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Class Information
Number: 702/35
Name: Data processing: measuring, calibrating, or testing > Measurement system in a specific environment > Mechanical measurement system > Flaw or defect detection
Description: Subject matter wherein the data processing system or calculating computer is designed for or utilized in the study of an object to identify the existence or amount of a fault (e.g., crack or break) of the object.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7620519 |
Burn-in process of producing data correlating elevation of disk drive head to temperature and method of controlling the elevation of the disk drive head using the data |
Nov. 17, 2009 |
| 7603586 |
Intelligent stationary power equipment and diagnostics |
Oct. 13, 2009 |
| 7599804 |
Method for detecting structure-borne noise events in a roller bearing |
Oct. 6, 2009 |
| 7599817 |
Abnormality cause specifying method, abnormality cause specifying system, and semiconductor device fabrication method |
Oct. 6, 2009 |
| 7593828 |
Method and apparatus for monitoring a variable geometry intake air compressor device |
Sep. 22, 2009 |
| 7590496 |
Embedded system for diagnostics and prognostics of conduits |
Sep. 15, 2009 |
| 7584061 |
Device for measuring permeate flow and permeate conductivity of individual reverse osmosis membrane elements |
Sep. 1, 2009 |
| 7584012 |
Automatic defect review and classification system |
Sep. 1, 2009 |
| 7583200 |
Method and system for detecting and measuring the disturbances in terms of frequency of the rate of rotation of a rotor |
Sep. 1, 2009 |
| 7577533 |
Ultrasonic inspection apparatus for inspecting a workpiece |
Aug. 18, 2009 |
| 7571060 |
System and method for gemstone cut grading |
Aug. 4, 2009 |
| 7567873 |
Nondestructive inspection method and apparatus for a surface processed by shot peening |
Jul. 28, 2009 |
| 7565252 |
Method for automatic differentiation of weld signals from defect signals in long-range guided-wave inspection using phase comparison |
Jul. 21, 2009 |
| 7555936 |
Hydraulic hose with integral life-sensing capability and method therefor |
Jul. 7, 2009 |
| 7558683 |
Method for inspecting defect and system therefor |
Jul. 7, 2009 |
| 7545971 |
Method and apparatus for measuring the crepe of a moving sheet |
Jun. 9, 2009 |
| 7542821 |
Multi-unit process spatial synchronization of image inspection systems |
Jun. 2, 2009 |
| 7542856 |
Structure monitor system |
Jun. 2, 2009 |
| 7539596 |
Diagnosis and state monitoring of junctions, crossings, crossroads or rail joints by means of a rail vehicle |
May. 26, 2009 |
| 7529631 |
Defect detection system, defect detection method, and defect detection program |
May. 5, 2009 |
| 7523182 |
Method and system for predicting the services needs of remote point of sale devices |
Apr. 21, 2009 |
| 7516022 |
Method and system for assessing quality of spot welds |
Apr. 7, 2009 |
| 7512500 |
Method for sensor initialization in a structural health management system |
Mar. 31, 2009 |
| 7512501 |
Defect inspecting apparatus for semiconductor wafer |
Mar. 31, 2009 |
| 7509250 |
Hardware key control of debug interface |
Mar. 24, 2009 |
| 7505871 |
Diagnosis and troubleshooting for above-ground well systems |
Mar. 17, 2009 |
| 7502670 |
System and method for determining rail safety limits |
Mar. 10, 2009 |
| 7502712 |
Preventive defect detection and control process in composite material parts |
Mar. 10, 2009 |
| 7499812 |
Method for locating flaws, and a marking system |
Mar. 3, 2009 |
| 7499813 |
Device and method for inspecting for flaw on surface of work |
Mar. 3, 2009 |
| 7495217 |
Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysis |
Feb. 24, 2009 |
| 7496454 |
High mast inspection system, equipment and method |
Feb. 24, 2009 |
| 7493237 |
Environmental monitoring and reporting system |
Feb. 17, 2009 |
| 7477060 |
Coating impedance monitoring system |
Jan. 13, 2009 |
| 7474092 |
Method and device for long-range guided-wave inspection of fire side of waterwall tubes in boilers |
Jan. 6, 2009 |
| 7474967 |
Computer-implemented methods, carrier media, and systems for detecting defects on a wafer based on multi-core architecture |
Jan. 6, 2009 |
| 7451009 |
Method and apparatus for product defect classification |
Nov. 11, 2008 |
| 7447598 |
Methods and systems for automatically assessing and reporting structural health |
Nov. 4, 2008 |
| 7440857 |
Method and a system for detecting and locating an adjustment error or a defect of a rotorcraft rotor |
Oct. 21, 2008 |
| 7437278 |
Simulation method, simulation apparatus, and computer program product for simulation |
Oct. 14, 2008 |
| 7421349 |
Bearing fault signature detection |
Sep. 2, 2008 |
| 7415362 |
Image defect inspection apparatus |
Aug. 19, 2008 |
| 7412090 |
Method of managing wafer defects |
Aug. 12, 2008 |
| 7409306 |
System and method for estimating reliability of components for testing and quality optimization |
Aug. 5, 2008 |
| 7403865 |
System and method for fault indication on a substrate in maskless applications |
Jul. 22, 2008 |
| 7403871 |
Extraction of imperfection features through spectral analysis |
Jul. 22, 2008 |
| 7398178 |
Method of determining the irregularities of a hole |
Jul. 8, 2008 |
| 7395475 |
Circuit and method for fuse disposing in a semiconductor memory device |
Jul. 1, 2008 |
| 7395462 |
Defect estimation apparatus and related method |
Jul. 1, 2008 |
| 7386420 |
Data analysis method for integrated circuit process and semiconductor process |
Jun. 10, 2008 |
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