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Class Information
Number: 700/108
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring
Description: Subject matter wherein the data processing system or calculating computer receives information on the various quantitative variables associated with the assembly process.

Sub-classes under this class:

Class Number Class Name Patents
700/109 Quality control 532
700/111 Worker or work station efficiency 134

Patents under this class:

Patent Number Title Of Patent Date Issued
7765020 Graphical user interface for presenting multivariate fault contributions Jul. 27, 2010
7761180 Method and system for monitoring batch product manufacturing Jul. 20, 2010
7756678 System and method for advanced condition monitoring of an asset system Jul. 13, 2010
7756598 System and method for automating integration of semiconductor work in process updates Jul. 13, 2010
7752088 On site physical inventory method Jul. 6, 2010
7751922 Semiconductor manufacturing apparatus and manufacturing of a semiconductor device Jul. 6, 2010
7751921 Semiconductor manufacturing apparatus, method of detecting abnormality, identifying cause of abnormality, or predicting abnormality in the semiconductor manufacturing apparatus, and storage me Jul. 6, 2010
7751911 Failure alarm device and failure alarm method Jul. 6, 2010
7742833 Auto discovery of embedded historians in network Jun. 22, 2010
7738978 System and method for performing process visualization Jun. 15, 2010
7735055 Method of creating photo mask data, method of photo mask manufacturing, and method of manufacturing semiconductor device Jun. 8, 2010
7729792 Version control for objects in a process plant configuration system Jun. 1, 2010
7729789 Process plant monitoring based on multivariate statistical analysis and on-line process simulation Jun. 1, 2010
7725617 Data output system with printing device, and data output method, in particular for performing a test printing May. 25, 2010
7725298 Event tracing with time stamp compression May. 25, 2010
7720560 Semiconductor manufacturing process monitoring May. 18, 2010
7715937 Allocating manufactured devices according to customer specifications May. 11, 2010
7715936 System and method for the production of goods or products May. 11, 2010
7703079 System performance prediction Apr. 20, 2010
7698242 Systems and methods to maintain process control systems using information retrieved from a database storing general-type information and specific-type information Apr. 13, 2010
7698011 Operating condition monitoring apparatus, method for monitoring operating condition and program Apr. 13, 2010
7689730 Data output system and data output method with data output monitoring Mar. 30, 2010
7689312 Downstream error handling in manufacturing systems Mar. 30, 2010
7689298 Methods to support process quality and maintenance during control of an industrial process such as welding Mar. 30, 2010
7689028 Method and apparatus for evaluating processing apparatus status and predicting processing result Mar. 30, 2010
7680553 Methods of interfacing nanomaterials for the monitoring and execution of pharmaceutical manufacturing processes Mar. 16, 2010
7676447 Control system and method for controlling execution of scientific experiments by laboratory instruments Mar. 9, 2010
7676296 Substrate processing system, substrate processing method and computer-readable storage medium storing verification program Mar. 9, 2010
7676295 Processing information management in a plasma processing tool Mar. 9, 2010
7676294 Visualization of workflow in an industrial automation environment Mar. 9, 2010
7668613 MES appliance integrated with control modules Feb. 23, 2010
7667858 Automated process control using optical metrology and a correlation between profile models and key profile shape variables Feb. 23, 2010
7660680 Systems and methods for totalizing parallel feeds Feb. 9, 2010
7657342 Substrate thickness measuring during polishing Feb. 2, 2010
7657339 Product-related feedback for process control Feb. 2, 2010
7650251 System and method for rule-based data mining and problem detection for semiconductor fabrication Jan. 19, 2010
7650198 Automation system unified data access for disparate data sources Jan. 19, 2010
7647131 Dynamic determination of sampling rates Jan. 12, 2010
7636608 Method for dynamic sensor configuration and runtime execution Dec. 22, 2009
7630786 Manufacturing process end point detection Dec. 8, 2009
7624178 Apparatus, system, and method for dynamic adjustment of performance monitoring Nov. 24, 2009
7624003 Split-phase chamber modeling for chamber matching and fault detection Nov. 24, 2009
7623139 Design and modeling system and methods Nov. 24, 2009
7620511 Method for determining plasma characteristics Nov. 17, 2009
7610668 Automated sidewall assembly machine Nov. 3, 2009
7610113 Operational control system and a system providing for remote monitoring of a manufacturing device Oct. 27, 2009
7610111 Method and system for wafer lot order Oct. 27, 2009
7607135 Apparatus and method for enhancing performance of a computer system Oct. 20, 2009
7606681 System and method for process monitoring Oct. 20, 2009
7603598 Semiconductor device for testing semiconductor process and method thereof Oct. 13, 2009

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