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Class Information
Number: 700/108
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring
Description: Subject matter wherein the data processing system or calculating computer receives information on the various quantitative variables associated with the assembly process.










Sub-classes under this class:

Class Number Class Name Patents
700/109 Quality control 532
700/111 Worker or work station efficiency 134


Patents under this class:
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Patent Number Title Of Patent Date Issued
6650956 Wiring harness checking method Nov. 18, 2003
6650958 Integrated process tool monitoring system for semiconductor fabrication Nov. 18, 2003
6650960 Machining control system Nov. 18, 2003
6646660 Method and apparatus for presenting process control performance data Nov. 11, 2003
6647301 Process control system with integrated safety control system Nov. 11, 2003
6640151 Multi-tool control system, method and medium Oct. 28, 2003
6631305 Capability analysis of assembly line production Oct. 7, 2003
6628994 Method to obtain improved performance by automatic adjustment of computer system parameters Sep. 30, 2003
6629009 Management system for semiconductor fabrication device Sep. 30, 2003
6629012 Wafer-less qualification of a processing tool Sep. 30, 2003
6625510 Computer-based tool management documentation system Sep. 23, 2003
6622055 Method of control management of production line Sep. 16, 2003
6622058 Centralized control architecture for a plasma arc system Sep. 16, 2003
6622059 Automated process monitoring and analysis system for semiconductor processing Sep. 16, 2003
6618637 Method and circuit configuration for monitoring machine parameters Sep. 9, 2003
6618638 Method for scaling processes between different etching chambers and wafer sizes Sep. 9, 2003
6618681 Method and apparatus for predicting the available energy of a battery Sep. 9, 2003
6615094 Method for providing manufacturing-related data in large-scale production of manufactured objects, especially automobiles Sep. 2, 2003
6615095 Goods processing device and managing system Sep. 2, 2003
6615101 Method for identifying the best tool in a semiconductor manufacturing process Sep. 2, 2003
6609040 Method of analyzing and optimizing a multistage manufacturing process Aug. 19, 2003
6604011 Reticle chuck in exposure apparatus and semiconductor device manufacturing method using the same Aug. 5, 2003
6600961 Intelligent control method for injection machine Jul. 29, 2003
6585328 Customized mattress evaluation system Jul. 1, 2003
6584368 User configurable multivariate time series reduction tool control method Jun. 24, 2003
6584369 Method and system for dispatching semiconductor lots to manufacturing equipment for fabrication Jun. 24, 2003
6580960 System and method for finding an operation/tool combination that causes integrated failure in a semiconductor fabrication facility Jun. 17, 2003
6580961 Circuit production method Jun. 17, 2003
6571202 Method for applying design for reliability into design for six sigma May. 27, 2003
6564113 Lot start agent that calculates virtual WIP time in a multi-product and multi-bottleneck manufacturing environment May. 13, 2003
6560503 Method and apparatus for monitoring controller performance using statistical process control May. 6, 2003
6560506 Method and apparatus for control for semiconductor processing for reducing effects of environmental effects May. 6, 2003
6556881 Method and apparatus for integrating near real-time fault detection in an APC framework Apr. 29, 2003
6556882 Method and apparatus for generating real-time data from static files Apr. 29, 2003
6556883 Performance value determination system and method Apr. 29, 2003
6556892 Control device and control method for robot Apr. 29, 2003
6556959 Method and apparatus for updating a manufacturing model based upon fault data relating to processing of semiconductor wafers Apr. 29, 2003
6553277 Method and apparatus for vacuum treatment Apr. 22, 2003
6549815 Method and apparatus for optimizing overall characteristics of device, using heuristic method Apr. 15, 2003
6549822 Method and apparatus for control of multi-cup semiconductor manufacturing tracks Apr. 15, 2003
6539271 Quality management system with human-machine interface for industrial automation Mar. 25, 2003
6535769 Monitoring system for monitoring processing equipment Mar. 18, 2003
6535783 Method and apparatus for the integration of sensor data from a process tool in an advanced process control (APC) framework Mar. 18, 2003
6535785 System and method for monitoring and controlling gas plasma processes Mar. 18, 2003
6532427 Web-based mining of statistical data Mar. 11, 2003
6532555 Method and apparatus for integration of real-time tool data and in-line metrology for fault detection in an advanced process control (APC) framework Mar. 11, 2003
6529780 Method for automatic operation of industrial plants Mar. 4, 2003
6529793 Method of sorting a group of integrated circuit devices for those devices requiring special testing Mar. 4, 2003
6522939 Computer system for quality control correlation Feb. 18, 2003
6523045 Graphical user interface shop floor control system Feb. 18, 2003

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