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Class Information
Number: 702/134
Name: Data processing: measuring, calibrating, or testing > Measurement system > Temperature measuring system > By radiant energy
Description: Subject matter comprising means for measuring emitted or reflected radiation of a substance or an object for conversion to indication of its temperature.


Sub-classes under this class:

Class Number Class Name Patents
702/135 Infrared 46


Patents under this class:
1 2

Patent Number Title Of Patent Date Issued
7409313 Method and apparatus for nondestructive evaluation of insulative coating Aug. 5, 2008
7353722 Contactless measurement of the surface temperature of naturally or artificially weathered samples Apr. 8, 2008
7239974 Explosive device detection based on differential emissivity Jul. 3, 2007
7212933 Absolutely and uniformly convergent iterative approach to inverse scattering with an infinite radius of convergence May. 1, 2007
7202475 Rapid defect composition mapping using multiple X-ray emission perspective detection scheme Apr. 10, 2007
7155363 Thermal imaging for semiconductor process monitoring Dec. 26, 2006
7096148 Magnetic tracking system Aug. 22, 2006
7069169 Method and apparatus for measuring heat flux distribution on object surface using temperature-sensitive paint Jun. 27, 2006
7010455 Method and relevant device for revealing objects Mar. 7, 2006
6996492 Spectrum simulation for semiconductor feature inspection Feb. 7, 2006
6963816 Systems and methods for integrated emissivity and temperature measurement of a surface Nov. 8, 2005
6885964 Method and apparatus for thermal analysis Apr. 26, 2005
6862549 Radiometric temperature measurement system Mar. 1, 2005
6850862 Methods and equipment for the measurement of the three-dimensional distribution of the temperatures within dielectric means Feb. 1, 2005
6845326 Optical sensor for analyzing a stream of an agricultural product to determine its constituents Jan. 18, 2005
6816803 Method of optical pyrometry that is independent of emissivity and radiation transmission losses Nov. 9, 2004
6804622 Method and apparatus for non-destructive thermal inspection Oct. 12, 2004
6799137 Wafer temperature measurement method for plasma environments Sep. 28, 2004
6763316 Method for measurement of beam emittance in a charged particle transport system Jul. 13, 2004
6742168 Method and structure for calibrating scatterometry-based metrology tool used to measure dimensions of features on a semiconductor device May. 25, 2004
6738724 Two-stage multiwavelength thermal radiation analyzer May. 18, 2004
6694282 Method and device for determining an operating temperature of a semiconductor component Feb. 17, 2004
6647350 Radiometric temperature measurement system Nov. 11, 2003
6643604 System for uniformly heating photoresist Nov. 4, 2003
6640199 System and method for optically determining properties of hot fluids from the spectral structure of emitted radiation Oct. 28, 2003
6591216 Device and method for determining a spatial position of an object Jul. 8, 2003
6584426 Electronic thermometer Jun. 24, 2003
6564164 Method for optimally determining sensor positions for acoustic pyrometry May. 13, 2003
6405137 Method and apparatus for performing chemical analysis using imaging by scanning thermal microscopy Jun. 11, 2002
6397161 Method for stabilizing output of rain sensor and protection method therefor May. 28, 2002
6393375 System and method for determining combustion temperature using infrared emissions May. 21, 2002
6370486 System and method for determining combustion temperature using infrared emissions Apr. 9, 2002
6349270 Method and apparatus for measuring the temperature of objects on a fast moving holder Feb. 19, 2002
6324482 Sensor provided with adjusting function Nov. 27, 2001
6275747 Microcomputer and its access speed control method Aug. 14, 2001
6230108 Realtime sensitivity correction method and infrared imaging system May. 8, 2001
6064949 Method and apparatus for controlling a screening device based on more than one set of factors May. 16, 2000
6057912 Method for Blackbody lamp reference compensation using a single silicon photodiode May. 2, 2000
5971598 Wireless remote controlled tanning system Oct. 26, 1999
5940787 Apparatuses and methods of monitoring the condition of tools and workpieces Aug. 17, 1999
5897610 Electro optical board assembly for measuring the temperature of an object surface from infra red emissions thereof including an automatic gain control therefore Apr. 27, 1999
5890095 System for receiving and enhancing electromagnetic radiation input signals Mar. 30, 1999
5822222 Multi-wavelength imaging pyrometer Oct. 13, 1998
5815404 Method and apparatus for obtaining and using antifuse testing information to increase programmable device yield Sep. 29, 1998
5772323 Temperature determining device and process Jun. 30, 1998
5737242 Method for automatically determining probabilities associated with a Boolean function Apr. 7, 1998
5730527 Method and apparatus for measuring temperature using an optical fiber Mar. 24, 1998
5636143 Method and apparatus for estimating color temperature, photographing apparatus, and method and apparatus for determining exposure Jun. 3, 1997
5568978 Optical apparatus and method for measuring temperature of a substrate material with a temperature dependent band gap Oct. 29, 1996
5564830 Method and arrangement for determining the layer-thickness and the substrate temperature during coating Oct. 15, 1996

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