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Class Information
Number: 702/81
Name: Data processing: measuring, calibrating, or testing > Measurement system in a specific environment > Quality evaluation
Description: Subject matter comprising means for gathering data, usually on a manufacturing or assembly line, to determine the quality of a product.










Sub-classes under this class:

Class Number Class Name Patents
702/82 Having judging means (e.g., accept/reject) 302
702/84 Quality control 496
702/83 Sampling inspection plan 206


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13

Patent Number Title Of Patent Date Issued
8712730 Control system of substrate processing apparatus, collecting unit, substrate processing apparatus and control method of the substrate processing apparatus Apr. 29, 2014
8712712 System and method for producing statistically valid assay means and ranges for quality control materials Apr. 29, 2014
8670948 Numerical aperture integration for optical critical dimension (OCD) metrology Mar. 11, 2014
8666711 Radiation analysis system and method Mar. 4, 2014
8652412 Sterilization of consumable composition dispensers Feb. 18, 2014
8653983 Monitoring and control system Feb. 18, 2014
8656448 Providing policy-based application services to an application running on a computing system Feb. 18, 2014
8649990 Method for detecting variance in semiconductor processes Feb. 11, 2014
8643539 Advance manufacturing monitoring and diagnostic tool Feb. 4, 2014
8638841 Transmitting/receiving system, transmitting/receiving method, and computer readable medium for estimating temporal fluctuation of a signal Jan. 28, 2014
8630819 System and method for electronic inspection and record creation of assembly, repair and maintenance operations Jan. 14, 2014
8626460 Secure test-for-yield chip diagnostics management system and method Jan. 7, 2014
8626463 Data storage device tester Jan. 7, 2014
8626464 Dimensional inspection method for a composite part Jan. 7, 2014
8627243 Methods for optimizing conductor patterns for ECP and CMP in semiconductor processing Jan. 7, 2014
8600528 Real-time, packet-level quality assurance of electromechanical device control data Dec. 3, 2013
8600685 Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life Dec. 3, 2013
8594827 Method of controlling semiconductor device fabrication Nov. 26, 2013
8594821 Detecting combined tool incompatibilities and defects in semiconductor manufacturing Nov. 26, 2013
8593690 Method for making overprint predictions Nov. 26, 2013
8583391 Monitoring the low cycle fatigue of ruggedized avionics electronics Nov. 12, 2013
8571696 Methods and apparatus to predict process quality in a process control system Oct. 29, 2013
8571823 Method for controlling the quality of industrial processes, in particular laser-welding processes Oct. 29, 2013
8571824 Vehicular door closing-inspection apparatus and vehicular door closing-inspection method Oct. 29, 2013
8565491 Image processing apparatus, image processing method, program, and imaging apparatus Oct. 22, 2013
8553970 System and method for generating spatial signatures Oct. 8, 2013
8548742 Non-contact measurement systems for wireline and coiled tubing Oct. 1, 2013
8543355 Substrate processing apparatus checking method and storage medium Sep. 24, 2013
8538714 Testing the integrity of products in containers Sep. 17, 2013
8537349 Monitoring of time-varying defect classification performance Sep. 17, 2013
8532815 Method for electronic temperature controlled curing of concrete and accelerating concrete maturity or equivalent age of concrete structures and objects Sep. 10, 2013
8532949 Computer-implemented methods and systems for classifying defects on a specimen Sep. 10, 2013
8524153 Quality control system Sep. 3, 2013
8527214 System and method for monitoring mechanical seals Sep. 3, 2013
8521432 Performance assessment system for deep geologic repository for radioactive waste disposal Aug. 27, 2013
8515569 Work support system, work support method, and storage medium Aug. 20, 2013
8510067 Quality assurance system and method for point-of-care testing Aug. 13, 2013
8495431 Temperature-profiled device fingerprint generation and authentication from power-up states of static cells Jul. 23, 2013
8494817 Methods for yield variability benchmarking, assessment, quantification, and localization Jul. 23, 2013
8494809 Tool for calculating the performance of progressive lenses Jul. 23, 2013
8489352 Information recording medium, and process management apparatus and process management system using the information recording medium Jul. 16, 2013
8489924 Evaluating apparatus and evaluating program product Jul. 16, 2013
8483860 Environmental load amount calculation method, execution program therefor, and execution apparatus therefor Jul. 9, 2013
8478563 Device and method for the dimensional characterization of a cylindrical object Jul. 2, 2013
8473236 Managing non-destructive evaluation data Jun. 25, 2013
8473235 Metal detector Jun. 25, 2013
8467978 Identifying features on a surface of an object using wavelet analysis Jun. 18, 2013
8467992 Vision based location and measurement device and methods Jun. 18, 2013
8463574 Method to orient a sphere or ball Jun. 11, 2013
8457913 Computer system with integrated electromagnetic-interference detectors Jun. 4, 2013

1 2 3 4 5 6 7 8 9 10 11 12 13










 
 
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