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Class Information
Number: 700/110
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring > Quality control > Defect analysis or recognition
Description: Subject matter wherein the data processing system or calculating computer detects or rectifies discrepancies in the manufacturing process or manufactured product.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7620470 |
Method and apparatus for impasse detection and resolution |
Nov. 17, 2009 |
| 7620511 |
Method for determining plasma characteristics |
Nov. 17, 2009 |
| 7606629 |
Method and device for identifying the cause of failures in industrial processes |
Oct. 20, 2009 |
| 7603289 |
System and method for electronic delivery of content for industrial automation systems |
Oct. 13, 2009 |
| 7595467 |
Fault detection system and method for managing the same |
Sep. 29, 2009 |
| 7596419 |
Inspection system and method of making and using same |
Sep. 29, 2009 |
| 7587178 |
Signaling device |
Sep. 8, 2009 |
| 7583833 |
Method and apparatus for manufacturing data indexing |
Sep. 1, 2009 |
| 7584012 |
Automatic defect review and classification system |
Sep. 1, 2009 |
| 7584015 |
Method for designing mold, mold and molded product |
Sep. 1, 2009 |
| 7577550 |
System and method for detecting performance anomalies in a computing system |
Aug. 18, 2009 |
| 7577486 |
Quality improvement system |
Aug. 18, 2009 |
| 7576851 |
Creating a library for measuring a damaged structure formed on a wafer using optical metrology |
Aug. 18, 2009 |
| 7574279 |
Manufacturing system and controller, controlling method, controlling system, and control program for the manufacturing system |
Aug. 11, 2009 |
| 7561988 |
Customer support system |
Jul. 14, 2009 |
| 7546571 |
Distributed electronic design automation environment |
Jun. 9, 2009 |
| 7542821 |
Multi-unit process spatial synchronization of image inspection systems |
Jun. 2, 2009 |
| 7536764 |
Method and apparatus for monitoring blind fastener setting |
May. 26, 2009 |
| 7539597 |
Diagnostic systems and methods for predictive condition monitoring |
May. 26, 2009 |
| 7533359 |
Method and system for chip design using physically appropriate component models and extraction |
May. 12, 2009 |
| 7531368 |
In-line lithography and etch system |
May. 12, 2009 |
| 7526405 |
Statistical signatures used with multivariate statistical analysis for fault detection and isolation and abnormal condition prevention in a process |
Apr. 28, 2009 |
| 7526699 |
Method for creating a built-in self test (BIST) table for monitoring a monolayer deposition (MLD) system |
Apr. 28, 2009 |
| 7519885 |
Monitoring a monolayer deposition (MLD) system using a built-in self test (BIST) table |
Apr. 14, 2009 |
| 7519447 |
Method and apparatus for integrating multiple sample plans |
Apr. 14, 2009 |
| 7515984 |
Method and system for monitoring batch product manufacturing |
Apr. 7, 2009 |
| 7516047 |
Diagnostic method for manufacturing processes |
Apr. 7, 2009 |
| 7512456 |
Substrate processing apparatus |
Mar. 31, 2009 |
| 7509185 |
Methods, systems, and software program for validation and monitoring of pharmaceutical manufacturing processes |
Mar. 24, 2009 |
| 7503196 |
Rivet monitoring system |
Mar. 17, 2009 |
| 7502655 |
Methods for providing optimal light-CO2 combinations for plant production |
Mar. 10, 2009 |
| 7502660 |
Feature dimension deviation correction system, method and program product |
Mar. 10, 2009 |
| 7502702 |
Method and apparatus for dynamic adjustment of sensor and/or metrology sensitivities |
Mar. 10, 2009 |
| 7496422 |
Method for controlling a semiconductor processing apparatus |
Feb. 24, 2009 |
| 7484189 |
Method for searching for potential faults in a layout of an integrated circuit |
Jan. 27, 2009 |
| 7477960 |
Fault detection and classification (FDC) using a run-to-run controller |
Jan. 13, 2009 |
| 7477961 |
Equivalent gate count yield estimation for integrated circuit devices |
Jan. 13, 2009 |
| 7478347 |
Semiconductor manufacturing apparatus, management apparatus therefor, component management apparatus therefor, and semiconductor wafer storage vessel transport apparatus |
Jan. 13, 2009 |
| 7471991 |
Methods, systems, and software program for validation and monitoring of pharmaceutical manufacturing processes |
Dec. 30, 2008 |
| 7469164 |
Method and apparatus for process control with in-die metrology |
Dec. 23, 2008 |
| 7469363 |
Computer network with diagnosis computer nodes |
Dec. 23, 2008 |
| 7465417 |
Parametric injection molding system and method |
Dec. 16, 2008 |
| 7460968 |
Method and apparatus for selecting wafers for sampling |
Dec. 2, 2008 |
| 7451009 |
Method and apparatus for product defect classification |
Nov. 11, 2008 |
| 7447559 |
Apparatus and method of forming a photoresist pattern, and repair nozzle |
Nov. 4, 2008 |
| 7447610 |
Method and system for reliability similarity of semiconductor devices |
Nov. 4, 2008 |
| 7443658 |
Inspection apparatus for inspecting a display module |
Oct. 28, 2008 |
| 7444197 |
Methods, systems, and software program for validation and monitoring of pharmaceutical manufacturing processes |
Oct. 28, 2008 |
| 7440928 |
Diagnostic apparatus |
Oct. 21, 2008 |
| 7428442 |
Methods of performing path analysis on pharmaceutical manufacturing systems |
Sep. 23, 2008 |
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