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Class Information
Number: 700/109
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring > Quality control
Description: Subject matter wherein the data processing system or calculating computer performs a statistical analysis of a manufactured product or manufacturing process and compares the results to predetermined specifications or parameters.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7622311 |
Inspection of underfill in integrated circuit package |
Nov. 24, 2009 |
| 7624178 |
Apparatus, system, and method for dynamic adjustment of performance monitoring |
Nov. 24, 2009 |
| 7599755 |
System and method for dynamically simulating value stream and network maps |
Oct. 6, 2009 |
| 7596421 |
Process control system, process control method, and method of manufacturing electronic apparatus |
Sep. 29, 2009 |
| 7591440 |
Methods and systems for cement finishing mill control |
Sep. 22, 2009 |
| 7590465 |
Method and apparatus for detecting abnormal characteristic values capable of suppressing detection of normal characteristic values |
Sep. 15, 2009 |
| 7589845 |
Process control using an optical metrology system optimized with signal criteria |
Sep. 15, 2009 |
| 7587178 |
Signaling device |
Sep. 8, 2009 |
| 7580768 |
Method of adjusting process variables in a processing flow |
Aug. 25, 2009 |
| 7574417 |
Self configuration of embedded historians |
Aug. 11, 2009 |
| 7561937 |
Automated sputtering target production |
Jul. 14, 2009 |
| 7561938 |
Method for using data regarding manufacturing procedures integrated circuits (ICS) have undergone, such as repairs, to select procedures the ICs will undergo, such as additional repairs |
Jul. 14, 2009 |
| 7546178 |
Aligner evaluation system, aligner evaluation method, a computer program product, and a method for manufacturing a semiconductor device |
Jun. 9, 2009 |
| 7542821 |
Multi-unit process spatial synchronization of image inspection systems |
Jun. 2, 2009 |
| 7542880 |
Time weighted moving average filter |
Jun. 2, 2009 |
| 7536233 |
Method and apparatus for adjusting processing speeds based on work-in-process levels |
May. 19, 2009 |
| 7531368 |
In-line lithography and etch system |
May. 12, 2009 |
| 7526699 |
Method for creating a built-in self test (BIST) table for monitoring a monolayer deposition (MLD) system |
Apr. 28, 2009 |
| 7519447 |
Method and apparatus for integrating multiple sample plans |
Apr. 14, 2009 |
| 7519885 |
Monitoring a monolayer deposition (MLD) system using a built-in self test (BIST) table |
Apr. 14, 2009 |
| 7516047 |
Diagnostic method for manufacturing processes |
Apr. 7, 2009 |
| 7509177 |
Self-calibrating orienting system for a manipulating device |
Mar. 24, 2009 |
| 7509185 |
Methods, systems, and software program for validation and monitoring of pharmaceutical manufacturing processes |
Mar. 24, 2009 |
| 7505879 |
Method for generating multivariate analysis model expression for processing apparatus, method for executing multivariate analysis of processing apparatus, control device of processing apparatu |
Mar. 17, 2009 |
| 7502658 |
Methods of fabricating optimization involving process sequence analysis |
Mar. 10, 2009 |
| 7502659 |
Sorting a group of integrated circuit devices for those devices requiring special testing |
Mar. 10, 2009 |
| 7496421 |
Method and apparatus for order control in a production process for a fiber product |
Feb. 24, 2009 |
| 7477262 |
Automatic calculation of minimum and maximum tolerance stack |
Jan. 13, 2009 |
| 7472024 |
Data analysis apparatus and method |
Dec. 30, 2008 |
| 7471991 |
Methods, systems, and software program for validation and monitoring of pharmaceutical manufacturing processes |
Dec. 30, 2008 |
| 7465417 |
Parametric injection molding system and method |
Dec. 16, 2008 |
| 7463941 |
Quality control system, quality control method, and method of lot-to-lot wafer processing |
Dec. 9, 2008 |
| 7460968 |
Method and apparatus for selecting wafers for sampling |
Dec. 2, 2008 |
| 7457679 |
Solid model of statistical process control |
Nov. 25, 2008 |
| 7447610 |
Method and system for reliability similarity of semiconductor devices |
Nov. 4, 2008 |
| 7447559 |
Apparatus and method of forming a photoresist pattern, and repair nozzle |
Nov. 4, 2008 |
| 7444196 |
Optimized characterization of wafers structures for optical metrology |
Oct. 28, 2008 |
| 7444197 |
Methods, systems, and software program for validation and monitoring of pharmaceutical manufacturing processes |
Oct. 28, 2008 |
| 7433751 |
Sorting a group of integrated circuit devices for those devices requiring special testing |
Oct. 7, 2008 |
| 7424336 |
Test data analyzing system and test data analyzing program |
Sep. 9, 2008 |
| 7419271 |
Manufacturing method for fine structure element, fine structure element manufactured by the method, spatial light modulator, and projector |
Sep. 2, 2008 |
| 7412297 |
Method and system for designing and manufacturing lens modules |
Aug. 12, 2008 |
| 7409306 |
System and method for estimating reliability of components for testing and quality optimization |
Aug. 5, 2008 |
| 7403832 |
Method and system for advanced process control including tool dependent machine constants |
Jul. 22, 2008 |
| 7404167 |
Method for improving design window |
Jul. 22, 2008 |
| 7403834 |
Methods of and apparatuses for controlling process profiles |
Jul. 22, 2008 |
| 7401004 |
System for reviewing defects, a computer implemented method for reviewing defects, and a method for fabricating electronic devices |
Jul. 15, 2008 |
| 7398131 |
Method and system for concrete quality control based on the concrete's maturity |
Jul. 8, 2008 |
| 7395122 |
Data capture for electronically delivered automation services |
Jul. 1, 2008 |
| 7392107 |
Methods of integrating computer products with pharmaceutical manufacturing hardware systems |
Jun. 24, 2008 |
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