Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Browse by Category: Main > Information Technology
Class Information
Number: 700/108
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring
Description: Subject matter wherein the data processing system or calculating computer receives information on the various quantitative variables associated with the assembly process.










Sub-classes under this class:

Class Number Class Name Patents
700/109 Quality control 532
700/111 Worker or work station efficiency 134


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 Next

Patent Number Title Of Patent Date Issued
6269279 Control system Jul. 31, 2001
6259960 Part-inspecting system Jul. 10, 2001
6256550 Overall equipment effectiveness on-line categories system and method Jul. 3, 2001
6249715 Method and apparatus for optimizing work distribution Jun. 19, 2001
6246325 Distributed communications system for reducing equipment down-time Jun. 12, 2001
6243614 Method and product for optimizing assembly performance Jun. 5, 2001
6243615 System for analyzing and improving pharmaceutical and other capital-intensive manufacturing processes Jun. 5, 2001
6243618 Method of marking number or the like and apparatus for marking the same Jun. 5, 2001
6240329 Method and apparatus for a semiconductor wafer inspection system using a knowledge-based system May. 29, 2001
6236409 Method and apparatus for computer aided building specification generation May. 22, 2001
6226561 Production planning system May. 1, 2001
6223094 Multi-tiered structure for storing and displaying product and process variants Apr. 24, 2001
6208949 Method and apparatus for dynamical system analysis Mar. 27, 2001
6205367 Apparatus for supporting equipment operability evaluation Mar. 20, 2001
6202000 Monitoring system for semiconductor device fabrication facility Mar. 13, 2001
6195590 System for control and resource allocation for the manufacture of a product Feb. 27, 2001
6188934 Register correspondence method using I/O terminals, determined registers, the number of undetermined registers and self-feedback information to define unique registers Feb. 13, 2001
6185473 Optical pattern transfer tool Feb. 6, 2001
6178390 Method for controlling thicknesses of layers formed by deposition equipment for fabricating semiconductor devices Jan. 23, 2001
6170019 Means system and method for operating an apparatus Jan. 2, 2001
6167317 Apparatus and methods for management of flocks of layer fowl Dec. 26, 2000
6167320 System for control and resource allocation for the manufacturing of a product Dec. 26, 2000
6163732 System, method and computer program products for determining compliance of chemical products to government regulations Dec. 19, 2000
6163740 Integrated iconic display for power plants by displaying plurality of process icons corresponding to all operating heat engines in one single computer screen Dec. 19, 2000
6154957 Method of and apparatus for mounting electronic parts Dec. 5, 2000
6151532 Method and apparatus for predicting plasma-process surface profiles Nov. 21, 2000
6144885 Method for the interactive improvement of manufacturing processes Nov. 7, 2000
6144891 Wrenching method and apparatus, wrenching attachment, and medium storing wrenching torque control program Nov. 7, 2000
6144892 Gauging system Nov. 7, 2000
6144893 Method and computer system for controlling an industrial process by analysis of bottlenecks Nov. 7, 2000
6131052 Semiconductor manufacturing non-processing apparatuses with storage equipment Oct. 10, 2000
6128543 Method and apparatus for collecting manufacturing equipment downtime data Oct. 3, 2000
6128544 Process for monitoring and control of the operation of an analyzer and of a manufacturing unit to which it is linked Oct. 3, 2000
6122563 Method of sorting a group of integrated circuit devices for those devices requiring special testing Sep. 19, 2000
6115643 Real-time manufacturing process control monitoring method Sep. 5, 2000
6115645 Semiconductor tester with remote debugging for handler Sep. 5, 2000
6108156 Method for recording a port number of a servo track writer Aug. 22, 2000
6104964 Processing rate calculation apparatus, a processing rate calculation method, and a computer readable recording medium having thereon a processing rate calculation program Aug. 15, 2000
6097992 Method and controlling system for preventing the scratching of wafer backs by the fetch arm of a stepper machine Aug. 1, 2000
6098023 Driving control system and monitoring device for fan filter unit in semiconductor clean room Aug. 1, 2000
6078877 Method for optically transmitting signals in measurement units and measurement system employing the optical transmission method Jun. 20, 2000
6078894 Method and system for evaluating the performance of emergency medical dispatchers Jun. 20, 2000
6061640 Method of and apparatus for extracting abnormal factors in a processing operation May. 9, 2000
6058335 Automated technique for manufacturing hard disk drive May. 2, 2000
6046816 Print data flow operation standardized test technique Apr. 4, 2000
6021359 Method and apparatus for determining an inspection schedule for a production line Feb. 1, 2000
6018716 Apparatus and method for analysis of continuous process lines Jan. 25, 2000
6009352 Parameter generating device for part mounting program and storage medium Dec. 28, 1999
5984504 Safety or protection system employing reflective memory and/or diverse processors and communications Nov. 16, 1999
5980086 Facility operating method Nov. 9, 1999

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 Next










 
 
  Recently Added Patents
Package for a medicinal product
Digital-to-analog converter and performing method thereof
High brightness laser diode module
Nanoparticles in a flash memory using chaperonin proteins
Method for adjusting link speed and computer system using the same
Automobile body
Down-drawable, chemically strengthened glass for cover plate
  Randomly Featured Patents
Flat screen device with transparent protection housing
Display table
Time of flight mass spectrometer, ion source, and methods of preparing a sample for mass analysis and of mass analyzing a sample
Fair value model based system, method, and computer program product for valuing foreign-based securities in a mutual fund
Apparatus for rearranging signal channels of a multi-loop time-division multiplexed transmission system
Method and apparatus for coating submerged portions of floating structures
Method and device for mounting and withdrawing a plasma torch relative to an apparatus operating under pressure and temperature conditions precluding a direct intervention
Superconducting materials of high density and crystalline structure produced from a mixture of YBa.sub.2 Cu.sub.3 O.sub.7-x and CuO
Physical quantity measuring apparatus utilizing optical frequency domain reflectometry, and method for simultaneous measurement of temperature and strain using the apparatus
Halftone patterns for trusted printing