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Browse by Category: Main > Information Technology
Class Information
Number: 702/118
Name: Data processing: measuring, calibrating, or testing > Testing system > Of circuit > Testing multiple circuits
Description: Subject matter wherein a plurality of circuits are tested simultaneously or selectively.


Patents under this class:
1 2 3 4 5 6 7

Patent Number Title Of Patent Date Issued
7433792 Disc drive testing system and method Oct. 7, 2008
7433793 Error detection apparatus and method and signal extractor Oct. 7, 2008
7421364 Integrated circuit device having a test circuit to measure AC characteristics of internal memory macro Sep. 2, 2008
7421384 Semiconductor integrated circuit device and microcomputer development supporting device Sep. 2, 2008
7421632 Mapping logic for controlling loading of the select ram of an error data crossbar multiplexer Sep. 2, 2008
7415378 Methods for analyzing critical defects in analog integrated circuits Aug. 19, 2008
7415377 Relay testing system and method Aug. 19, 2008
7412344 System for synchronously controlling the testing of pluralities of devices and the method of the same Aug. 12, 2008
7412634 On-chip sampling circuit and method Aug. 12, 2008
7404122 Mapping logic for loading control of crossbar multiplexer select RAM Jul. 22, 2008
7404071 Memory modules having accurate operating current values stored thereon and methods for fabricating and implementing such devices Jul. 22, 2008
7404124 On-chip sampling circuit and method Jul. 22, 2008
7400995 Device and method for testing integrated circuits Jul. 15, 2008
7395170 Methods and apparatus for data analysis Jul. 1, 2008
7395475 Circuit and method for fuse disposing in a semiconductor memory device Jul. 1, 2008
7392442 Built-in self-test (BIST) architecture having distributed interpretation and generalized command protocol Jun. 24, 2008
7392438 Automatic safety test system Jun. 24, 2008
7389195 Uniform power density across processor cores at burn-in Jun. 17, 2008
7386411 Automatic hi-pot test apparatus and method Jun. 10, 2008
7386413 Switched length matched transmission path instrument Jun. 10, 2008
7386412 Integrated transducer data system Jun. 10, 2008
7383147 Dynamically adaptable semiconductor parametric testing Jun. 3, 2008
7369958 System and method for setting motherboard testing procedures May. 6, 2008
7370257 Test vehicle data analysis May. 6, 2008
7366650 Software and hardware simulation Apr. 29, 2008
7363188 Apparatus and method for operating automated test equipment (ATE) Apr. 22, 2008
7359822 Testing device Apr. 15, 2008
7359820 In-cycle system test adaptation Apr. 15, 2008
7356432 System test management system with automatic test selection Apr. 8, 2008
7356434 Method of specifying pin states for a memory chip Apr. 8, 2008
7356435 Semiconductor test apparatus and control method therefor Apr. 8, 2008
7353131 Method and system for logic verification using mirror interface Apr. 1, 2008
7350108 Test system for integrated circuits Mar. 25, 2008
7348791 High voltage, high frequency, high reliability, high density, high temperature automated test equipment (ATE) switch design Mar. 25, 2008
7346825 Error method, system and medium Mar. 18, 2008
7343622 Multi-level secure multi-processor computer architecture Mar. 11, 2008
7340359 Augmenting semiconductor's devices quality and reliability Mar. 4, 2008
7340360 Method for determining projected lifetime of semiconductor devices with analytical extension of stress voltage window by scaling of oxide thickness Mar. 4, 2008
7340364 Test apparatus, and control method Mar. 4, 2008
7337087 Circuit analyzing apparatus, circuit analyzing method and circuit analyzing program Feb. 26, 2008
7324982 Method and apparatus for automated debug and optimization of in-circuit tests Jan. 29, 2008
7308376 Computer platform automatic testing method and system Dec. 11, 2007
7299437 Method and apparatus for detecting timing exception path and computer product Nov. 20, 2007
7295945 Method and system for testing assembled mobile devices Nov. 13, 2007
7292955 Method and apparatus for examining semiconductor apparatus and method for designing semiconductor apparatus Nov. 6, 2007
7292956 Federated sensing, analysis, summarization, and sharing of data for healthcare Nov. 6, 2007
7290189 Compilation of calibration information for plural testflows Oct. 30, 2007
7287903 Method and apparatus for rapid thermal testing Oct. 30, 2007
7286948 Method for determining plasma characteristics Oct. 23, 2007
7283919 Determining the quality and reliability of a component by monitoring dynamic variables Oct. 16, 2007

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