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Class Information
Number: 702/117
Name: Data processing: measuring, calibrating, or testing > Testing system > Of circuit
Description: Subject matter wherein the test means is applied to the interconnection of electronic components in a closed path.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7617064 |
Self-test circuit for high-definition multimedia interface integrated circuits |
Nov. 10, 2009 |
| 7617065 |
Methodology for estimating statistical distribution characteristics of physical parameters of semiconductor device |
Nov. 10, 2009 |
| 7617066 |
Virtual crimp validation system |
Nov. 10, 2009 |
| 7617431 |
Method and apparatus for analyzing delay defect |
Nov. 10, 2009 |
| 7613968 |
Device and method for JTAG test |
Nov. 3, 2009 |
| 7606677 |
Dynamic measurement control |
Oct. 20, 2009 |
| 7592828 |
Method and device of measuring interface trap density in semiconductor device |
Sep. 22, 2009 |
| 7593824 |
System and method for automation of hardware signal characterization and signal integrity verification |
Sep. 22, 2009 |
| 7590503 |
Method and system for rerouteable cyclic redundancy check sum (CRC) for different sources |
Sep. 15, 2009 |
| 7590912 |
Using a chip as a simulation engine |
Sep. 15, 2009 |
| 7587294 |
SATA device having self-test function for OOB-signaling |
Sep. 8, 2009 |
| 7580465 |
Low speed access to DRAM |
Aug. 25, 2009 |
| 7580806 |
Apparatus and method for compensating clock period elongation during scan testing in an integrated circuit (IC) |
Aug. 25, 2009 |
| 7580807 |
Test protocol manager for massive multi-site test |
Aug. 25, 2009 |
| 7577540 |
Re-configurable embedded core test protocol for system-on-chips (SOC) and circuit boards |
Aug. 18, 2009 |
| 7577859 |
System and method of controlling power consumption in an electronic system by applying a uniquely determined minimum operating voltage to an integrated circuit rather than a predetermined nomi |
Aug. 18, 2009 |
| 7574317 |
Method for calibrating a filter, a calibrator and system including the same |
Aug. 11, 2009 |
| 7574314 |
Spurious signal detection |
Aug. 11, 2009 |
| 7573937 |
Phase rotator control test scheme |
Aug. 11, 2009 |
| 7574319 |
Instrument architecture with circular processing queue |
Aug. 11, 2009 |
| 7571070 |
Measurement system fleet optimization |
Aug. 4, 2009 |
| 7571067 |
Instrument ring architecture for use with a multi-core processor |
Aug. 4, 2009 |
| 7567882 |
Method for evaluating semiconductor device |
Jul. 28, 2009 |
| 7567883 |
Method and apparatus for synchronizing signals in a testing system |
Jul. 28, 2009 |
| 7567891 |
Hot-carrier device degradation modeling and extraction methodologies |
Jul. 28, 2009 |
| 7565256 |
Displacement detecting encoder |
Jul. 21, 2009 |
| 7561980 |
Transmission medium testing apparatus and method |
Jul. 14, 2009 |
| 7558720 |
Dynamic computation of ESD guidelines |
Jul. 7, 2009 |
| 7555358 |
Process and method for continuous, non lot-based integrated circuit manufacturing |
Jun. 30, 2009 |
| 7552024 |
Circuit board diagnostic operating center |
Jun. 23, 2009 |
| 7552028 |
Recording medium, test apparatus and diagnostic method |
Jun. 23, 2009 |
| 7549101 |
Clock transferring apparatus, and testing apparatus |
Jun. 16, 2009 |
| 7548841 |
Method for logic checking to check operation of circuit to be connected to bus |
Jun. 16, 2009 |
| 7548825 |
Method and apparatus for current and temperature measurement in an electronic power circuit |
Jun. 16, 2009 |
| 7542857 |
Technique for determining performance characteristics of electronic devices and systems |
Jun. 2, 2009 |
| 7539598 |
Semiconductor test apparatus and method thereof and multiplexer and method thereof |
May. 26, 2009 |
| 7539590 |
System and method for testing a memory |
May. 26, 2009 |
| 7539588 |
Data carrier with detection means for detecting a change made of information stored with storing means |
May. 26, 2009 |
| 7539589 |
Testing radio frequency and analogue circuits |
May. 26, 2009 |
| 7536267 |
Built-in self test for memory interconnect testing |
May. 19, 2009 |
| 7533299 |
Temporal correlation of messages transmitted by a microprocessor monitoring circuit |
May. 12, 2009 |
| 7532994 |
Test apparatus, test method, electronic device manufacturing method, test simulator and test simulation method |
May. 12, 2009 |
| 7523010 |
Automated circuit board test actuator system |
Apr. 21, 2009 |
| 7519486 |
Method and apparatus to test the power-on-reset trip point of an integrated circuit |
Apr. 14, 2009 |
| 7519494 |
Integrated circuit with signature computation |
Apr. 14, 2009 |
| 7519496 |
Electronic circuit comprising a secret sub-module |
Apr. 14, 2009 |
| 7519878 |
Obtaining test data for a device |
Apr. 14, 2009 |
| 7516037 |
Method evaluating threshold level of a data cell in a memory device |
Apr. 7, 2009 |
| 7516042 |
Load test load modeling based on rates of user operations |
Apr. 7, 2009 |
| 7512507 |
Die based trimming |
Mar. 31, 2009 |
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