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Class Information
Number: 702/170
Name: Data processing: measuring, calibrating, or testing > Measurement system > Dimensional determination > Thickness or width
Description: Subject matter wherein the geometrical measurement is thickness or width.










Sub-classes under this class:

Class Number Class Name Patents
702/172 By radiant energy (e.g., x-ray, light) 121
702/171 By ultrasonic 48


Patents under this class:
1 2 3 4 5

Patent Number Title Of Patent Date Issued
8687858 Method and device for producing thin sections of a sample by means of an image recognition system Apr. 1, 2014
8627243 Methods for optimizing conductor patterns for ECP and CMP in semiconductor processing Jan. 7, 2014
8606541 Combined amplitude and frequency measurements for non-contacting turbomachinery blade vibration Dec. 10, 2013
8594822 Electronic supervisor Nov. 26, 2013
8554503 Method for calibrating a thickness gauge Oct. 8, 2013
8521471 Measurement of thickness of dielectric films on surfaces Aug. 27, 2013
8498840 Method of determining the thickness of a mailpiece Jul. 30, 2013
8483993 Accurately accounting for sizing uncertainty in inspection Jul. 9, 2013
8374803 Damage detection apparatus, damage detection method and recording medium Feb. 12, 2013
8367431 Manufacturing method of semiconductor photonic device substrate Feb. 5, 2013
8357548 Semiconductor wafer metrology apparatus and method Jan. 22, 2013
8315833 Method for contactless capacitive thickness measurements Nov. 20, 2012
8280680 Method and apparatus for detecting mailpiece thickness in an inserter system Oct. 2, 2012
8244497 Method of solving a process function for manufacturing an extrusion die Aug. 14, 2012
8170832 Measurement and endpointing of sample thickness May. 1, 2012
8170827 Drop mass deviation measuring apparatus, drop mass deviation measuring method of the same, pattern forming system using the same, and control method of the pattern forming system using the sam May. 1, 2012
8131863 Address translator, message processing method and equipment Mar. 6, 2012
8099256 Method of determining the dimensions of a mailpiece Jan. 17, 2012
8078419 Polishing monitoring method and polishing apparatus Dec. 13, 2011
8065109 Localized substrate geometry characterization Nov. 22, 2011
8059282 Reflective film thickness measurement method Nov. 15, 2011
8055053 Physimetric property identification of physical object for process control Nov. 8, 2011
8016481 Method and apparatus of measuring temperature Sep. 13, 2011
7955876 Method for simulating deposition film shape and method for manufacturing electronic device Jun. 7, 2011
7952708 High throughput measurement system May. 31, 2011
7941282 Estimating worst case corrosion in a pipeline May. 10, 2011
7848844 Substrate grinding method and device Dec. 7, 2010
7831395 Quantification of adsorbed molecular contaminant using thin film measurement Nov. 9, 2010
7824730 Method and apparatus for measuring coating thickness with a laser Nov. 2, 2010
7764386 Method and system for three-dimensional measurement and method and device for controlling manipulator Jul. 27, 2010
RE41342 Coating thickness gauge May. 18, 2010
7680304 Method of wood strength and stiffness prediction Mar. 16, 2010
7660698 Phytometric intelligence sensors Feb. 9, 2010
7640138 Interconnection pattern inspection method, manufacturing method of semiconductor device and inspection apparatus Dec. 29, 2009
7571074 Method of using a wafer-thickness-dependant profile library Aug. 4, 2009
7561984 Method for calculating a model spectrum Jul. 14, 2009
7512518 Method for measuring thin layers in solid state devices Mar. 31, 2009
7506280 Magnetic winding and method of making same Mar. 17, 2009
7486087 Method for measuring thickness of print products passing spaced apart at specific distances in a conveying flow through a measuring device Feb. 3, 2009
7466854 Size checking method and apparatus Dec. 16, 2008
7444198 Determining physical property of substrate Oct. 28, 2008
7428470 Method for monitoring edge exclusion during chemical mechanical planarization Sep. 23, 2008
7427520 Method and apparatus for measuring thickness of thin film formed on substrate Sep. 23, 2008
7415398 Method of simulating viscoelastic material Aug. 19, 2008
7409309 Method of deciding the quality of the measurement value by the edge width Aug. 5, 2008
7375828 Modal method modeling of binary gratings with improved eigenvalue computation May. 20, 2008
7369947 Quantification of adsorbed molecular contaminant using thin film measurement May. 6, 2008
7365862 Methods and apparatus for inspecting an object Apr. 29, 2008
7352194 Method for determining the thickness of a coating on a composite material Apr. 1, 2008
7353141 Method and system for monitoring component consumption Apr. 1, 2008

1 2 3 4 5










 
 
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