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Class Information
Number: 702/118
Name: Data processing: measuring, calibrating, or testing > Testing system > Of circuit > Testing multiple circuits
Description: Subject matter wherein a plurality of circuits are tested simultaneously or selectively.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7627843 |
Dynamically interleaving randomly generated test-cases for functional verification |
Dec. 1, 2009 |
| 7620511 |
Method for determining plasma characteristics |
Nov. 17, 2009 |
| 7620515 |
Integrated circuit with bit error test capability |
Nov. 17, 2009 |
| 7613963 |
Wireless method and apparatus for testing armament circuits |
Nov. 3, 2009 |
| 7607056 |
Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices |
Oct. 20, 2009 |
| 7598759 |
Routing engine, method of routing a test probe and testing system employing the same |
Oct. 6, 2009 |
| 7587642 |
System and method for performing concurrent mixed signal testing on a single processor |
Sep. 8, 2009 |
| 7577540 |
Re-configurable embedded core test protocol for system-on-chips (SOC) and circuit boards |
Aug. 18, 2009 |
| 7571070 |
Measurement system fleet optimization |
Aug. 4, 2009 |
| 7567883 |
Method and apparatus for synchronizing signals in a testing system |
Jul. 28, 2009 |
| 7560945 |
Integrated circuit failure prediction |
Jul. 14, 2009 |
| 7558720 |
Dynamic computation of ESD guidelines |
Jul. 7, 2009 |
| 7555394 |
Measuring circuit and a method for determining a characteristic of the impedance of a complex impedance element for facilitating characterization of the impedance thereof |
Jun. 30, 2009 |
| 7555358 |
Process and method for continuous, non lot-based integrated circuit manufacturing |
Jun. 30, 2009 |
| 7552019 |
Systems and methods of converting RFID labels |
Jun. 23, 2009 |
| 7548828 |
Automatic test equipment platform architecture using parallel user computers |
Jun. 16, 2009 |
| 7532576 |
Site-to-site dynamic virtual local area network |
May. 12, 2009 |
| 7532994 |
Test apparatus, test method, electronic device manufacturing method, test simulator and test simulation method |
May. 12, 2009 |
| 7521950 |
Wafer level I/O test and repair enabled by I/O layer |
Apr. 21, 2009 |
| 7516042 |
Load test load modeling based on rates of user operations |
Apr. 7, 2009 |
| 7514821 |
Power supply switching controller and method |
Apr. 7, 2009 |
| 7512508 |
Determining and analyzing integrated circuit yield and quality |
Mar. 31, 2009 |
| 7512509 |
M1 testable addressable array for device parameter characterization |
Mar. 31, 2009 |
| 7512854 |
Method and apparatus for testing, characterizing and monitoring a chip interface using a second data path |
Mar. 31, 2009 |
| 7509237 |
Test system and test method using virtual review |
Mar. 24, 2009 |
| 7509547 |
System and method for testing of interconnects in a programmable logic device |
Mar. 24, 2009 |
| 7502706 |
Module-testing device |
Mar. 10, 2009 |
| 7499822 |
Analog set top calibration patterns in manufacturing |
Mar. 3, 2009 |
| 7499831 |
Timing closure monitoring circuit and method |
Mar. 3, 2009 |
| 7490025 |
Integrated circuit with self-proofreading function, measuring device using the same and method for self-recording parameter |
Feb. 10, 2009 |
| 7484156 |
Apparatus and method for testing PS/2 interface |
Jan. 27, 2009 |
| 7480792 |
Memory modules having accurate operating parameters stored thereon and methods for fabricating and implementing such devices |
Jan. 20, 2009 |
| 7480583 |
Methods and apparatus for testing a circuit |
Jan. 20, 2009 |
| 7480582 |
Flash memory card test device with multiple interfaces |
Jan. 20, 2009 |
| 7478280 |
Test system for integrated circuits |
Jan. 13, 2009 |
| 7474986 |
Defect analyzer |
Jan. 6, 2009 |
| 7472033 |
Apparatus for controlling semiconductor chip characteristics |
Dec. 30, 2008 |
| 7472034 |
System and method for test generation for system level verification using parallel algorithms |
Dec. 30, 2008 |
| 7465170 |
Extended input/output card capacity computer system |
Dec. 16, 2008 |
| 7463992 |
Method and system to self-test single and multi-core CPU systems |
Dec. 9, 2008 |
| 7454305 |
Method and apparatus for storing circuit calibration information |
Nov. 18, 2008 |
| 7451349 |
System and method for automatically testing motherboards |
Nov. 11, 2008 |
| 7447606 |
Method of separating the process variation in threshold voltage and effective channel length by electrical measurements |
Nov. 4, 2008 |
| 7447610 |
Method and system for reliability similarity of semiconductor devices |
Nov. 4, 2008 |
| 7444275 |
Multi-variable polynomial modeling techniques for use in integrated circuit design |
Oct. 28, 2008 |
| 7440859 |
Method for determining plasma characteristics |
Oct. 21, 2008 |
| 7440864 |
Controller system for pool and/or spa |
Oct. 21, 2008 |
| 7437261 |
Method and apparatus for testing integrated circuits |
Oct. 14, 2008 |
| 7433793 |
Error detection apparatus and method and signal extractor |
Oct. 7, 2008 |
| 7433792 |
Disc drive testing system and method |
Oct. 7, 2008 |
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