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Browse by Category: Main > Information Technology
Class Information
Number: 700/110
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring > Quality control > Defect analysis or recognition
Description: Subject matter wherein the data processing system or calculating computer detects or rectifies discrepancies in the manufacturing process or manufactured product.










Patents under this class:
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Patent Number Title Of Patent Date Issued
8712569 System for determining potential lot consolidation during manufacturing Apr. 29, 2014
8712570 Systems and methods for detecting and rejecting defective absorbent articles from a converting line Apr. 29, 2014
8712720 Filtering method for improving the data quality of geometric tire measurements Apr. 29, 2014
8706284 Method and system for diagnosing operating states of a production facility Apr. 22, 2014
8707221 Circuit assembly yield prediction with respect to manufacturing process Apr. 22, 2014
8694927 Method of designing pattern layouts Apr. 8, 2014
8686374 Drawing apparatus, and method of manufacturing article Apr. 1, 2014
8688256 Advanced process control system and method utilizing virtual metrology with reliance index Apr. 1, 2014
8689157 Extracting capacitance and resistance from FinFET devices Apr. 1, 2014
8682466 Automatic virtual metrology for semiconductor wafer result prediction Mar. 25, 2014
8676368 System and method for optimizing a production process using electromagnetic-based local positioning capabilities Mar. 18, 2014
8676369 Method for monitoring a production process Mar. 18, 2014
8676538 Adjusting weighting of a parameter relating to fault detection based on a detected fault Mar. 18, 2014
8670857 Flexible process condition monitoring Mar. 11, 2014
8666532 Method and system for controlling a manufacturing process Mar. 4, 2014
8660681 Method and system for excursion monitoring in optical lithography processes in micro device fabrication Feb. 25, 2014
8660680 Methods of monitoring acceptance criteria of pharmaceutical manufacturing processes Feb. 25, 2014
8655469 Advanced process control optimization Feb. 18, 2014
8656320 Method for creating a photolithography mask Feb. 18, 2014
8647554 Residual layer thickness measurement and correction Feb. 11, 2014
8649892 Production management system Feb. 11, 2014
8649990 Method for detecting variance in semiconductor processes Feb. 11, 2014
8639375 Enhancing investigation of variability by inclusion of similar objects with known differences to the original ones Jan. 28, 2014
8639367 Substrate processing system Jan. 28, 2014
8627243 Methods for optimizing conductor patterns for ECP and CMP in semiconductor processing Jan. 7, 2014
8620468 Method and apparatus for developing, improving and verifying virtual metrology models in a manufacturing system Dec. 31, 2013
8615724 Circuit assembly yield prediction with respect to form factor Dec. 24, 2013
8600556 Smart building manager Dec. 3, 2013
8595657 Methods of forming a photo mask Nov. 26, 2013
8594963 In-line inspection yield prediction system Nov. 26, 2013
8594827 Method of controlling semiconductor device fabrication Nov. 26, 2013
8594823 Scanner performance comparison and matching using design and defect data Nov. 26, 2013
8594821 Detecting combined tool incompatibilities and defects in semiconductor manufacturing Nov. 26, 2013
8591811 Monitoring acceptance criteria of pharmaceutical manufacturing processes Nov. 26, 2013
8589830 Method and apparatus for enhanced optical proximity correction Nov. 19, 2013
8583271 Controlling cutting of continuously fabricated composite parts with nondestructive evaluation Nov. 12, 2013
8583433 System and method for efficiently transcribing verbal messages to text Nov. 12, 2013
8577489 Diagnosing in-line critical dimension control adjustments using optical proximity correction verification Nov. 5, 2013
8571696 Methods and apparatus to predict process quality in a process control system Oct. 29, 2013
8571823 Method for controlling the quality of industrial processes, in particular laser-welding processes Oct. 29, 2013
8560103 Method and computing system for designing a sheet-metal-forming process Oct. 15, 2013
8560978 Pattern-dependent proximity matching/tuning including light manipulation by projection optics Oct. 15, 2013
8548619 System and method for after-market support using as-built data Oct. 1, 2013
8538572 Methods for constructing an optimal endpoint algorithm Sep. 17, 2013
8533124 Digital material management method, digital material management system, and workflow management system Sep. 10, 2013
RE44450 Multi-tiered structure for storing and displaying product and process variants Aug. 20, 2013
8515570 System for sensing cigarette filters and method therefor Aug. 20, 2013
8515569 Work support system, work support method, and storage medium Aug. 20, 2013
8515568 Apparatus and methods for monitoring health of semiconductor process systems Aug. 20, 2013
8513603 In-situ determination of thin film and multilayer structure and chemical composition using x-ray fluorescence induced by grazing incidence electron beams during thin film growth Aug. 20, 2013

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