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Class Information
Number: 700/108
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring
Description: Subject matter wherein the data processing system or calculating computer receives information on the various quantitative variables associated with the assembly process.










Sub-classes under this class:

Class Number Class Name Patents
700/109 Quality control 532
700/111 Worker or work station efficiency 134


Patents under this class:
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Patent Number Title Of Patent Date Issued
6859675 Semiconductor factory automation system and method for monitoring at least one server in real time Feb. 22, 2005
6853872 Operating method of vacuum processing system and vacuum processing system Feb. 8, 2005
6853953 Method for characterizing the performance of an electrostatic chuck Feb. 8, 2005
6850808 Method and system for developing a software program using compound templates Feb. 1, 2005
6850855 Apparatus and method for inspecting working operations on circuit substrate, and system and method for fabricating electric circuit Feb. 1, 2005
6845278 Product attribute data mining in connection with a web converting manufacturing process Jan. 18, 2005
6845280 Work in progress management program interface Jan. 18, 2005
6845345 System for monitoring and analyzing diagnostic data of spin tracks Jan. 18, 2005
6845410 System and method for a hierarchical system management architecture of a highly scalable computing system Jan. 18, 2005
6842663 Production managing system of semiconductor device Jan. 11, 2005
6842742 System for providing early warning preemptive postal equipment replacement Jan. 11, 2005
6836690 High precision substrate prealigner Dec. 28, 2004
6836691 Method and apparatus for filtering metrology data based on collection purpose Dec. 28, 2004
6836693 Method to predict dielectric film properties using chemical bonding measurements as input to computer modeling Dec. 28, 2004
6836698 Maintenance system for machine tool Dec. 28, 2004
6834211 Adjusting a trace data rate based upon a tool state Dec. 21, 2004
6834213 Process control based upon a metrology delay Dec. 21, 2004
6832122 System and method for comparing electronics manufacturing data Dec. 14, 2004
6829515 Method and device for determining changes in technical systems such as electric motors caused by ageing Dec. 7, 2004
6829516 Combined information exchange systems and methods Dec. 7, 2004
6829518 Numerical control apparatus Dec. 7, 2004
6826439 Broadband distribution of SECS-II data Nov. 30, 2004
6826440 Experimental management apparatus and experimental management program for electroplating Nov. 30, 2004
6813532 Creation and display of indices within a process plant Nov. 2, 2004
6810406 Method and system for servicing a selected piece of equipment having unique system configurations and servicing requirements Oct. 26, 2004
6807455 System for and method of processing substrate Oct. 19, 2004
6804563 Multidimensional method and system for statistical process control Oct. 12, 2004
6804569 Distributed manufacturing with feedback Oct. 12, 2004
6804570 Predicting manufacturing process failures Oct. 12, 2004
6804619 Process control based on tool health data Oct. 12, 2004
6801814 Apparatus and method for computerized data collection, monitoring, analysis, and control of grouting operations Oct. 5, 2004
6801822 PRODUCTION MANAGEMENT SYSTEM, CLIENT IN THE PRODUCTION MANAGEMENT SYSTEM, PRODUCTION MANAGEMENT METHOD IN THE PRODUCTION MANAGEMENT SYSTEM, DATA RETRIEVAL METHOD IN THE PRODUCTION MANAGEMENT S Oct. 5, 2004
6799143 Process and device for evaluating the performance of a process control system Sep. 28, 2004
6792325 Remote maintenance method, industrial device, and semiconductor device Sep. 14, 2004
6788993 Sorting a group of integrated circuit devices for those devices requiring special testing Sep. 7, 2004
6788994 Operation data accumulation and transmission device, operation management device, and operation management system Sep. 7, 2004
6785583 Management system and apparatus, method therefor, and device manufacturing method Aug. 31, 2004
6785640 Surface evaluation in a stamping manufacturing process utilizing true reflection line methodology and computer graphics technology Aug. 31, 2004
6775583 Method and apparatus for user guidance in optical inspection and measurement of thin films and substrates, and software therefore Aug. 10, 2004
6775584 Operation-supervision integrated interface Aug. 10, 2004
6772031 Method of, system for and computer program product for providing a job monitor Aug. 3, 2004
6772034 System and software for data distribution in semiconductor manufacturing and method thereof Aug. 3, 2004
6772040 Centralized control architecture for a plasma arc system Aug. 3, 2004
6766208 Automatic production quality control method and system Jul. 20, 2004
6766275 Method for diagnosing life of manufacturing equipment using rotary machine Jul. 20, 2004
6766283 System and method for monitoring process quality control Jul. 20, 2004
6766285 Predictive processing method in a semiconductor processing facility Jul. 20, 2004
6763278 Operating a processing tool in a degraded mode upon detecting a fault Jul. 13, 2004
6763313 System and method for measuring an object Jul. 13, 2004
6757579 Kalman filter state estimation for a manufacturing system Jun. 29, 2004

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