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Class Information
Number: 702/110
Name: Data processing: measuring, calibrating, or testing > Testing system > For transfer function determination > Binary signal stimulus (e.g., pulse)
Description: Subject matter wherein the stimulus is a two-level test signal.

Patents under this class:

Patent Number Title Of Patent Date Issued
8131492 Method of evaluating a film Mar. 6, 2012
8036846 Variable impedance sense architecture and method Oct. 11, 2011
8014969 Test apparatus, test method and manufacturing method Sep. 6, 2011
7987063 Fast, low power formatter for automatic test system Jul. 26, 2011
7926012 Design-For-testability planner Apr. 12, 2011
7890286 Test circuit for performing multiple test modes Feb. 15, 2011
7840368 Test circuit for performing multiple test modes Nov. 23, 2010
7734848 System and method for frequency offset testing Jun. 8, 2010
7668667 Miniature stimulating and sensing system Feb. 23, 2010
7640127 Detection apparatus, detection method, and program Dec. 29, 2009
7616767 Method and device for determining acoustical transfer impedance Nov. 10, 2009
7548820 Detecting a failure condition in a system using three-dimensional telemetric impulsional response surfaces Jun. 16, 2009
7539599 Abnormality diagnosing method, condition appraisal apparatus, image forming apparatus, management apparatus and management system May. 26, 2009
7254508 Site loops Aug. 7, 2007
7194317 Fast plant test for model-based control Mar. 20, 2007
7092837 Single platform electronic tester Aug. 15, 2006
7072777 Exposure apparatus anti-vibration apparatus, system identification apparatus and system identification method Jul. 4, 2006
6996489 Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor Feb. 7, 2006
6993452 Distance measure for probability distribution function of mixture type Jan. 31, 2006
6862546 Integrated adjustable short-haul/long-haul time domain reflectometry Mar. 1, 2005
6785629 Accuracy determination in bit line voltage measurements Aug. 31, 2004
6735538 Apparatus and method for measuring quality measure of phase noise waveform May. 11, 2004
6601007 Method and system to increase the performance of high-speed backplanes Jul. 29, 2003
6549862 Vector network analyzer architecture based on sliding correlator techniques Apr. 15, 2003
6526365 Low-power/wideband transfer function measurement method and apparatus Feb. 25, 2003
6324485 Application specific automated test equipment system for testing integrated circuit devices in a native environment Nov. 27, 2001
6272441 Method for determining the pulse response of a broad band linear system and a measuring circuit for carrying out the method Aug. 7, 2001
6064212 Method for determining the transmission characteristics of an electric line May. 16, 2000
5918198 Generating pulses in analog channel of ATE tester Jun. 29, 1999
5251155 System identification apparatus using spectrum analysis of resonation frequencies Oct. 5, 1993
4970638 Control of unknown systems via deconvolution Nov. 13, 1990
4949236 Smart controller Aug. 14, 1990
4872028 Thermal-ink-jet print system with drop detector for drive pulse optimization Oct. 3, 1989
4813001 AC calibration method and device by determining transfer characteristics Mar. 14, 1989
4667296 Testing the transfer function linearity of analogue input circuits May. 19, 1987
4275348 Method of and system for measuring the transmission characteristics of four-terminal networks Jun. 23, 1981
4067060 Transfer function measurement Jan. 3, 1978

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