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Class Information
Number: 702/135
Name: Data processing: measuring, calibrating, or testing > Measurement system > Temperature measuring system > By radiant energy > Infrared
Description: Subject matter wherein the radiation is in a wavelength region of infrared.










Patents under this class:
1 2

Patent Number Title Of Patent Date Issued
4974182 Method and system for optically measuring simultaneously the emissivity and temperature of objects Nov. 27, 1990
4924478 Method of and device for contactless temperature measurement of an object independently of radiation emissivity May. 8, 1990
4890245 Method for measuring temperature of semiconductor substrate and apparatus therefor Dec. 26, 1989
4884896 Production line emissivity measurement system Dec. 5, 1989
4880314 Pyrometric measurement procedure and multi-channel pyrometer Nov. 14, 1989
4875176 Method and apparatus for measuring surface temperatures Oct. 17, 1989
4868768 Optical absorption measurement system Sep. 19, 1989
4817020 Cooling rate determination apparatus for laser material processing Mar. 28, 1989
4813003 Method of detecting hot spots in a rotary heat exchanger Mar. 14, 1989
4797840 Infrared electronic thermometer and method for measuring temperature Jan. 10, 1989
4791585 Cryogenic thermometer employing molecular luminescence Dec. 13, 1988
4589082 Nuclear fuel rod straightness measuring system and method May. 13, 1986
4254338 Determination of temperature distributions on awkwardly located or low-access surfaces Mar. 3, 1981
4218707 Thermographic areameter Aug. 19, 1980

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