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Class Information
Number: 702/83
Name: Data processing: measuring, calibrating, or testing > Measurement system in a specific environment > Quality evaluation > Sampling inspection plan
Description: Subject matter wherein means for gathering data comprises details of a specifically defined plan created for the gathering of data related to the product.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7577537 |
Providing a dynamic sampling plan for integrated metrology |
Aug. 18, 2009 |
| 7570797 |
Methods and systems for generating an inspection process for an inspection system |
Aug. 4, 2009 |
| 7567873 |
Nondestructive inspection method and apparatus for a surface processed by shot peening |
Jul. 28, 2009 |
| 7565254 |
Method and apparatus for metrology sampling using combination sampling rules |
Jul. 21, 2009 |
| 7557696 |
System and process to record inspection compliance data |
Jul. 7, 2009 |
| 7558687 |
Method and apparatus for dynamic adjustment of a sensor sampling rate |
Jul. 7, 2009 |
| 7552020 |
System and method for sorting data |
Jun. 23, 2009 |
| 7539584 |
Volume based extended defect sizing system |
May. 26, 2009 |
| 7499818 |
Flexible sampling plans and user interface for coordinate measuring machines |
Mar. 3, 2009 |
| 7483799 |
Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor |
Jan. 27, 2009 |
| 7478000 |
Method and system to develop a process improvement methodology |
Jan. 13, 2009 |
| 7463941 |
Quality control system, quality control method, and method of lot-to-lot wafer processing |
Dec. 9, 2008 |
| 7460968 |
Method and apparatus for selecting wafers for sampling |
Dec. 2, 2008 |
| 7451051 |
Method and system to develop a process improvement methodology |
Nov. 11, 2008 |
| 7421358 |
Method and system for measurement data evaluation in semiconductor processing by correlation-based data filtering |
Sep. 2, 2008 |
| 7409306 |
System and method for estimating reliability of components for testing and quality optimization |
Aug. 5, 2008 |
| 7398172 |
Method and system of providing a dynamic sampling plan for integrated metrology |
Jul. 8, 2008 |
| 7395131 |
Method for processing data based on the data context |
Jul. 1, 2008 |
| 7366640 |
Pharmaceutical waste identification system |
Apr. 29, 2008 |
| 7355730 |
Office machine that can be remote-maintenanced via a computer network and a management or/and support or/and report or/and information system comprising a plurality of office machines |
Apr. 8, 2008 |
| 7353078 |
Semiconductor wafer processing apparatus and method for processing batch of wafers having variable number of wafer lots |
Apr. 1, 2008 |
| 7340352 |
Inspecting method, inspecting apparatus, and method of manufacturing semiconductor device |
Mar. 4, 2008 |
| 7330800 |
Method and apparatus for selecting sites for sampling |
Feb. 12, 2008 |
| 7302367 |
Library accuracy enhancement and evaluation |
Nov. 27, 2007 |
| 7295940 |
Process control system to manage materials used in construction |
Nov. 13, 2007 |
| 7260442 |
Method and system for mask fabrication process control |
Aug. 21, 2007 |
| 7257502 |
Determining metrology sampling decisions based on fabrication simulation |
Aug. 14, 2007 |
| 7246020 |
System and method for sorting data |
Jul. 17, 2007 |
| 7239970 |
Robotic system for optically inspecting workpieces |
Jul. 3, 2007 |
| 7233871 |
Inspection window guard banding |
Jun. 19, 2007 |
| 7222038 |
Detecting a defective area of an inspected apparatus |
May. 22, 2007 |
| 7208328 |
Method and system for analyzing defects of an integrated circuit wafer |
Apr. 24, 2007 |
| 7206708 |
Lifecycle support software tool |
Apr. 17, 2007 |
| 7197414 |
System and method for identifying a manufacturing tool causing a fault |
Mar. 27, 2007 |
| 7197304 |
Wireless data communication protocol diagnosis system |
Mar. 27, 2007 |
| 7194325 |
System to and method of monitoring condition of process tool |
Mar. 20, 2007 |
| 7194366 |
System and method for estimating reliability of components for testing and quality optimization |
Mar. 20, 2007 |
| 7162386 |
Dynamically adaptable semiconductor parametric testing |
Jan. 9, 2007 |
| 7136844 |
Finding the most interesting patterns in a database quickly by using sequential sampling |
Nov. 14, 2006 |
| 7127359 |
Real-time mathematical model for wafer spin defect detection and for misalignment analyses |
Oct. 24, 2006 |
| 7096161 |
Pharmaceutical hazardous waste identification and management system |
Aug. 22, 2006 |
| 7079979 |
Inspection method, inspection apparatus, and facility diagnosis unit |
Jul. 18, 2006 |
| 7079967 |
Apparatus and method for detecting faults and providing diagnostics in vapor compression cycle equipment |
Jul. 18, 2006 |
| 7072786 |
Inspection system setup techniques |
Jul. 4, 2006 |
| 7035703 |
Systems and methods for realtime determination of asphalt content |
Apr. 25, 2006 |
| 7020535 |
Method and apparatus for providing excitation for a process controller |
Mar. 28, 2006 |
| 7010447 |
Method for inspecting defect and system therefor |
Mar. 7, 2006 |
| 6988045 |
Dynamic metrology sampling methods, and system for performing same |
Jan. 17, 2006 |
| 6985825 |
Method and apparatus for adaptive sampling based on process covariance |
Jan. 10, 2006 |
| 6973397 |
Alignment method and parameter selection method |
Dec. 6, 2005 |
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