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Class Information
Number: 700/108
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring
Description: Subject matter wherein the data processing system or calculating computer receives information on the various quantitative variables associated with the assembly process.

Sub-classes under this class:

Class Number Class Name Patents
700/109 Quality control 532
700/111 Worker or work station efficiency 134

Patents under this class:

Patent Number Title Of Patent Date Issued
7482914 Operation information display for industrial vehicle Jan. 27, 2009
7477959 Photoresist system Jan. 13, 2009
7475262 Processor power management associated with workloads Jan. 6, 2009
7474998 Simulation of production processes by means of continuous fluid models Jan. 6, 2009
7474934 Methods and apparatus for enhancing electronic device manufacturing throughput Jan. 6, 2009
7474933 System and method for automating integration of semiconductor work in process updates Jan. 6, 2009
7469363 Computer network with diagnosis computer nodes Dec. 23, 2008
7468661 System and method for monitoring and controlling remote devices Dec. 23, 2008
7465417 Parametric injection molding system and method Dec. 16, 2008
7463943 Method and devices for automatically supplying material to a processing machine Dec. 9, 2008
7460968 Method and apparatus for selecting wafers for sampling Dec. 2, 2008
7451008 Management method and system for device requiring maintenance Nov. 11, 2008
7447559 Apparatus and method of forming a photoresist pattern, and repair nozzle Nov. 4, 2008
7444847 Method for increasing the process stability, particularly the absolute thickness precision and the installation safety during the hot rolling of steel or nonferrous materials Nov. 4, 2008
7444251 Detecting and diagnosing faults in HVAC equipment Oct. 28, 2008
7444196 Optimized characterization of wafers structures for optical metrology Oct. 28, 2008
7441242 Monitoring performance of a logically-partitioned computer Oct. 21, 2008
7440870 System for monitoring the quality of industrial processes and method therefrom Oct. 21, 2008
7440859 Method for determining plasma characteristics Oct. 21, 2008
7440812 Component mounting apparatus, service providing device and servicing method Oct. 21, 2008
7437204 Method and apparatus for monitoring host to tool communications Oct. 14, 2008
7433890 Method and apparatus for storing and retrieving data stored within an associated piece of equipment Oct. 7, 2008
7433755 Controlling the curing of a rubber compound Oct. 7, 2008
7433751 Sorting a group of integrated circuit devices for those devices requiring special testing Oct. 7, 2008
7432115 Test circuit, semiconductor product wafer having the test circuit, and method of monitoring manufacturing process using the test circuit Oct. 7, 2008
7428442 Methods of performing path analysis on pharmaceutical manufacturing systems Sep. 23, 2008
7426555 Method, system, and storage medium for providing continuous communication between process equipment and an automated material handling system Sep. 16, 2008
7424336 Test data analyzing system and test data analyzing program Sep. 9, 2008
7423288 Technique for evaluating a fabrication of a die and wafer Sep. 9, 2008
7421357 Inspection data analysis program, inspection tools, review apparatus and yield analysis apparatus Sep. 2, 2008
7415317 Method and system for correlating and combining production and non-production data for analysis Aug. 19, 2008
7409260 Substrate thickness measuring during polishing Aug. 5, 2008
7403882 Material handling system enabling enhanced data consistency and method thereof Jul. 22, 2008
7403832 Method and system for advanced process control including tool dependent machine constants Jul. 22, 2008
7400945 On-die temperature monitoring in semiconductor devices to limit activity overload Jul. 15, 2008
7400935 Method for implementing indirect controller Jul. 15, 2008
7398131 Method and system for concrete quality control based on the concrete's maturity Jul. 8, 2008
7395132 Optical metrology model optimization for process control Jul. 1, 2008
7395131 Method for processing data based on the data context Jul. 1, 2008
7395130 Method and system for aggregating and combining manufacturing data for analysis Jul. 1, 2008
7395128 System, method, and device for designing a die to stamp metal parts to an exact final dimension Jul. 1, 2008
7395122 Data capture for electronically delivered automation services Jul. 1, 2008
7392106 Fabrication system and fabrication method Jun. 24, 2008
7385700 Management system, apparatus, and method, exposure apparatus, and control method therefor Jun. 10, 2008
7383156 Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information Jun. 3, 2008
7379782 System and method of monitoring and quantifying performance of an automated manufacturing facility May. 27, 2008
7376548 Methods and apparatus for simulating industrial processes May. 20, 2008
7376479 Process monitoring device for sample processing apparatus and control method of sample processing apparatus May. 20, 2008
7375035 Host and ancillary tool interface methodology for distributed processing May. 20, 2008
7373213 Management system and apparatus, method therefor, and device manufacturing method May. 13, 2008

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