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Class Information
Number: 700/109
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring > Quality control
Description: Subject matter wherein the data processing system or calculating computer performs a statistical analysis of a manufactured product or manufacturing process and compares the results to predetermined specifications or parameters.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7433751 |
Sorting a group of integrated circuit devices for those devices requiring special testing |
Oct. 7, 2008 |
| 7424336 |
Test data analyzing system and test data analyzing program |
Sep. 9, 2008 |
| 7419271 |
Manufacturing method for fine structure element, fine structure element manufactured by the method, spatial light modulator, and projector |
Sep. 2, 2008 |
| 7412297 |
Method and system for designing and manufacturing lens modules |
Aug. 12, 2008 |
| 7409306 |
System and method for estimating reliability of components for testing and quality optimization |
Aug. 5, 2008 |
| 7403832 |
Method and system for advanced process control including tool dependent machine constants |
Jul. 22, 2008 |
| 7403834 |
Methods of and apparatuses for controlling process profiles |
Jul. 22, 2008 |
| 7404167 |
Method for improving design window |
Jul. 22, 2008 |
| 7401004 |
System for reviewing defects, a computer implemented method for reviewing defects, and a method for fabricating electronic devices |
Jul. 15, 2008 |
| 7398131 |
Method and system for concrete quality control based on the concrete's maturity |
Jul. 8, 2008 |
| 7395122 |
Data capture for electronically delivered automation services |
Jul. 1, 2008 |
| 7392107 |
Methods of integrating computer products with pharmaceutical manufacturing hardware systems |
Jun. 24, 2008 |
| 7383156 |
Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information |
Jun. 3, 2008 |
| 7369908 |
Method for manufacturing product formed with a plurality of parts and method for combining parts |
May. 6, 2008 |
| 7359830 |
Method for automatic on-line calibration of a process model |
Apr. 15, 2008 |
| 7349753 |
Adjusting manufacturing process control parameter using updated process threshold derived from uncontrollable error |
Mar. 25, 2008 |
| 7346413 |
Productivity for tool having plurality of processing modules |
Mar. 18, 2008 |
| 7346410 |
Method and system for manufacturing electronic device, electronic device, and electro-optical apparatus |
Mar. 18, 2008 |
| 7346409 |
Information processing apparatus, and information processing method |
Mar. 18, 2008 |
| 7340359 |
Augmenting semiconductor's devices quality and reliability |
Mar. 4, 2008 |
| 7340318 |
Method and apparatus for assessing controller performance |
Mar. 4, 2008 |
| 7337033 |
Data mining to detect performance quality of tools used repetitively in manufacturing |
Feb. 26, 2008 |
| 7337034 |
Method and apparatus for determining a root cause of a statistical process control failure |
Feb. 26, 2008 |
| 7333906 |
Quality analysis including cumulative deviation determination |
Feb. 19, 2008 |
| 7324862 |
Quality control apparatus and control method of the same, and recording medium recorded with quality control program |
Jan. 29, 2008 |
| 7324193 |
Measuring a damaged structure formed on a wafer using optical metrology |
Jan. 29, 2008 |
| 7308331 |
Apparatus and method for monitoring and maintaining plant equipment |
Dec. 11, 2007 |
| 7308385 |
Diagnostic systems and methods for predictive condition monitoring |
Dec. 11, 2007 |
| 7292900 |
Power distribution expert system |
Nov. 6, 2007 |
| 7289862 |
Methods to support process quality and maintenance during control of an industrial process such as welding |
Oct. 30, 2007 |
| 7272532 |
Method for predicting the quality of a product |
Sep. 18, 2007 |
| 7269470 |
Aligner evaluation system, aligner evaluation method, a computer program product, and a method for manufacturing a semiconductor device |
Sep. 11, 2007 |
| 7266502 |
Feature centric release manager method and system |
Sep. 4, 2007 |
| 7263510 |
Human factors process failure modes and effects analysis (HF PFMEA) software tool |
Aug. 28, 2007 |
| 7260441 |
Method of inspecting a workpiece during a production run in which workpieces are supplied to workstations by an autoloader |
Aug. 21, 2007 |
| 7254458 |
Systems and methods for metrology recipe and model generation |
Aug. 7, 2007 |
| 7248939 |
Method and apparatus for multivariate fault detection and classification |
Jul. 24, 2007 |
| 7245985 |
Process and apparatus for improving and controlling the vulcanization of natural and synthetic rubber compounds |
Jul. 17, 2007 |
| 7242995 |
E-manufacturing in semiconductor and microelectronics processes |
Jul. 10, 2007 |
| 7239970 |
Robotic system for optically inspecting workpieces |
Jul. 3, 2007 |
| 7225047 |
Method, system and medium for controlling semiconductor wafer processes using critical dimension measurements |
May. 29, 2007 |
| 7221990 |
Process control by distinguishing a white noise component of a process variance |
May. 22, 2007 |
| 7221987 |
Generating a reliability analysis by identifying casual relationships between events in an event-based manufacturing system |
May. 22, 2007 |
| 7212950 |
Methods and apparatus for equipment matching and characterization |
May. 1, 2007 |
| 7209846 |
Quality control system for manufacturing industrial products |
Apr. 24, 2007 |
| 7200455 |
Method of process control |
Apr. 3, 2007 |
| 7194320 |
Method for implementing indirect controller |
Mar. 20, 2007 |
| 7194366 |
System and method for estimating reliability of components for testing and quality optimization |
Mar. 20, 2007 |
| 7181355 |
Automatic quality control method for production line and apparatus therefor as well as automatic quality control program |
Feb. 20, 2007 |
| 7177718 |
Semiconductor production system |
Feb. 13, 2007 |
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