| |
 |
|
Class Information
Number: 702/84
Name: Data processing: measuring, calibrating, or testing > Measurement system in a specific environment > Quality evaluation > Quality control
Description: Subject matter wherein the gathered data is evaluated and fed back to regulate (e.g., adjust, maintain, etc.) the manufacturing or assembly line to ensure a desired quality.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7620513 |
Optical time domain reflectometer, and optical fiber measuring method and optical fiber measuring system using the same |
Nov. 17, 2009 |
| 7616927 |
Method and apparatus to reduce multipath effects on radio link control measurements |
Nov. 10, 2009 |
| 7599755 |
System and method for dynamically simulating value stream and network maps |
Oct. 6, 2009 |
| 7574308 |
System and computer-based method for tracking an implantable medical device characteristic during a coating process |
Aug. 11, 2009 |
| 7571074 |
Method of using a wafer-thickness-dependant profile library |
Aug. 4, 2009 |
| 7565273 |
Determination of the age, identification and sealing of a product containing volatile components |
Jul. 21, 2009 |
| 7558683 |
Method for inspecting defect and system therefor |
Jul. 7, 2009 |
| 7542880 |
Time weighted moving average filter |
Jun. 2, 2009 |
| 7539586 |
Correction method and measuring instrument |
May. 26, 2009 |
| 7532990 |
System and method for press signature tracking and data association |
May. 12, 2009 |
| 7526394 |
Quality assessment tool |
Apr. 28, 2009 |
| 7520188 |
Method for controlling quality of a fiberglass mat |
Apr. 21, 2009 |
| 7519492 |
Apparatus and method for fully automated closed system quality control of a substance |
Apr. 14, 2009 |
| 7516042 |
Load test load modeling based on rates of user operations |
Apr. 7, 2009 |
| 7502658 |
Methods of fabricating optimization involving process sequence analysis |
Mar. 10, 2009 |
| 7484357 |
Apparatus, system, and method for determining and implementing estimate reliability |
Feb. 3, 2009 |
| 7469170 |
Device and method for assessing the safety of systems and for obtaining safety in system, and corresponding computer program |
Dec. 23, 2008 |
| 7469192 |
Parallel profile determination for an optical metrology system |
Dec. 23, 2008 |
| 7467054 |
System and method for integrating the internal and external quality control programs of a laboratory |
Dec. 16, 2008 |
| 7460968 |
Method and apparatus for selecting wafers for sampling |
Dec. 2, 2008 |
| 7457679 |
Solid model of statistical process control |
Nov. 25, 2008 |
| 7452733 |
Method of increasing reliability of packaged semiconductor integrated circuit dice |
Nov. 18, 2008 |
| 7421358 |
Method and system for measurement data evaluation in semiconductor processing by correlation-based data filtering |
Sep. 2, 2008 |
| 7409306 |
System and method for estimating reliability of components for testing and quality optimization |
Aug. 5, 2008 |
| 7401004 |
System for reviewing defects, a computer implemented method for reviewing defects, and a method for fabricating electronic devices |
Jul. 15, 2008 |
| 7386420 |
Data analysis method for integrated circuit process and semiconductor process |
Jun. 10, 2008 |
| 7379847 |
High bandwidth image transfer |
May. 27, 2008 |
| 7366620 |
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication |
Apr. 29, 2008 |
| 7359830 |
Method for automatic on-line calibration of a process model |
Apr. 15, 2008 |
| 7359813 |
Outlier screening technique |
Apr. 15, 2008 |
| 7348559 |
Defect inspection and charged particle beam apparatus |
Mar. 25, 2008 |
| 7346411 |
Automatic control and monitoring system for splice overlapping tolerance in textile ply |
Mar. 18, 2008 |
| 7343352 |
Method and system for assessing the quality and cost of inspection |
Mar. 11, 2008 |
| 7333907 |
System and methods for characterization of chemical arrays for quality control |
Feb. 19, 2008 |
| 7332359 |
Semiconductor device inspection method |
Feb. 19, 2008 |
| 7324862 |
Quality control apparatus and control method of the same, and recording medium recorded with quality control program |
Jan. 29, 2008 |
| 7324905 |
Apparatus, system and method for automating an interactive inspection process |
Jan. 29, 2008 |
| 7318000 |
Biometric quality control process |
Jan. 8, 2008 |
| 7305314 |
Method for inspecting defect and system therefor |
Dec. 4, 2007 |
| 7302367 |
Library accuracy enhancement and evaluation |
Nov. 27, 2007 |
| 7289862 |
Methods to support process quality and maintenance during control of an industrial process such as welding |
Oct. 30, 2007 |
| 7282942 |
Enhanced sampling methodology for semiconductor processing |
Oct. 16, 2007 |
| 7275016 |
Method and system for providing problem identification and trouble-shooting services |
Sep. 25, 2007 |
| 7272532 |
Method for predicting the quality of a product |
Sep. 18, 2007 |
| 7267799 |
Universal optical imaging and processing system |
Sep. 11, 2007 |
| 7269526 |
Aggregated run-to-run process control for wafer yield optimization |
Sep. 11, 2007 |
| 7266234 |
Method and device to control the straightness and torsions of long products |
Sep. 4, 2007 |
| 7263510 |
Human factors process failure modes and effects analysis (HF PFMEA) software tool |
Aug. 28, 2007 |
| 7260509 |
Method for estimating changes in product life resulting from HALT using quadratic acceleration model |
Aug. 21, 2007 |
| 7260444 |
Real-time management systems and methods for manufacturing management and yield rate analysis integration |
Aug. 21, 2007 |
|
|
|
