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Class Information
Number: 702/117
Name: Data processing: measuring, calibrating, or testing > Testing system > Of circuit
Description: Subject matter wherein the test means is applied to the interconnection of electronic components in a closed path.

Sub-classes under this class:

Class Number Class Name Patents
702/120 Including input/output or test mode selection means 432
702/119 Including program initialization (e.g., program loading) or code selection (e.g., program creation) 422
702/118 Testing multiple circuits 551

Patents under this class:

Patent Number Title Of Patent Date Issued
8713490 Managing aging of silicon in an integrated circuit device Apr. 29, 2014
8712727 Field device for determining or monitoring a physical or chemical process variable Apr. 29, 2014
8712718 Predicting performance of an integrated circuit Apr. 29, 2014
8707221 Circuit assembly yield prediction with respect to manufacturing process Apr. 22, 2014
8707113 Method for modeling a device and generating test for that device Apr. 22, 2014
8692546 Circuits and methods for generating a diagnostic mode of operation in a magnetic field sensor Apr. 8, 2014
8680846 Circuits and methods for self-calibrating or self-testing a magnetic field sensor Mar. 25, 2014
8676536 Method and apparatus for selecting voltage and frequency levels for use in at-speed testing Mar. 18, 2014
8671293 Multi-core system energy consumption optimization Mar. 11, 2014
8667345 Burn-in method for embedded multi media card, and test board using the same, and embedded multi media card tested by the same Mar. 4, 2014
8666529 Controlling non-process of record (POR) process limiting yield (PLY) inspection work Mar. 4, 2014
8661285 Dynamically calibrated DDR memory controller Feb. 25, 2014
8650447 Apparatus and methods for controlled error injection Feb. 11, 2014
8639978 Topology independent network-based automation infrastructure Jan. 28, 2014
8630821 High speed data testing without high speed bit clock Jan. 14, 2014
8626460 Secure test-for-yield chip diagnostics management system and method Jan. 7, 2014
8620612 Equivalent circuit of inductance element, method of analyzing circuit constant, circuit constant analysis program, device for analyzing circuit constant, circuit simulator Dec. 31, 2013
8615724 Circuit assembly yield prediction with respect to form factor Dec. 24, 2013
8615373 Voltage driver for a voltage-driven intelligent characterization bench for semiconductor Dec. 24, 2013
8610454 System and methods for generating unclonable security keys in integrated circuits Dec. 17, 2013
8593170 Method and device for testing TSVS in a 3D chip stack Nov. 26, 2013
8589110 System and method for programmable automatic testing of power supplied Nov. 19, 2013
8589109 Semiconductor circuit, semiconductor circuit test method, and semiconductor circuit test system Nov. 19, 2013
8589108 Semiconductor device failure analysis method and apparatus and program Nov. 19, 2013
8571825 Design-dependent integrated circuit disposition Oct. 29, 2013
8566059 Insertion of faults in logic model used in simulation Oct. 22, 2013
8564851 Scanner belt load and stretch compensation control system Oct. 22, 2013
8564311 Sensing phase sequence to suppress single tone noise Oct. 22, 2013
8560991 Automatic debugging using automatic input data mutation Oct. 15, 2013
8560262 Methods for manufacturing devices with flex circuits and radio-frequency cables Oct. 15, 2013
8560258 Measurement and apparatus for electrical measurement of electrical drive parameters for a MEMS based display Oct. 15, 2013
8560256 Electrical power system sensor devices, electrical power system monitoring methods, and electrical power system monitoring systems Oct. 15, 2013
8554506 Distributed computing Oct. 8, 2013
8547125 Test apparatus and test module Oct. 1, 2013
8542010 Circuits and methods for generating a diagnostic mode of operation in a magnetic field sensor Sep. 24, 2013
8539426 Method and system for extracting compact models for circuit simulation Sep. 17, 2013
8538718 Clock edge grouping for at-speed test Sep. 17, 2013
8538715 Design-dependent integrated circuit disposition Sep. 17, 2013
8536887 Probe circuit, multi-probe circuit, test apparatus, and electric device Sep. 17, 2013
8536839 Device and method for monitoring and/or analyzing rotors of electric machines in operation Sep. 17, 2013
8531197 Integrated circuit die, an integrated circuit package and a method for connecting an integrated circuit die to an external device Sep. 10, 2013
8527232 Diagnostic test pattern generation for small delay defect Sep. 3, 2013
8527231 High throughput semiconductor device testing Sep. 3, 2013
8522099 Embedded processor Aug. 27, 2013
8519866 Wireless telemetry for instrumented component Aug. 27, 2013
8516180 Processing system and electronic device with same Aug. 20, 2013
8510635 Method for evaluating failure rate Aug. 13, 2013
8510074 Moving light table Aug. 13, 2013
8510073 Real-time adaptive hybrid BiST solution for low-cost and low-resource ate production testing of analog-to-digital converters Aug. 13, 2013
8510072 Detecting an unstable input to an IC Aug. 13, 2013

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