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Class Information
Number: 702/125
Name: Data processing: measuring, calibrating, or testing > Testing system > Signal generation or waveform shaping > Timing signal
Description: Subject matter wherein the signal is generated for system timing purposes (e.g., trigger pulses, synchronizing signal, system clock pulses).
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7624323 |
Method and apparatus for testing an IC device based on relative timing of test signals |
Nov. 24, 2009 |
| 7620516 |
Versatile semiconductor manufacturing controller with statistically repeatable response times |
Nov. 17, 2009 |
| 7574317 |
Method for calibrating a filter, a calibrator and system including the same |
Aug. 11, 2009 |
| 7574633 |
Test apparatus, adjustment method and recording medium |
Aug. 11, 2009 |
| 7539592 |
Test apparatus and electronic device |
May. 26, 2009 |
| 7532995 |
Interpolator testing circuit |
May. 12, 2009 |
| 7526399 |
Method of delay calculation in integrated circuit, and timing analysis system using the same |
Apr. 28, 2009 |
| 7505862 |
Apparatus and method for testing electronic systems |
Mar. 17, 2009 |
| 7506222 |
System for phase tracking and equalization across a byte group for asymmetric control of high-speed bidirectional signaling |
Mar. 17, 2009 |
| 7480839 |
Qualified anomaly detection |
Jan. 20, 2009 |
| 7480882 |
Measuring and predicting VLSI chip reliability and failure |
Jan. 20, 2009 |
| 7454306 |
Frequency margin testing |
Nov. 18, 2008 |
| 7444570 |
Apparatus and method for controlling frequency of an I/O clock for an integrated circuit during test |
Oct. 28, 2008 |
| 7415377 |
Relay testing system and method |
Aug. 19, 2008 |
| 7382366 |
Method, apparatus, system, and graphical user interface for selecting overclocking parameters of a graphics system |
Jun. 3, 2008 |
| 7369957 |
Method and system for generating test pulses to test electronic elements |
May. 6, 2008 |
| 7324914 |
Timing closure for system on a chip using voltage drop based standard delay formats |
Jan. 29, 2008 |
| 7325171 |
Measurement and data acquisition system including a real-time monitoring circuit for implementing control loop applications |
Jan. 29, 2008 |
| 7319936 |
Instrument with interface for synchronization in automatic test equipment |
Jan. 15, 2008 |
| 7318003 |
System and method of determining the speed of digital application specific integrated circuits |
Jan. 8, 2008 |
| 7315791 |
Application programming interface for synchronizing multiple instrumentation devices |
Jan. 1, 2008 |
| 7308381 |
Timing verification method for semiconductor integrated circuit |
Dec. 11, 2007 |
| 7308371 |
Bit error rate testing for high-speed devices |
Dec. 11, 2007 |
| 7299437 |
Method and apparatus for detecting timing exception path and computer product |
Nov. 20, 2007 |
| 7289926 |
System and method for examining high-frequency clock-masking signal patterns at full speed |
Oct. 30, 2007 |
| 7283920 |
Apparatus and method for testing semiconductor device |
Oct. 16, 2007 |
| 7272539 |
Representation generation method, representation generation device, and representation generation system |
Sep. 18, 2007 |
| 7257508 |
Timing generator, and timing generating method |
Aug. 14, 2007 |
| 7248986 |
Programmable system for device testing and control |
Jul. 24, 2007 |
| 7246018 |
Interpolator testing circuit |
Jul. 17, 2007 |
| 7222035 |
Method and apparatus for determining changing signal frequency |
May. 22, 2007 |
| 7222042 |
System and method of measuring turn-on and turn-off times of an optoelectronic device |
May. 22, 2007 |
| 7212939 |
Method and system for timing measurement of embedded macro module |
May. 1, 2007 |
| 7209853 |
Measuring apparatus and program |
Apr. 24, 2007 |
| 7209852 |
Circuit for producing a variable frequency clock signal having a high frequency low jitter pulse component |
Apr. 24, 2007 |
| 7206713 |
Method of adjusting strobe timing and function testing device for semiconductor device |
Apr. 17, 2007 |
| 7184920 |
Delay measurement system |
Feb. 27, 2007 |
| 7133800 |
Sensor web |
Nov. 7, 2006 |
| 7107175 |
Continuous digital background calibration in pipelined ADC architecture |
Sep. 12, 2006 |
| 7103514 |
Filter turning point detection |
Sep. 5, 2006 |
| 7096144 |
Digital signal sampler |
Aug. 22, 2006 |
| 7096443 |
Method for determining the critical path of an integrated circuit |
Aug. 22, 2006 |
| 7093240 |
Efficient timing chart creation and manipulation |
Aug. 15, 2006 |
| 7089143 |
Method and system for evaluating timing in an integrated circuit |
Aug. 8, 2006 |
| 7089144 |
Determining impact of test operations at a product assembly and test facility with repairable product |
Aug. 8, 2006 |
| 7085993 |
System and method for correcting timing signals in integrated circuits |
Aug. 1, 2006 |
| 7080304 |
Technique for programming clocks in automatic test system |
Jul. 18, 2006 |
| 7076394 |
Method and device for inspecting an object using a time delay integration sensor |
Jul. 11, 2006 |
| 7076385 |
System and method for calibrating signal paths connecting a device under test to a test system |
Jul. 11, 2006 |
| 7043390 |
Circuit testing with ring-connected test instruments modules |
May. 9, 2006 |
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