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Class Information
Number: 702/81
Name: Data processing: measuring, calibrating, or testing > Measurement system in a specific environment > Quality evaluation
Description: Subject matter comprising means for gathering data, usually on a manufacturing or assembly line, to determine the quality of a product.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7618832 |
Semiconductor substrate having reference semiconductor chip and method of assembling semiconductor chip using the same |
Nov. 17, 2009 |
| 7620519 |
Burn-in process of producing data correlating elevation of disk drive head to temperature and method of controlling the elevation of the disk drive head using the data |
Nov. 17, 2009 |
| 7616927 |
Method and apparatus to reduce multipath effects on radio link control measurements |
Nov. 10, 2009 |
| 7617075 |
Library accuracy enhancment and evaluation |
Nov. 10, 2009 |
| 7599755 |
System and method for dynamically simulating value stream and network maps |
Oct. 6, 2009 |
| 7599815 |
Building management performance indexing and control |
Oct. 6, 2009 |
| 7591440 |
Methods and systems for cement finishing mill control |
Sep. 22, 2009 |
| 7580808 |
Onboard trip computer for emissions subject to reduction credits |
Aug. 25, 2009 |
| 7567878 |
Evaluating anomaly for one class classifiers in machine condition monitoring |
Jul. 28, 2009 |
| 7558641 |
Recipe report card framework and methods thereof |
Jul. 7, 2009 |
| 7555395 |
Methods and apparatus for using an optically tunable soft mask to create a profile library |
Jun. 30, 2009 |
| 7548824 |
Automated analysis system for semiconductor manufacturing fabrication |
Jun. 16, 2009 |
| 7539585 |
System and method for rule-based data mining and problem detection for semiconductor fabrication |
May. 26, 2009 |
| 7539583 |
Method and system for defect detection |
May. 26, 2009 |
| 7539584 |
Volume based extended defect sizing system |
May. 26, 2009 |
| 7532990 |
System and method for press signature tracking and data association |
May. 12, 2009 |
| 7533313 |
Method and apparatus for identifying outlier data |
May. 12, 2009 |
| 7529627 |
Method of sea electrical survey of oil and gas deposits and apparatus complex for its realization `VeSoTEM` |
May. 5, 2009 |
| 7526396 |
Method for determining treatability of a wood product |
Apr. 28, 2009 |
| 7526394 |
Quality assessment tool |
Apr. 28, 2009 |
| 7526354 |
Managing and using metrology data for process and equipment control |
Apr. 28, 2009 |
| 7520188 |
Method for controlling quality of a fiberglass mat |
Apr. 21, 2009 |
| 7521950 |
Wafer level I/O test and repair enabled by I/O layer |
Apr. 21, 2009 |
| 7516042 |
Load test load modeling based on rates of user operations |
Apr. 7, 2009 |
| 7516040 |
System and method for automated detection of printing defects in an image output device |
Apr. 7, 2009 |
| 7516047 |
Diagnostic method for manufacturing processes |
Apr. 7, 2009 |
| 7512508 |
Determining and analyzing integrated circuit yield and quality |
Mar. 31, 2009 |
| 7512501 |
Defect inspecting apparatus for semiconductor wafer |
Mar. 31, 2009 |
| 7502702 |
Method and apparatus for dynamic adjustment of sensor and/or metrology sensitivities |
Mar. 10, 2009 |
| 7493185 |
Quality prognostics system and method for manufacturing processes |
Feb. 17, 2009 |
| 7484357 |
Apparatus, system, and method for determining and implementing estimate reliability |
Feb. 3, 2009 |
| 7487054 |
Automated dynamic metrology sampling system and method for process control |
Feb. 3, 2009 |
| 7478000 |
Method and system to develop a process improvement methodology |
Jan. 13, 2009 |
| 7472037 |
System and methods for quantitatively evaluating complexity of computing system configuration |
Dec. 30, 2008 |
| 7467054 |
System and method for integrating the internal and external quality control programs of a laboratory |
Dec. 16, 2008 |
| 7457763 |
Predictive maintenance system |
Nov. 25, 2008 |
| 7454302 |
Method of inspecting integrated circuits during fabrication |
Nov. 18, 2008 |
| 7451051 |
Method and system to develop a process improvement methodology |
Nov. 11, 2008 |
| 7447610 |
Method and system for reliability similarity of semiconductor devices |
Nov. 4, 2008 |
| 7444251 |
Detecting and diagnosing faults in HVAC equipment |
Oct. 28, 2008 |
| 7440860 |
Sequential unique marking |
Oct. 21, 2008 |
| 7440870 |
System for monitoring the quality of industrial processes and method therefrom |
Oct. 21, 2008 |
| 7437269 |
Method, system and program for evaluating reliability on component |
Oct. 14, 2008 |
| 7430485 |
Method and system for analyzing coatings undergoing exposure testing |
Sep. 30, 2008 |
| 7423442 |
System and method for early qualification of semiconductor devices |
Sep. 9, 2008 |
| 7421358 |
Method and system for measurement data evaluation in semiconductor processing by correlation-based data filtering |
Sep. 2, 2008 |
| 7421357 |
Inspection data analysis program, inspection tools, review apparatus and yield analysis apparatus |
Sep. 2, 2008 |
| 7415317 |
Method and system for correlating and combining production and non-production data for analysis |
Aug. 19, 2008 |
| 7412297 |
Method and system for designing and manufacturing lens modules |
Aug. 12, 2008 |
| 7409306 |
System and method for estimating reliability of components for testing and quality optimization |
Aug. 5, 2008 |
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