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Class Information
Number: 700/110
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring > Quality control > Defect analysis or recognition
Description: Subject matter wherein the data processing system or calculating computer detects or rectifies discrepancies in the manufacturing process or manufactured product.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7428442 |
Methods of performing path analysis on pharmaceutical manufacturing systems |
Sep. 23, 2008 |
| 7426420 |
System for dispatching semiconductors lots |
Sep. 16, 2008 |
| 7423442 |
System and method for early qualification of semiconductor devices |
Sep. 9, 2008 |
| 7424336 |
Test data analyzing system and test data analyzing program |
Sep. 9, 2008 |
| 7421140 |
Method and system for enhancing the quality of device images |
Sep. 2, 2008 |
| 7418694 |
Method for generating test patterns utilized in manufacturing semiconductor device |
Aug. 26, 2008 |
| 7412090 |
Method of managing wafer defects |
Aug. 12, 2008 |
| 7409668 |
Method for improving via's impedance |
Aug. 5, 2008 |
| 7409306 |
System and method for estimating reliability of components for testing and quality optimization |
Aug. 5, 2008 |
| 7403832 |
Method and system for advanced process control including tool dependent machine constants |
Jul. 22, 2008 |
| 7401004 |
System for reviewing defects, a computer implemented method for reviewing defects, and a method for fabricating electronic devices |
Jul. 15, 2008 |
| 7392107 |
Methods of integrating computer products with pharmaceutical manufacturing hardware systems |
Jun. 24, 2008 |
| 7386369 |
Digital electrode observation |
Jun. 10, 2008 |
| 7383156 |
Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information |
Jun. 3, 2008 |
| 7379783 |
Manufacturing execution system for validation, quality and risk assessment and monitoring of pharmaceutical manufacturing processes |
May. 27, 2008 |
| 7379784 |
Manufacturing execution system for validation, quality and risk assessment and monitoring of pharmaceutical manufacturing processes |
May. 27, 2008 |
| 7376479 |
Process monitoring device for sample processing apparatus and control method of sample processing apparatus |
May. 20, 2008 |
| 7376260 |
Method for post-OPC multi layer overlay quality inspection |
May. 20, 2008 |
| 7373216 |
Method and apparatus for verifying a site-dependent wafer |
May. 13, 2008 |
| 7373214 |
3-d product printing system |
May. 13, 2008 |
| 7363098 |
Method to identify machines causing excursion in semiconductor manufacturing |
Apr. 22, 2008 |
| 7359759 |
Method and system for virtual metrology in semiconductor manufacturing |
Apr. 15, 2008 |
| 7353075 |
Manufacturing system and controller, controlling method, controlling system, and control program for the manufacturing system |
Apr. 1, 2008 |
| 7349753 |
Adjusting manufacturing process control parameter using updated process threshold derived from uncontrollable error |
Mar. 25, 2008 |
| 7346413 |
Productivity for tool having plurality of processing modules |
Mar. 18, 2008 |
| 7346411 |
Automatic control and monitoring system for splice overlapping tolerance in textile ply |
Mar. 18, 2008 |
| 7346409 |
Information processing apparatus, and information processing method |
Mar. 18, 2008 |
| 7346412 |
Manufacturing method of semiconductor integrated circuit device |
Mar. 18, 2008 |
| 7343213 |
System and method for analyzing and communicating transmission assembly failure information |
Mar. 11, 2008 |
| 7337034 |
Method and apparatus for determining a root cause of a statistical process control failure |
Feb. 26, 2008 |
| 7333867 |
Substrate processing system managing apparatus information of substrate processing apparatus |
Feb. 19, 2008 |
| 7331205 |
Rivet monitoring system |
Feb. 19, 2008 |
| 7324863 |
Automatically selecting wafers for review |
Jan. 29, 2008 |
| 7324193 |
Measuring a damaged structure formed on a wafer using optical metrology |
Jan. 29, 2008 |
| 7318227 |
Method for monitoring or installing new program codes in an industrial installation |
Jan. 8, 2008 |
| 7317961 |
Substrate processing apparatus and method of transporting substrates and method of processing substrates in substrate processing apparatus |
Jan. 8, 2008 |
| 7313454 |
Method and apparatus for classifying manufacturing outputs |
Dec. 25, 2007 |
| 7308331 |
Apparatus and method for monitoring and maintaining plant equipment |
Dec. 11, 2007 |
| 7308385 |
Diagnostic systems and methods for predictive condition monitoring |
Dec. 11, 2007 |
| 7292900 |
Power distribution expert system |
Nov. 6, 2007 |
| 7289865 |
Optimization algorithm to optimize within substrate uniformities |
Oct. 30, 2007 |
| 7289863 |
System and method for electronic diagnostics of a process vacuum environment |
Oct. 30, 2007 |
| 7289861 |
Process control system with an embedded safety system |
Oct. 30, 2007 |
| 7289862 |
Methods to support process quality and maintenance during control of an industrial process such as welding |
Oct. 30, 2007 |
| 7289864 |
Feature dimension deviation correction system, method and program product |
Oct. 30, 2007 |
| 7278847 |
Dynamically configured 3-D object creation system with built-in printhead failure correction mechanism |
Oct. 9, 2007 |
| 7280883 |
Substrate processing system managing apparatus information of substrate processing apparatus |
Oct. 9, 2007 |
| 7280945 |
Apparatus and methods for detection of systematic defects |
Oct. 9, 2007 |
| 7277824 |
Method and apparatus for classifying faults based on wafer state data and sensor tool trace data |
Oct. 2, 2007 |
| 7277769 |
Production system and method for a composite product |
Oct. 2, 2007 |
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