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Browse by Category: Main > Information Technology
Class Information
Number: 702/118
Name: Data processing: measuring, calibrating, or testing > Testing system > Of circuit > Testing multiple circuits
Description: Subject matter wherein a plurality of circuits are tested simultaneously or selectively.










Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12

Patent Number Title Of Patent Date Issued
8713489 Simulation parameter correction technique Apr. 29, 2014
8707113 Method for modeling a device and generating test for that device Apr. 22, 2014
8707232 Fault diagnosis based on design partitioning Apr. 22, 2014
8645149 Testing method and system Feb. 4, 2014
8639978 Topology independent network-based automation infrastructure Jan. 28, 2014
8606536 Methods and apparatus for hybrid outlier detection Dec. 10, 2013
8594966 Data processing interface device Nov. 26, 2013
8589110 System and method for programmable automatic testing of power supplied Nov. 19, 2013
8589886 System and method for automatic hardware and software sequencing of computer-aided design (CAD) functionality testing Nov. 19, 2013
8589109 Semiconductor circuit, semiconductor circuit test method, and semiconductor circuit test system Nov. 19, 2013
8572143 Waveform generator with a register that shifts and provides groups of successive data values from an input data stream Oct. 29, 2013
8560263 Power distribution network estimation device Oct. 15, 2013
8560264 Direct current circuit testing device and method for using same Oct. 15, 2013
8527232 Diagnostic test pattern generation for small delay defect Sep. 3, 2013
8522099 Embedded processor Aug. 27, 2013
8521463 System for performing electrical characterization of asynchronous integrated circuit interfaces Aug. 27, 2013
8515705 Method and system for testing circuit board of keys Aug. 20, 2013
8510635 Method for evaluating failure rate Aug. 13, 2013
8502612 Method and apparatus for determining within-die and across-die variation of analog circuits Aug. 6, 2013
8478549 Weld check stations Jul. 2, 2013
8478553 System for calculating resistive values for microelectronics CAD Jul. 2, 2013
8457920 Performance improvement for a multi-chip system via kerf area interconnect Jun. 4, 2013
8453088 Suspect logical region synthesis and simulation using device design and test information May. 28, 2013
8443238 System and method for testing hard disk ports May. 14, 2013
8438442 Method and apparatus for testing a data processing system May. 7, 2013
8433534 Electronic device and method for testing multiple features of the electronic device Apr. 30, 2013
8423851 Measured device and test system utilizing the same Apr. 16, 2013
8417774 Apparatus, system, and method for a reconfigurable baseboard management controller Apr. 9, 2013
8417478 Network test conflict checking Apr. 9, 2013
8417477 Methods and apparatus for local outlier detection Apr. 9, 2013
8401812 Tester, method for testing a device under test and computer program Mar. 19, 2013
8396682 Semiconductor device Mar. 12, 2013
8397113 Method and system for identifying power defects using test pattern switching activity Mar. 12, 2013
8397191 Determining failure rate from circuit design layouts Mar. 12, 2013
8392767 Data channel test apparatus and method thereof Mar. 5, 2013
8390150 Field device interface with network protection mechanism Mar. 5, 2013
8384406 Semiconductor test apparatus and test method Feb. 26, 2013
8386859 On-chip non-volatile storage of a test-time profile for efficiency and performance control Feb. 26, 2013
8386862 Fault diagnosis apparatus and fault diagnosis method of multi-channel analog input/output circuit Feb. 26, 2013
8378698 Integrated circuit testing apparatus and method Feb. 19, 2013
8380477 System of testing engineered safety feature instruments Feb. 19, 2013
8370101 Circuit card assembly testing system for a missile and launcher test set Feb. 5, 2013
8359207 Method and apparatus for generating toxicology reports Jan. 22, 2013
8341471 Apparatus and method for synchronization within systems having modules processing a clock signal at different rates Dec. 25, 2012
8340935 9-term calibration method for network analyzers Dec. 25, 2012
8326564 Detected data processing apparatus and computer readable medium for detecting data Dec. 4, 2012
8326565 Chip tester, method for providing timing information, test fixture set, apparatus for post-processing propagation delay information, method for post-processing delay information, chip test set Dec. 4, 2012
8326959 Virtual production testing of large integrated products Dec. 4, 2012
8310246 Continuity testing apparatus and continuity testing method including open/short detection circuit Nov. 13, 2012
8301405 System and method for measuring pin voltages of electronic components Oct. 30, 2012

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