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Class Information
Number: 702/124
Name: Data processing: measuring, calibrating, or testing > Testing system > Signal generation or waveform shaping
Description: Subject matter wherein the test means includes means for generating a specific type of signal or signal having a specific waveform.

Sub-classes under this class:

Class Number Class Name Patents
702/126 Signal conversion 76
702/125 Timing signal 179

Patents under this class:
1 2 3 4 5

Patent Number Title Of Patent Date Issued
8688400 Signal generator producing intersymbol interference effects on serial data Apr. 1, 2014
8682638 Channel emulator system and method Mar. 25, 2014
8661285 Dynamically calibrated DDR memory controller Feb. 25, 2014
8650010 Apparatus and method for generating a test signal with emulated crosstalk Feb. 11, 2014
8645095 Synchronous multi-temperature sensor for semiconductor integrated circuits Feb. 4, 2014
8611827 System, method, and program for correcting radiowave environment data Dec. 17, 2013
8549342 Method and apparatus for fine edge control on integrated circuit outputs Oct. 1, 2013
8539426 Method and system for extracting compact models for circuit simulation Sep. 17, 2013
8527227 Method and device for measuring electromagnetic wave Sep. 3, 2013
8483984 Method and apparatus for testing the operating conditions of an electric network Jul. 9, 2013
8442797 Directional tap detection algorithm using an accelerometer May. 14, 2013
8428898 Method and system for correcting frequency response of a signal sampler Apr. 23, 2013
8423315 Digital waveform generation and measurement in automated test equipment Apr. 16, 2013
8397187 Verifying the error bound of numerical computation implemented in computer systems Mar. 12, 2013
8290738 Low power scan testing techniques and apparatus Oct. 16, 2012
8280672 Trimming circuit of semiconductor memory apparatus and trimming method thereof Oct. 2, 2012
8255179 Time qualified frequency mask trigger Aug. 28, 2012
8244490 Power trigger with time qualified and sequential event capability Aug. 14, 2012
8228084 Systems and methods for self-testing of integrated devices during production Jul. 24, 2012
8224604 Gate delay measurement circuit and method of determining a delay of a logic gate Jul. 17, 2012
8224613 Synthesis and generation of arbitrary waveforms with ISI components for jitter tolerance Jul. 17, 2012
8219573 Test case generation apparatus, generation method therefor, and program storage medium Jul. 10, 2012
8219335 Electric winding displacement detection method and apparatus Jul. 10, 2012
8200991 Generating a PWM load profile for a computer system Jun. 12, 2012
8180586 Amplitude discrimination using the frequency mask trigger May. 15, 2012
8156396 Method and system for correcting timing errors in high data rate automated test equipment Apr. 10, 2012
8155897 Test apparatus, transmission system, program, and recording medium Apr. 10, 2012
8150436 Radio-wave propagation characteristic prediction assisting system and radio-wave propagation characteristic prediction assisting method Apr. 3, 2012
8140290 Transmission characteristics measurement apparatus, transmission characteristics measurement method, and electronic device Mar. 20, 2012
8140292 Method and system for controlling a voltage waveform Mar. 20, 2012
8078424 Test apparatus Dec. 13, 2011
8055077 R/T display compression preserving intensity information Nov. 8, 2011
8044678 Device for simulating rectified constant impedance load and method thereof Oct. 25, 2011
8041979 Method and a system for synchronising respective state transitions in a group of devices Oct. 18, 2011
8036841 Measuring method and apparatus for potentiometric measuring probes Oct. 11, 2011
8032350 Techniques for generating and simulating a simulatable vector having amplitude noise and/or timing jitter added thereto Oct. 4, 2011
8014969 Test apparatus, test method and manufacturing method Sep. 6, 2011
8005637 Method and apparatus for measuring characteristics of an electrical device Aug. 23, 2011
8006156 Method of generating test condition for detecting delay faults in semiconductor integrated circuit and apparatus for generating the same Aug. 23, 2011
8000928 Methods and apparatus for data analysis Aug. 16, 2011
7975164 DDR memory controller Jul. 5, 2011
7973584 Waveform generator Jul. 5, 2011
7957924 System and method for distortion analysis Jun. 7, 2011
7945718 Microcontroller waveform generation May. 17, 2011
7928737 Electrical overstress and transient latch-up pulse generation system, circuit, and method Apr. 19, 2011
7925465 Low power scan testing techniques and apparatus Apr. 12, 2011
7925912 Method and apparatus for fine edge control on integrated circuit outputs Apr. 12, 2011
7917795 Digital circuit to measure and/or correct duty cycles Mar. 29, 2011
7912184 Voicemail test system Mar. 22, 2011
7912669 Prognosis of faults in electronic circuits Mar. 22, 2011

1 2 3 4 5

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