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Class Information
Number: 700/108
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring
Description: Subject matter wherein the data processing system or calculating computer receives information on the various quantitative variables associated with the assembly process.










Sub-classes under this class:

Class Number Class Name Patents
700/109 Quality control 532
700/111 Worker or work station efficiency 134


Patents under this class:
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Patent Number Title Of Patent Date Issued
6937914 Method and apparatus for controlling process target values based on manufacturing metrics Aug. 30, 2005
6937965 Statistical guardband methodology Aug. 30, 2005
6934595 Method and system for reducing semiconductor wafer breakage Aug. 23, 2005
6934596 Manufacturing system, measurement data collecting system, and measurement terminal apparatus Aug. 23, 2005
6934671 Method and system for including parametric in-line test data in simulations for improved model to hardware correlation Aug. 23, 2005
6928332 Process system and process tool for processing a workpiece Aug. 9, 2005
6924746 Device and method to establish temporal correspondence in multiple sensor configurations Aug. 2, 2005
6925338 Fiducial technique for estimating and using degradation levels in a process plant Aug. 2, 2005
6922595 Selecting control algorithms based on business rules Jul. 26, 2005
6922600 System and method for optimizing manufacturing processes using real time partitioned process capability analysis Jul. 26, 2005
6922601 System for yield improvement of manufactured products Jul. 26, 2005
6917846 Apparatus and method of providing a work machine Jul. 12, 2005
6917847 Method and apparatus for design for manufacturing Jul. 12, 2005
6915237 Integrated system for verifying the performance and health of instruments and processes Jul. 5, 2005
6909926 Production control method and a computer program therefor Jun. 21, 2005
6909931 Method and system for estimating microelectronic fabrication product yield Jun. 21, 2005
6910024 System for pricing-based quality of service (PQoS) control in networks Jun. 21, 2005
6905895 Predicting process excursions based upon tool state variables Jun. 14, 2005
6907306 Process tool throughput monitoring system and method Jun. 14, 2005
6907379 System and method for processing tester information and visualization for parameter with multiple distributions in integrated circuit technology development Jun. 14, 2005
6907381 System for aiding the preparation of operation and maintenance plans for a power-generation installation Jun. 14, 2005
6904380 Simulator cart Jun. 7, 2005
6901303 Method and apparatus for controlling fans and power supplies to provide accelerated run-in testing May. 31, 2005
6901306 Semiconductor manufacturing apparatus and its diagnosis apparatus and operating system May. 31, 2005
6901309 Programming platform for generating parts programs for machine tools or production machines May. 31, 2005
6901347 Availability, reliability or maintainability index including outage characterization May. 31, 2005
6898476 Management of working status with large-scaled display May. 24, 2005
6898482 Process and an application for item processing May. 24, 2005
6895293 Fault detection and virtual sensor methods for tool fault monitoring May. 17, 2005
6892107 Plant control monitor May. 10, 2005
6892108 Method for adjusting processing parameters of at least one plate-shaped object in a processing tool May. 10, 2005
6892111 Control system of machine tool May. 10, 2005
6892234 Multi-tiered enterprise management system and method including a presentation services unit external to the enterprise May. 10, 2005
6889173 System for monitoring optimal equipment operating parameters May. 3, 2005
6885903 Method and system for tracking repair of components Apr. 26, 2005
6885906 Operating method of vacuum processing system and vacuum processing system Apr. 26, 2005
6883124 Adaptable transducer interface Apr. 19, 2005
6879867 Process monitoring device for sample processing apparatus and control method of sample processing apparatus Apr. 12, 2005
6873878 Throughput analysis system and method Mar. 29, 2005
6871111 Performance evaluation method for plasma processing apparatus Mar. 22, 2005
6871112 Method for requesting trace data reports from FDC semiconductor fabrication processes Mar. 22, 2005
6871113 Real time dispatcher application program interface Mar. 22, 2005
6871114 Updating process controller based upon fault detection analysis Mar. 22, 2005
6871160 Intelligent condition-based engine/equipment management system Mar. 22, 2005
6868299 Generating a sampling plan for testing generated content Mar. 15, 2005
6868353 Method and apparatus for determining wafer quality profiles Mar. 15, 2005
6865434 Management system of monitor wafers Mar. 8, 2005
6865436 Method and system for manufacturing and servicing a computing product with the assistance of a wireless communication subsystem attached to a peripheral port Mar. 8, 2005
6865511 Process and device for evaluating the performance of a process control system Mar. 8, 2005
6859674 Method for designing and acquiring a machining system based upon performance characteristics Feb. 22, 2005

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