.g., self orthogonal) |
62 |
| 714/792 |
Trellis code |
441 |
| 714/795 |
Viterbi decoding |
854 |
| 714/797 |
Majority decision/voter circuit |
231 |
| 714/748 |
Request for retransmission |
689 |
| 714/750 |
Feedback to transmitter for comparison |
114 |
| 714/751 |
Including forward error correction capability |
235 |
| 714/749 |
Retransmission if no ack returned |
284 |
| 714/747 |
Substitution of previous valid data |
197 |
| 714/724 |
Digital logic testing |
1815 |
| 714/733 |
Built-in testing circuit (bilbo) |
1104 |
| 714/745 |
Determination of marginal operation limits |
189 |
| 714/736 |
Device response compared to expected fault-free response |
728 |
| 714/737 |
Device response compared to fault dictionary/truth table |
93 |
| 714/735 |
Device response compared to input pattern |
303 |
| 714/738 |
Including test pattern generator |
863 |
| 714/743 |
Addressing |
138 |
| 714/744 |
Clock or synchronization |
348 |
| 714/740 |
Having analog signal |
74 |
| 714/739 |
Random pattern generation (includes pseudorandom pattern) |
225 |
| 714/741 |
Simulation |
264 |
| 714/742 |
Testing specific device |
293 |
| 714/725 |
Programmable logic array (pla) testing |
323 |
| 714/726 |
Scan path testing (e.g., level sensitive scan design (lssd)) |
1073 |
| 714/730 |
Addressing |
81 |
| 714/727 |
Boundary scan |
577 |
| 714/731 |
Clock or synchronization |
411 |
| 714/729 |
Plural scan paths |
339 |
| 714/728 |
Random pattern generation (includes pseudorandom pattern) |
153 |
| 714/732 |
Signature analysis |
314 |
| 714/734 |
Structural (in-circuit test) |
532 |
| 714/704 |
Error count or rate |
670 |
| 714/705 |
Pseudo-error rate |
39 |
| 714/708 |
Shutdown or establishing system parameter (e.g., transmission rate) |
206 |
| 714/707 |
Synchronization control |
154 |
| 714/706 |
Up-down counter |
51 |
| 714/798 |
Error detection for synchronization control |
332 |
| 714/799 |
Error/fault detection technique |
420 |
| 714/807 |
Check character |
261 |
| 714/808 |
Modulo-n residue check character |
45 |
| 714/809 |
Code constraint monitored |
84 |
| 714/810 |
Multilevel coding (n>2) |
55 |
| 714/819 |
Comparison of data |
369 |
| 714/824 |
Device output compared to input |
85 |
| 714/820 |
Plural parallel devices of channels |
181 |
| 714/821 |
Transmission facility |
130 |
| 714/822 |
Sequential repetition |
132 |
| 714/823 |
True and complement data |
49 |
| 714/806 |
Constant-ratio code (m/n) |
29 |
| 714/811 |
Forbidden combination or improper condition |
134 |
| 714/814 |
Data timing/clocking |
192 |
| 714/818 |
Missing-bit/drop-out detection |
53 |
| 714/817 |
Noise level |
24 |
| 714/812 |
Specified digital signal or pulse count |
92 |
| 714/815 |
Time delay/interval monitored |
212 |
| 714/813 |
Two key-down detector |
9 |
| 714/816 |
Two-rail logic |
20 |
| 714/800 |
Parity bit |
414 |
| 714/802 |
Even and odd parity |
56 |
| 714/801 |
Parity generator or checker circuit detail |
221 |
| 714/803 |
Parity prediction |
31 |
| 714/804 |
Plural dimension parity check |
102 |
| 714/805 |
Storage accessing (e.g., address parity check) |
341 |
| 714/718 |
Memory testing |
1755 |
| 714/721 |
Electrical parameter (e.g., threshold voltage) |
226 |
| 714/723 |
Error mapping or logging |
348 |
| 714/722 |
Performing arithmetic function on memory contents |
76 |
| 714/719 |
Read-in with read-out and compare |
628 |
| 714/720 |
Special test pattern (e.g., checkerboard, walking ones) |
216 |
| 714/710 |
Replacement of memory spare location, portion, or segment |
588 |
| 714/711 |
Spare row or column |
280 |
| 714/700 |
Skew detection correction |
378 |
| 714/703 |
Testing of error-check system |
206 |
| 714/712 |
Transmission facility testing |
553 |
| 714/714 |
By tone signal |
45 |
| 714/713 |
For channel having repeater |
62 |
| 714/717 |
Loop or ring configuration |
110 |
| 714/715 |
Test pattern with comparison |
257 |
| 714/716 |
Loop-back |
198 |