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Class Information
Number: 700/108
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring
Description: Subject matter wherein the data processing system or calculating computer receives information on the various quantitative variables associated with the assembly process.

Sub-classes under this class:

Class Number Class Name Patents
700/109 Quality control 532
700/111 Worker or work station efficiency 134

Patents under this class:

Patent Number Title Of Patent Date Issued
8024676 Multi-pitch scatterometry targets Sep. 20, 2011
8024053 Safety instrumentation system and plant safety system Sep. 20, 2011
8019476 Control device, control method, recording medium, program, and building Sep. 13, 2011
8014891 Etching amount calculating method, storage medium, and etching amount calculating apparatus Sep. 6, 2011
8014887 Substrate processing apparatus Sep. 6, 2011
8013732 Systems and methods for monitoring and controlling remote devices Sep. 6, 2011
8013234 Reflective piano keyboard scanner Sep. 6, 2011
8010228 Process monitoring apparatus and method for monitoring process Aug. 30, 2011
8010218 Industrial automation interfaces integrated with enterprise manufacturing intelligence (EMI) systems Aug. 30, 2011
8000946 Discrete event simulation with constraint based scheduling analysis Aug. 16, 2011
8000515 Automatic detection of coating flaws Aug. 16, 2011
7996113 Methods of integrating real and virtual world using virtual sensor/actuator Aug. 9, 2011
7991499 Advanced finishing control Aug. 2, 2011
7991497 Method and system for defect detection in manufacturing integrated circuits Aug. 2, 2011
7987014 Systems and methods for selecting wafer processing order for cyclical two pattern defect detection Jul. 26, 2011
7987012 Control device of substrate processing apparatus and control program therefor Jul. 26, 2011
7979151 Run-time dispatch system for enhanced product characterization capability Jul. 12, 2011
7978059 System and method for monitoring and controlling remote devices Jul. 12, 2011
7974729 Server device and program with sub-recipe measurement communication Jul. 5, 2011
7974728 System for extraction of key process parameters from fault detection classification to enable wafer prediction Jul. 5, 2011
7974724 Product-related feedback for process control Jul. 5, 2011
7974718 Method for assembling a component Jul. 5, 2011
7970486 Method for controlling semiconductor manufacturing apparatus and control system of semiconductor manufacturing apparatus Jun. 28, 2011
7970483 Methods and apparatus for improving operation of an electronic device manufacturing system Jun. 28, 2011
RE42481 Semiconductor yield management system and method Jun. 21, 2011
7966152 System, method and algorithm for data-driven equipment performance monitoring Jun. 21, 2011
7966150 Data analysis applications Jun. 21, 2011
7962302 Predicting wafer failure using learned probability Jun. 14, 2011
7962234 Multidimensional process window optimization in semiconductor manufacturing Jun. 14, 2011
7962227 Compact batch viewing techniques for use in batch processes Jun. 14, 2011
7960178 Enhanced scheduling sample processing system and methods of biological slide processing Jun. 14, 2011
7949497 Machine condition monitoring using discontinuity detection May. 24, 2011
7937178 Charging method for semiconductor device manufacturing apparatus, storage medium storing program for implementing the charging method, and semiconductor device manufacturing apparatus implemen May. 3, 2011
7937168 Automated abnormal machine tracking and notifying system and method May. 3, 2011
7937164 Multivariate detection of abnormal conditions in a process plant May. 3, 2011
7930058 Nanotopography control and optimization using feedback from warp data Apr. 19, 2011
7930049 Control method for a substrate processing apparatus Apr. 19, 2011
7920935 Activity based real-time production instruction adaptation Apr. 5, 2011
7920934 Manufacturing system and controller, controlling method, controlling system, and control program for the manufacturing system Apr. 5, 2011
7917240 Univariate method for monitoring and analysis of multivariate data Mar. 29, 2011
7908025 Semiconductor manufacturing apparatus and control system and control method therefor Mar. 15, 2011
7908024 Method and system for detecting tool errors to stop a process recipe for a single chamber Mar. 15, 2011
7908023 Method of establishing a lot grade system for product lots in a semiconductor manufacturing process Mar. 15, 2011
7904407 Human factors process failure modes and effects analysis (HF PFMEA) software tool Mar. 8, 2011
7904276 Method and business process for the estimation of erosion costs in assemble-to-order manufacturing operations Mar. 8, 2011
7904190 System and method for protection system design support Mar. 8, 2011
7899570 Advanced automatic deposition profile targeting and control by applying advanced polish endpoint system feedback Mar. 1, 2011
7899557 Input signal analyzing system and control apparatus using same Mar. 1, 2011
7890220 Low overhead closed loop control system Feb. 15, 2011
7881891 Automated dynamic metrology sampling system and method for process control Feb. 1, 2011

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