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Browse by Category: Main > Information Technology
Class Information
Number: 702/36
Name: Data processing: measuring, calibrating, or testing > Measurement system in a specific environment > Mechanical measurement system > Flaw or defect detection > Location
Description: Subject matter comprising means for determining position or site of the fault.


Patents under this class:
1 2 3

Patent Number Title Of Patent Date Issued
7627439 Sensor infrastructure Dec. 1, 2009
7607351 Acoustic impact detection and monitoring system Oct. 27, 2009
7595488 Method and apparatus for specifying working position on a sample and method of working the sample Sep. 29, 2009
7542821 Multi-unit process spatial synchronization of image inspection systems Jun. 2, 2009
7542856 Structure monitor system Jun. 2, 2009
7539596 Diagnosis and state monitoring of junctions, crossings, crossroads or rail joints by means of a rail vehicle May. 26, 2009
7499772 Method and system for navigating a nondestructive evaluation device Mar. 3, 2009
7398698 Smart repair patch and associated method Jul. 15, 2008
7376519 Method for reducing the computation resources required for determining damage in structural health management system May. 20, 2008
7353609 Hole location method and apparatus Apr. 8, 2008
7356444 Embedded system for diagnostics and prognostics of conduits Apr. 8, 2008
7334485 System, method and computer-readable medium for locating physical phenomena Feb. 26, 2008
7308367 Wafer inspection system Dec. 11, 2007
7289913 Local feature characterization using quasistatic electromagnetic sensors Oct. 30, 2007
7277822 Embedded system for diagnostics and prognostics of conduits Oct. 2, 2007
7266470 Method for mitigating interference between nearby proximity sensors Sep. 4, 2007
7263446 Structural health management system and method for enhancing availability and integrity in the structural health management system Aug. 28, 2007
7181356 Device and method for analyzing the structure of a material Feb. 20, 2007
7136714 Procedure for determining modifications made to an electronic card and methods of fabricating an electronic card and an item equipment provided with an electronic card Nov. 14, 2006
7127359 Real-time mathematical model for wafer spin defect detection and for misalignment analyses Oct. 24, 2006
7120524 System for measuring points on a vehicle during damage repair Oct. 10, 2006
7107158 Inspection system and apparatus Sep. 12, 2006
7103482 Inspection system and apparatus Sep. 5, 2006
7092826 Semiconductor wafer inspection system Aug. 15, 2006
7080555 Distributed mode system for real time acoustic emission monitoring Jul. 25, 2006
7082370 Localization of a point source of a visualized gas leak Jul. 25, 2006
7069155 Real time analytical monitor for soft defects on reticle during reticle inspection Jun. 27, 2006
7047151 System and method for detecting defects of objects based on a CAD platform May. 16, 2006
7027934 Apparatus and method for automated web inspection Apr. 11, 2006
7024315 In-situ structural health monitoring, diagnostics and prognostics system utilizing thin piezoelectric sensors Apr. 4, 2006
7013222 Wafer edge inspection data gathering Mar. 14, 2006
7013231 Method and program product to optimize manufacturing test time of electrical devices Mar. 14, 2006
7010462 System and method for evaluating efficiency losses for turbine components Mar. 7, 2006
6996480 Structural health monitoring system utilizing guided lamb waves embedded ultrasonic structural radar Feb. 7, 2006
6990221 Automated DNA array image segmentation and analysis Jan. 24, 2006
6975945 System and method for indication of fuse defects based upon analysis of fuse test data Dec. 13, 2005
6957154 Semiconductor wafer inspection system Oct. 18, 2005
6873918 Control embedded machine condition monitor Mar. 29, 2005
6850857 Data fusion of stationary array sensor and scanning sensor measurements Feb. 1, 2005
6839641 Automated system for rating pipe segments in a water distribution system Jan. 4, 2005
6820016 Leak detection apparatus and method Nov. 16, 2004
6809756 System for monitoring a process Oct. 26, 2004
6799126 Nondestructive method for detecting structural anomalies in composites Sep. 28, 2004
6778156 Method for examining quality of flat panel display device Aug. 17, 2004
6757621 Process management system Jun. 29, 2004
6738717 Crystal structure analysis method May. 18, 2004
6687622 Leak detection apparatus for blister packs Feb. 3, 2004
6674882 Automated DNA array image segmentation and analysis Jan. 6, 2004
6618689 Method for the non-destructive inspection of wall strength Sep. 9, 2003
6615156 Abnormal state absolute position detector generating direct digital output Sep. 2, 2003

1 2 3


 
 
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