Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Browse by Category: Main > Information Technology
Class Information
Number: 702/97
Name: Data processing: measuring, calibrating, or testing > Calibration or correction system > Length, distance, or thickness
Description: Subject matter comprising means to calibrate or correct length, distance, or thickness gauge or signal representing such measurement.










Patents under this class:
1 2 3 4

Patent Number Title Of Patent Date Issued
5052121 Temperature-compensated quantitative dimensional measurement device with rapid temperature sensing and compensation Oct. 1, 1991
5036477 Method for the interference suppression in ultrasonic distance measurements Jul. 30, 1991
5007006 Method of and apparatus for calibration of machines Apr. 9, 1991
4996658 Self-calibrating glass container inspection machine Feb. 26, 1991
4965439 Microcontroller-controlled device for surveying, rangefinding and trajectory compensation Oct. 23, 1990
4942545 Calibration of eddy current profilometry Jul. 17, 1990
4918608 Method for automatic depth control for earth moving and grading Apr. 17, 1990
4914610 Displacement measuring apparatus Apr. 3, 1990
4895454 Method of determining the temperature of a workpiece in a flexible manufacturing system Jan. 23, 1990
4879671 Digital measurement of relative displacement using stored correction address data Nov. 7, 1989
4870854 Method of calibrating an apparatus for detecting the fill level in a fiber storing device Oct. 3, 1989
4872124 Length measuring device Oct. 3, 1989
4864395 Simplified calibration for a distance information obtaining device Sep. 5, 1989
4670659 Calibration method for an optical measuring system employing reference grids in a series of reference planes Jun. 2, 1987
4587622 Method and apparatus for determining and correcting guidance errors May. 6, 1986
4550377 Proximity flute detection Oct. 29, 1985
4528651 Method and apparatus for measurement of length and height of objects Jul. 9, 1985
4510577 Non-contact radiation thickness gauge Apr. 9, 1985
4447955 Method for determining the length of filamentary materials, such as yarn, wound upon a cross-wound package by means of a friction drive and a grooved drum May. 15, 1984
4428055 Tool touch probe system and method of precision machining Jan. 24, 1984
4198758 Chain measuring and conveyor control system Apr. 22, 1980
4188529 Electronic CB twenty meter Feb. 12, 1980
4145605 Vehicle position indicator Mar. 20, 1979
4139890 Bar gauge plotting and display system Feb. 13, 1979
4098105 Method and apparatus for setting the value of the forging dimension in forging presses using V-dies as forging tools Jul. 4, 1978
4064396 Dynamic linearization system for a radiation gauge Dec. 20, 1977
4052599 Method and apparatus for determining coil sheet length Oct. 4, 1977
4009376 Method and apparatus for measuring material thickness Feb. 22, 1977

1 2 3 4










 
 
  Recently Added Patents
Organizer
Sub-LUN input/output profiling for SSD devices
Method of motion correction in optical coherence tomography imaging
Maize variety hybrid X13A495
Semiconductor device and method for manufacturing the same
System and method for predicting remaining useful life of device components
Process for recovering and recycling an acid catalyst
  Randomly Featured Patents
Light emitting diode having protection function
Computer system integrating different data types into a single environment
Multi-window display system with modification or manipulation capability
Apparatus and method for controlling the shear mechanism of a glassware forming machine
Automatic focusing device
Two-section physical-exercise elastic cudgel
Articulated arm light
Ultrasonic imaging method and apparatus with electronic beam focusing and scanning
Cleaning and sanitizing system
Fluid control valve and inlet fitting assembly