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Class Information
Number: 702/36
Name: Data processing: measuring, calibrating, or testing > Measurement system in a specific environment > Mechanical measurement system > Flaw or defect detection > Location
Description: Subject matter comprising means for determining position or site of the fault.

Patents under this class:
1 2 3 4

Patent Number Title Of Patent Date Issued
8712704 Defect detection system and method Apr. 29, 2014
8688417 Detecting impact of extrinsic events on a time series Apr. 1, 2014
8594975 Systems and methods for wafer edge feature detection and quantification Nov. 26, 2013
8583271 Controlling cutting of continuously fabricated composite parts with nondestructive evaluation Nov. 12, 2013
8538696 Providing weather data for a location using weather data stored for a finite number of locations Sep. 17, 2013
8532940 Systems and methods for the inspection of structures having unknown properties Sep. 10, 2013
8521443 Method to extract parameters from in-situ monitored signals for prognostics Aug. 27, 2013
8483975 Prediction of remaining life in a heat exchanger Jul. 9, 2013
8483977 Method of laser vibration defect analysis Jul. 9, 2013
8478548 User interface system and method for diagnosing a rotating machine condition not based upon prior measurement history Jul. 2, 2013
8457909 Timing analysis Jun. 4, 2013
8447530 High density structural health monitoring system and method May. 21, 2013
8436298 System and method for grouping precursor and fragment ions using selected ion chromatograms May. 7, 2013
8401720 System, method, and computer software code for detecting a physical defect along a mission route Mar. 19, 2013
8381146 Computer product, apparatus, and method for correcting time delay variation of a circuit design Feb. 19, 2013
8374803 Damage detection apparatus, damage detection method and recording medium Feb. 12, 2013
8352201 Integrated circuit system for controlling structural health monitoring processes Jan. 8, 2013
8340801 Systems for generating representations of flatness defects on wafers Dec. 25, 2012
8326551 Method and system for incorporating electronic signature analysis in low voltage power supplies Dec. 4, 2012
8296082 System for testing performance of array ultrasound transducer Oct. 23, 2012
8290719 Mode identification and decomposition for ultrasonic signals Oct. 16, 2012
8265889 Integrated circuit system for controlling structural health monitoring processes and applications therefor Sep. 11, 2012
8209135 Wafer inspection data handling and defect review tool Jun. 26, 2012
8209145 Methods for GPS to milepost mapping Jun. 26, 2012
8204699 Analyzing apparatus, analyzing method, and computer-readable recording medium storing an analyzing program Jun. 19, 2012
8185326 Corrosion detection and monitoring system May. 22, 2012
8175820 Defect inspection apparatus and defect inspection method May. 8, 2012
8173449 Method for making COP evaluation on single-crystal silicon wafer May. 8, 2012
8165706 Methods for generating representations of flatness defects on wafers Apr. 24, 2012
8142368 Method of characterization and differentiation of tissue Mar. 27, 2012
8065571 Storage area network (SAN) link integrity tester Nov. 22, 2011
8046178 Defect detection system for identifying defects in weld seams Oct. 25, 2011
7974815 Embedded system for diagnostics and prognostics of conduits Jul. 5, 2011
7937248 Virtual time reversal acoustics for structural health monitoring May. 3, 2011
7937234 Classification of spatial patterns on wafer maps May. 3, 2011
7930112 Method for evaluating measured values for identifying a material fatigue Apr. 19, 2011
7930259 Apparatus for detecting vibrations of a test object using a competitive learning neural network in determining frequency characteristics generated Apr. 19, 2011
7930111 Synthesized synchronous sampling and acceleration enveloping for differential bearing damage signature Apr. 19, 2011
7930128 Robust damage detection Apr. 19, 2011
7925455 Method and system for the determination of damage location Apr. 12, 2011
7877216 Method, system, and apparatus for friction pad wear and brake condition monitoring Jan. 25, 2011
7853345 Offset determination method for measurement system matching Dec. 14, 2010
7822562 Removing air wave noise from electromagnetic survey data Oct. 26, 2010
7822561 Defect analysis methods for semiconductor integrated circuit devices and defect analysis systems Oct. 26, 2010
7822573 Method and apparatus for modeling responses for a material to various inputs Oct. 26, 2010
7801700 Simulating a vibration pattern in a computer subsystem Sep. 21, 2010
7800055 System and method for grouping precursor and fragment ions using selected ion chromatograms Sep. 21, 2010
7751989 Guided wave pipeline inspection system with enhanced focusing capability Jul. 6, 2010
7734429 Method and apparatus for creating at least one parameter for algorithmically evaluating damage in a structure Jun. 8, 2010
7715991 Systems and methods for monitoring energy system components May. 11, 2010

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