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Class Information
Number: 702/57
Name: Data processing: measuring, calibrating, or testing > Measurement system in a specific environment > Electrical signal parameter measurement system
Description: Subject matter wherein the measurement system or process is designed for or utilized to measure an electrical parameter.


Sub-classes under this class:

Class Number Class Name Patents
702/58 For electrical fault detection 395
702/60 Power parameter 525
702/80 Specified memory location generation for storage 57
702/79 Time-related parameter (e.g., pulse-width, period, delay, etc.) 335
702/64 Voltage or current 577
702/66 Waveform analysis 444


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13

Patent Number Title Of Patent Date Issued
7620506 Measurement electronic device system Nov. 17, 2009
7620507 Impedance-estimation methods, modeling methods, articles of manufacture, impedance-modeling devices, and estimated-impedance monitoring systems Nov. 17, 2009
7616927 Method and apparatus to reduce multipath effects on radio link control measurements Nov. 10, 2009
7617056 Parameter extraction method, method for inspecting circuit operation, and storage medium having program to perform the parameter extraction method Nov. 10, 2009
7617064 Self-test circuit for high-definition multimedia interface integrated circuits Nov. 10, 2009
7613576 Using EMI signals to facilitate proactive fault monitoring in computer systems Nov. 3, 2009
7610175 Timestamping signal monitor device Oct. 27, 2009
7603478 Displaying routing information for a measurement system Oct. 13, 2009
7600053 Emulation of extended input/output measurement block facilities Oct. 6, 2009
7596461 Measurement of air quality in wireless networks Sep. 29, 2009
7590152 Router-based monitoring of EF-on-EF jitter Sep. 15, 2009
7590499 Recording and conveying energy consumption and power information Sep. 15, 2009
7577859 System and method of controlling power consumption in an electronic system by applying a uniquely determined minimum operating voltage to an integrated circuit rather than a predetermined nomi Aug. 18, 2009
7577534 Risk assessment of metal vapor arcing Aug. 18, 2009
7577875 Statistical analysis of sampled profile data in the identification of significant software test performance regressions Aug. 18, 2009
7573937 Phase rotator control test scheme Aug. 11, 2009
7574309 Internal bias measure with onboard ADC for electronic devices Aug. 11, 2009
7571028 Method and system for AC power grid monitoring Aug. 4, 2009
7567891 Hot-carrier device degradation modeling and extraction methodologies Jul. 28, 2009
7567872 Film forming condition determination method, film forming method, and film structure manufacturing method Jul. 28, 2009
7565267 Life prediction and monitoring of components Jul. 21, 2009
7565637 Method of designing package for semiconductor device, layout design tool for performing the same, and method of manufacturing semiconductor device using the same Jul. 21, 2009
7561392 Intrinsically safe data transmission device Jul. 14, 2009
7561980 Transmission medium testing apparatus and method Jul. 14, 2009
7558685 Frequency resolution using compression Jul. 7, 2009
7558711 Generating a hardware description of a block diagram model for implementation on programmable hardware Jul. 7, 2009
7552367 Fault recording and sequence of events recording device capable of recording communication-based signals related to electrical power systems Jun. 23, 2009
7552023 Parameter correction circuit and parameter correction method Jun. 23, 2009
7552028 Recording medium, test apparatus and diagnostic method Jun. 23, 2009
7552018 Method for quickly quantifying the resistance of a thin film as a function of frequency Jun. 23, 2009
7550979 System and method for measuring conductivity of fluid Jun. 23, 2009
7546781 Ultrasonic operation apparatus and abnormality judgment method thereof Jun. 16, 2009
7548819 Signal measurement and processing method and apparatus Jun. 16, 2009
7548823 Correction of delay-based metric measurements using delay circuits having differing metric sensitivities Jun. 16, 2009
7546230 Electromagnetic response model with improved high frequency stability Jun. 9, 2009
7543199 Test device Jun. 2, 2009
7542879 Virtual sensor based control system and method Jun. 2, 2009
7542858 Simulated battery logic testing device Jun. 2, 2009
7542857 Technique for determining performance characteristics of electronic devices and systems Jun. 2, 2009
7539587 Rate-based sensors for advanced real-time analysis and diagnostics May. 26, 2009
7533313 Method and apparatus for identifying outlier data May. 12, 2009
7526390 Signal measuring circuit and signal measuring method Apr. 28, 2009
7526391 Method and apparatus to evaluate transient characteristics in an electrical power system Apr. 28, 2009
7522294 Measuring a process parameter of a semiconductor fabrication process using optical metrology Apr. 21, 2009
7520168 Vibration reduction for head gimbal assembly testing Apr. 21, 2009
7519506 System and method for monitoring and managing electrical power transmission and distribution networks Apr. 14, 2009
7519509 Network analyzer, transmission tracking error measuring method, network analyzing method, program, and recording medium Apr. 14, 2009
7516025 System and method for providing a data structure representative of a fault tree Apr. 7, 2009
7516042 Load test load modeling based on rates of user operations Apr. 7, 2009
7516248 Obtaining extended queue measurement data for a range of logical control unit queues Apr. 7, 2009

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