| |
 |
|
Class Information
Number: 702/118
Name: Data processing: measuring, calibrating, or testing > Testing system > Of circuit > Testing multiple circuits
Description: Subject matter wherein a plurality of circuits are tested simultaneously or selectively.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7433792 |
Disc drive testing system and method |
Oct. 7, 2008 |
| 7433793 |
Error detection apparatus and method and signal extractor |
Oct. 7, 2008 |
| 7421364 |
Integrated circuit device having a test circuit to measure AC characteristics of internal memory macro |
Sep. 2, 2008 |
| 7421384 |
Semiconductor integrated circuit device and microcomputer development supporting device |
Sep. 2, 2008 |
| 7421632 |
Mapping logic for controlling loading of the select ram of an error data crossbar multiplexer |
Sep. 2, 2008 |
| 7415378 |
Methods for analyzing critical defects in analog integrated circuits |
Aug. 19, 2008 |
| 7415377 |
Relay testing system and method |
Aug. 19, 2008 |
| 7412344 |
System for synchronously controlling the testing of pluralities of devices and the method of the same |
Aug. 12, 2008 |
| 7412634 |
On-chip sampling circuit and method |
Aug. 12, 2008 |
| 7404122 |
Mapping logic for loading control of crossbar multiplexer select RAM |
Jul. 22, 2008 |
| 7404071 |
Memory modules having accurate operating current values stored thereon and methods for fabricating and implementing such devices |
Jul. 22, 2008 |
| 7404124 |
On-chip sampling circuit and method |
Jul. 22, 2008 |
| 7400995 |
Device and method for testing integrated circuits |
Jul. 15, 2008 |
| 7395170 |
Methods and apparatus for data analysis |
Jul. 1, 2008 |
| 7395475 |
Circuit and method for fuse disposing in a semiconductor memory device |
Jul. 1, 2008 |
| 7392442 |
Built-in self-test (BIST) architecture having distributed interpretation and generalized command protocol |
Jun. 24, 2008 |
| 7392438 |
Automatic safety test system |
Jun. 24, 2008 |
| 7389195 |
Uniform power density across processor cores at burn-in |
Jun. 17, 2008 |
| 7386411 |
Automatic hi-pot test apparatus and method |
Jun. 10, 2008 |
| 7386413 |
Switched length matched transmission path instrument |
Jun. 10, 2008 |
| 7386412 |
Integrated transducer data system |
Jun. 10, 2008 |
| 7383147 |
Dynamically adaptable semiconductor parametric testing |
Jun. 3, 2008 |
| 7369958 |
System and method for setting motherboard testing procedures |
May. 6, 2008 |
| 7370257 |
Test vehicle data analysis |
May. 6, 2008 |
| 7366650 |
Software and hardware simulation |
Apr. 29, 2008 |
| 7363188 |
Apparatus and method for operating automated test equipment (ATE) |
Apr. 22, 2008 |
| 7359822 |
Testing device |
Apr. 15, 2008 |
| 7359820 |
In-cycle system test adaptation |
Apr. 15, 2008 |
| 7356432 |
System test management system with automatic test selection |
Apr. 8, 2008 |
| 7356434 |
Method of specifying pin states for a memory chip |
Apr. 8, 2008 |
| 7356435 |
Semiconductor test apparatus and control method therefor |
Apr. 8, 2008 |
| 7353131 |
Method and system for logic verification using mirror interface |
Apr. 1, 2008 |
| 7350108 |
Test system for integrated circuits |
Mar. 25, 2008 |
| 7348791 |
High voltage, high frequency, high reliability, high density, high temperature automated test equipment (ATE) switch design |
Mar. 25, 2008 |
| 7346825 |
Error method, system and medium |
Mar. 18, 2008 |
| 7343622 |
Multi-level secure multi-processor computer architecture |
Mar. 11, 2008 |
| 7340359 |
Augmenting semiconductor's devices quality and reliability |
Mar. 4, 2008 |
| 7340360 |
Method for determining projected lifetime of semiconductor devices with analytical extension of stress voltage window by scaling of oxide thickness |
Mar. 4, 2008 |
| 7340364 |
Test apparatus, and control method |
Mar. 4, 2008 |
| 7337087 |
Circuit analyzing apparatus, circuit analyzing method and circuit analyzing program |
Feb. 26, 2008 |
| 7324982 |
Method and apparatus for automated debug and optimization of in-circuit tests |
Jan. 29, 2008 |
| 7308376 |
Computer platform automatic testing method and system |
Dec. 11, 2007 |
| 7299437 |
Method and apparatus for detecting timing exception path and computer product |
Nov. 20, 2007 |
| 7295945 |
Method and system for testing assembled mobile devices |
Nov. 13, 2007 |
| 7292955 |
Method and apparatus for examining semiconductor apparatus and method for designing semiconductor apparatus |
Nov. 6, 2007 |
| 7292956 |
Federated sensing, analysis, summarization, and sharing of data for healthcare |
Nov. 6, 2007 |
| 7290189 |
Compilation of calibration information for plural testflows |
Oct. 30, 2007 |
| 7287903 |
Method and apparatus for rapid thermal testing |
Oct. 30, 2007 |
| 7286948 |
Method for determining plasma characteristics |
Oct. 23, 2007 |
| 7283919 |
Determining the quality and reliability of a component by monitoring dynamic variables |
Oct. 16, 2007 |
|
|
|
