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Browse by Category: Main > Information Technology
Class Information
Number: 702/181
Name: Data processing: measuring, calibrating, or testing > Measurement system > Statistical measurement > Probability determination
Description: Subject matter comprising a percentile estimating means for determining a chance that a given event is likely to occur.


Patents under this class:
1 2 3 4 5 6 7 8 9

Patent Number Title Of Patent Date Issued
6466894 Device, method, and medium for predicting a probability of an occurrence of a data Oct. 15, 2002
6466895 Defect reference system automatic pattern classification Oct. 15, 2002
6463391 Method and apparatus for calculating confidence intervals Oct. 8, 2002
6460011 Method for measuring a degree of association for dimensionally referenced data Oct. 1, 2002
6453265 Accurately predicting system behavior of a managed system using genetic programming Sep. 17, 2002
6453255 Method for complex products configuration and guarantee generation Sep. 17, 2002
6446027 Intelligent analysis system and method for fluid-filled electrical equipment Sep. 3, 2002
6445969 Statistical process control integration systems and methods for monitoring manufacturing processes Sep. 3, 2002
6430522 Enhanced model identification in signal processing using arbitrary exponential functions Aug. 6, 2002
6418398 Optimization with ruin recreate Jul. 9, 2002
6415243 Performance monitoring and optimization using an adaptive digital circuit Jul. 2, 2002
6411908 Condition-based prognosis for machinery Jun. 25, 2002
6397200 Data reduction system for improving classifier performance May. 28, 2002
6381555 Measurement system Apr. 30, 2002
6374196 Method of fault diagnosis based on propagation model Apr. 16, 2002
6360184 Method for measuring a degree of association for dimensionally referenced data Mar. 19, 2002
6360183 Device and method for triggering a random event Mar. 19, 2002
6353804 Method for statistically predicting equipment performance Mar. 5, 2002
6351713 Distributed stress wave analysis system Feb. 26, 2002
6349265 Method and apparatus for mapping components of descriptor vectors for molecular complexes to a space that discriminates between groups Feb. 19, 2002
6345121 Image encoding apparatus and an image decoding apparatus Feb. 5, 2002
6334095 Method for assessing plant capacity Dec. 25, 2001
6317700 Computational method and system to perform empirical induction Nov. 13, 2001
6308142 Method for determining flame retardance of polymer compositions Oct. 23, 2001
6295514 Method, system, and computer program product for representing similarity/dissimilarity between chemical compounds Sep. 25, 2001
6289291 Statistical method of monitoring gate oxide layer yield Sep. 11, 2001
6249755 Apparatus and method for event correlation and problem reporting Jun. 19, 2001
6199018 Distributed diagnostic system Mar. 6, 2001
6189994 System to determine integrated nucleation probability in ink jet recording apparatus using thermal energy Feb. 20, 2001
6188990 Method and apparatus for monitoring the processing of articles Feb. 13, 2001
6173240 Multidimensional uncertainty analysis Jan. 9, 2001
6157899 Prediction of responses to different powdering tests on a galvanneal-coated steel substrate or different tests on other substrates, using computer-based systems and methods Dec. 5, 2000
6154711 Disposition tool for factory process control Nov. 28, 2000
6148268 Method for quality control and yield enhancement Nov. 14, 2000
6134510 Method for detecting synchronicity between several digital measurement series with the aid of a computer Oct. 17, 2000
6125340 System for determining the probability that items of evidence prove a conclusion Sep. 26, 2000
6125339 Automatic learning of belief functions Sep. 26, 2000
6104968 Programmable supervisory circuit and applications therefore Aug. 15, 2000
6101460 Method of forecasting resource needs Aug. 8, 2000
6098024 System for process data association using LaPlace Everett interpolation Aug. 1, 2000
6085154 Method for estimating the failure rate of components of technical devices Jul. 4, 2000
6076043 Utilization effectiveness of nutrients in a population Jun. 13, 2000
6070004 Method of maximizing chip yield for semiconductor wafers May. 30, 2000
6066179 Property estimation of an integrated circuit May. 23, 2000
6055483 Systems and methods using bridge models to globally optimize a process facility Apr. 25, 2000
6055491 Method and apparatus for analyzing co-evolving time sequences Apr. 25, 2000
6049741 Method of predicting a failure and control unit and load controlling system using the same Apr. 11, 2000
6021383 Method and apparatus for clustering data Feb. 1, 2000
5999893 Classification system and method using combined information testing Dec. 7, 1999
5999918 Interactive color confidence indicators for statistical data Dec. 7, 1999

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