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Class Information
Number: 702/167
Name: Data processing: measuring, calibrating, or testing > Measurement system > Dimensional determination > Contouring
Description: Subject matter wherein the geometrical measurement includes profile information representing structure or shape or outline of a surface or body or figure.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7433799 |
Method of determining shape data |
Oct. 7, 2008 |
| 7428469 |
Three-dimensional-information detecting system and three-dimensional-information inputting device |
Sep. 23, 2008 |
| 7409256 |
Footwear measurement and footwear manufacture systems and methods |
Aug. 5, 2008 |
| 7406395 |
Method and system for measuring geometrical characters of a figure |
Jul. 29, 2008 |
| 7395182 |
System and method for the dimension checking of mechanical pieces |
Jul. 1, 2008 |
| 7388677 |
Optical metrology optimization for repetitive structures |
Jun. 17, 2008 |
| 7369961 |
Systems and methods for structural clustering of time sequences |
May. 6, 2008 |
| 7366637 |
Form measuring instrument |
Apr. 29, 2008 |
| 7363181 |
Straightness correcting method for surface texture measuring instrument, and surface texture measuring instrument |
Apr. 22, 2008 |
| 7359829 |
Method of inspecting the profile of the connection zone between the cylindrical portion and the taper of a roller for a turbomachine roller bearing |
Apr. 15, 2008 |
| 7359828 |
Process for plotting the shape of a contour of a previously machined ophthalmic lens |
Apr. 15, 2008 |
| 7346999 |
Methods and system for inspection of fabricated components |
Mar. 25, 2008 |
| 7321841 |
Three-dimensional shape measuring method and measuring apparatus thereof |
Jan. 22, 2008 |
| 7318767 |
Device and method for machine control |
Jan. 15, 2008 |
| 7317992 |
Method and apparatus for inspecting dovetail edgebreak contour |
Jan. 8, 2008 |
| 7299145 |
Method for the automatic simultaneous synchronization, calibration and qualification of a non-contact probe |
Nov. 20, 2007 |
| 7289933 |
Simulating topography of a conductive material in a semiconductor wafer |
Oct. 30, 2007 |
| 7266233 |
System and method for measuring an object |
Sep. 4, 2007 |
| 7251580 |
Method for measuring curved surface of workpiece, program and medium thereof |
Jul. 31, 2007 |
| 7243441 |
Method and apparatus for measuring depth of holes formed on a specimen |
Jul. 17, 2007 |
| 7235414 |
Using scatterometry to verify contact hole opening during tapered bilayer etch |
Jun. 26, 2007 |
| 7233390 |
Scatterometry for samples with non-uniform edges |
Jun. 19, 2007 |
| 7231277 |
Surface shape determining device for a machining apparatus and surface shape determining method |
Jun. 12, 2007 |
| 7228254 |
Shape model generation method and shape model generation system |
Jun. 5, 2007 |
| 7212949 |
Automated system and method for tool mark analysis |
May. 1, 2007 |
| 7209858 |
Precision position determining method |
Apr. 24, 2007 |
| 7197425 |
Road surface state estimating system and road surface state measuring apparatus |
Mar. 27, 2007 |
| 7187457 |
Apparatus for measuring sizes of articles |
Mar. 6, 2007 |
| 7158915 |
Apparatus and method for displaying numeric values corresponding to the volume of segments of an irregularly shaped item |
Jan. 2, 2007 |
| 7143005 |
Image reconstruction method |
Nov. 28, 2006 |
| 7120286 |
Method and apparatus for three dimensional edge tracing with Z height adjustment |
Oct. 10, 2006 |
| 7092096 |
Optical scatterometry method of sidewall spacer analysis |
Aug. 15, 2006 |
| 7069175 |
Method and apparatus for supporting measurement of object to be measured |
Jun. 27, 2006 |
| 7068379 |
Compact optical contour digitizer |
Jun. 27, 2006 |
| 7039550 |
Surface scan measuring instrument, surface scan measuring method, surface scan measuring program and recording medium |
May. 2, 2006 |
| 7027949 |
Systems and methods for measuring component matching |
Apr. 11, 2006 |
| 6985238 |
Non-contact measurement system for large airfoils |
Jan. 10, 2006 |
| 6975960 |
Method for evaluating wafer configuration, wafer, and wafer sorting method |
Dec. 13, 2005 |
| 6968080 |
Method and apparatus for generating part programs for use in image-measuring instruments, and image-measuring instrument and method of displaying measured results therefrom |
Nov. 22, 2005 |
| 6957164 |
Elastic sensor mesh system for 3-dimensional measurement, mapping and kinematics applications |
Oct. 18, 2005 |
| 6943968 |
Adjustable focusing composite for use in an optical profilometer system and method |
Sep. 13, 2005 |
| 6944564 |
Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probe |
Sep. 13, 2005 |
| 6937960 |
Smooth contouring software for generating geophysical data having less artifacts |
Aug. 30, 2005 |
| 6928383 |
Three-dimensional information detecting system, three-dimensional information detecting device and input device for three-dimensional information detecting system |
Aug. 9, 2005 |
| 6912478 |
System for collecting data used by surface profiling scheme |
Jun. 28, 2005 |
| 6907672 |
System and method for measuring three-dimensional objects using displacements of elongate measuring members |
Jun. 21, 2005 |
| 6895359 |
Workpiece coordinate system origin setting method, workpiece coordinate system origin setting program and workpiece coordinate system origin setting device of a surface property measuring mach |
May. 17, 2005 |
| 6882953 |
Stylus with position signal transmission |
Apr. 19, 2005 |
| 6882956 |
Lapping plate topography system |
Apr. 19, 2005 |
| 6836745 |
Method for determining the position of a sensor element |
Dec. 28, 2004 |
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