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Class Information
Number: 702/82
Name: Data processing: measuring, calibrating, or testing > Measurement system in a specific environment > Quality evaluation > Having judging means (e.g., accept/reject)
Description: Subject matter including a judging means responsive to the gathered data to make a decision on the status of the product (e.g., accept/reject; pass/fail; in/out of tolerance; good/bad).
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7603241 |
Light receiving apparatus, testing apparatus, light receiving method, testing method, test module and semiconductor chip |
Oct. 13, 2009 |
| 7596456 |
Method and apparatus for cassette integrity testing using a wafer sorter |
Sep. 29, 2009 |
| 7589845 |
Process control using an optical metrology system optimized with signal criteria |
Sep. 15, 2009 |
| 7571025 |
Method and device for controlling manipulators |
Aug. 4, 2009 |
| 7552019 |
Systems and methods of converting RFID labels |
Jun. 23, 2009 |
| 7540078 |
Method for recycling wastes of an electrical appliance |
Jun. 2, 2009 |
| 7536270 |
Service providing system, disappointment judging system, and disappointment judging method |
May. 19, 2009 |
| 7529631 |
Defect detection system, defect detection method, and defect detection program |
May. 5, 2009 |
| 7502658 |
Methods of fabricating optimization involving process sequence analysis |
Mar. 10, 2009 |
| 7490010 |
Data collection method, substrate processing apparatus, and substrate processing system |
Feb. 10, 2009 |
| 7472036 |
Service providing system, service providing method, and program |
Dec. 30, 2008 |
| 7472038 |
Method of predicting microprocessor lifetime reliability using architecture-level structure-aware techniques |
Dec. 30, 2008 |
| 7436169 |
Mechanical stress characterization in semiconductor device |
Oct. 14, 2008 |
| 7421885 |
Method for characterizing porous low dielectric constant films |
Sep. 9, 2008 |
| 7421355 |
Measuring apparatus, measuring method, testing apparatus, testing method, and electronic device |
Sep. 2, 2008 |
| 7421358 |
Method and system for measurement data evaluation in semiconductor processing by correlation-based data filtering |
Sep. 2, 2008 |
| 7409306 |
System and method for estimating reliability of components for testing and quality optimization |
Aug. 5, 2008 |
| 7409309 |
Method of deciding the quality of the measurement value by the edge width |
Aug. 5, 2008 |
| 7401004 |
System for reviewing defects, a computer implemented method for reviewing defects, and a method for fabricating electronic devices |
Jul. 15, 2008 |
| 7398169 |
Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device |
Jul. 8, 2008 |
| 7398171 |
Automated quality control method and system for genetic analysis |
Jul. 8, 2008 |
| 7346411 |
Automatic control and monitoring system for splice overlapping tolerance in textile ply |
Mar. 18, 2008 |
| 7346465 |
Method of testing the objects in a set to obtain an increased level of quality |
Mar. 18, 2008 |
| 7340359 |
Augmenting semiconductor's devices quality and reliability |
Mar. 4, 2008 |
| 7337033 |
Data mining to detect performance quality of tools used repetitively in manufacturing |
Feb. 26, 2008 |
| 7333876 |
Systems and methods for providing electronic quality control in a process for applying a polyurethane to a substrate |
Feb. 19, 2008 |
| 7324905 |
Apparatus, system and method for automating an interactive inspection process |
Jan. 29, 2008 |
| 7299147 |
Systems for managing production information |
Nov. 20, 2007 |
| 7269470 |
Aligner evaluation system, aligner evaluation method, a computer program product, and a method for manufacturing a semiconductor device |
Sep. 11, 2007 |
| 7257502 |
Determining metrology sampling decisions based on fabrication simulation |
Aug. 14, 2007 |
| 7251578 |
Method and system of measuring data quality |
Jul. 31, 2007 |
| 7239970 |
Robotic system for optically inspecting workpieces |
Jul. 3, 2007 |
| 7225047 |
Method, system and medium for controlling semiconductor wafer processes using critical dimension measurements |
May. 29, 2007 |
| 7216005 |
Control apparatus for injection molding machine |
May. 8, 2007 |
| 7216043 |
Push communications architecture for intelligent electronic devices |
May. 8, 2007 |
| 7212883 |
Machine readable medium and method for determining feature-relating tolerance consumed |
May. 1, 2007 |
| 7212955 |
Consumer product status monitoring |
May. 1, 2007 |
| 7194366 |
System and method for estimating reliability of components for testing and quality optimization |
Mar. 20, 2007 |
| 7186981 |
Method and apparatus for thermographic imaging using flash pulse truncation |
Mar. 6, 2007 |
| 7181353 |
Method and apparatus for integrating Six Sigma methodology into inspection receiving process of outsourced subassemblies, parts, and materials: acceptance, rejection, trending, tracking and cl |
Feb. 20, 2007 |
| 7171332 |
Method of assessing a surface of a fuel injector assembly |
Jan. 30, 2007 |
| 7155357 |
Method and apparatus for detecting an unused state in a semiconductor circuit |
Dec. 26, 2006 |
| 7149635 |
Seal force monitor apparatus, system, and method for in-process determination of integrity of sealed containers |
Dec. 12, 2006 |
| 7127365 |
Method for identifying a defective die site |
Oct. 24, 2006 |
| 7124050 |
Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture |
Oct. 17, 2006 |
| 7107167 |
Method and apparatus for searching external issues for testing a product |
Sep. 12, 2006 |
| 7089131 |
Inspection and verification system and method |
Aug. 8, 2006 |
| 7085677 |
Automatically identifying incongruous item packages |
Aug. 1, 2006 |
| 7065414 |
Methods and apparatus for operating production facilities |
Jun. 20, 2006 |
| 7054771 |
Bus line current calibration |
May. 30, 2006 |
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