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Class Information
Number: 700/108
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring
Description: Subject matter wherein the data processing system or calculating computer receives information on the various quantitative variables associated with the assembly process.










Sub-classes under this class:

Class Number Class Name Patents
700/109 Quality control 532
700/111 Worker or work station efficiency 134


Patents under this class:
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Patent Number Title Of Patent Date Issued
7010381 Versatile system for controlling semiconductor topography Mar. 7, 2006
7010382 Method and system for improving process control for semiconductor manufacturing operations Mar. 7, 2006
7006682 Apparatus for monitoring particles and method of doing the same Feb. 28, 2006
7006877 Method for automatically recording an intervention in a production facility Feb. 28, 2006
7006878 Computer-implemented method for analyzing a problem statement based on an integration of Six Sigma, Lean Manufacturing, and Kaizen analysis techniques Feb. 28, 2006
7006948 Diagnostic method for manufacturing processes Feb. 28, 2006
7003366 Diagnostic system and operating method for the same Feb. 21, 2006
7003477 Certification method for manufacturing process Feb. 21, 2006
6999832 Production machine with capability of transmitting production information and method for generating events regarding production information while operating the production machine Feb. 14, 2006
6999835 Circuit-substrate working system and electronic-circuit fabricating process Feb. 14, 2006
6999846 Apparatus and method for feedback-adjusting working condition for improving dimensional accuracy of processed workpieces Feb. 14, 2006
7000193 Display to facilitate the monitoring of a complex process Feb. 14, 2006
6996447 Group management apparatus Feb. 7, 2006
6992767 Management system, apparatus, and method, exposure apparatus, and control method therefor Jan. 31, 2006
6993403 Facility monitoring method Jan. 31, 2006
6993407 Method and system for analyzing semiconductor fabrication Jan. 31, 2006
6990381 Electrically controlled apparatus Jan. 24, 2006
6990384 Truss plate detector Jan. 24, 2006
6988225 Verifying a fault detection result based on a process control state Jan. 17, 2006
6985825 Method and apparatus for adaptive sampling based on process covariance Jan. 10, 2006
6983207 Machine component monitoring, diagnosing and selling system Jan. 3, 2006
6980872 Information providing method and system Dec. 27, 2005
6980873 System and method for real-time fault detection, classification, and correction in a semiconductor manufacturing environment Dec. 27, 2005
6980874 System and method for detecting an anomalous condition in a multi-step process Dec. 27, 2005
6980875 Nonparametric control chart for the range Dec. 27, 2005
6978222 Method of determining level of effect of system entity on system performance, by use of active time of same entity Dec. 20, 2005
6978225 Networked control system with real time monitoring Dec. 20, 2005
6978272 Method and apparatus for displaying instrumentation parameters in a database system Dec. 20, 2005
6975915 Cooperative smart items Dec. 13, 2005
6976033 Production cell information system based on activity costs and an architecture therefor Dec. 13, 2005
6973413 Instrument and process performance and reliability verification system Dec. 6, 2005
6970757 Method and apparatus for updating control state variables of a process control model based on rework data Nov. 29, 2005
6970758 System and software for data collection and process control in semiconductor manufacturing and method thereof Nov. 29, 2005
6968249 Current measuring circuit for measuring drive current to load Nov. 22, 2005
6965808 System and method for optimizing metrology sampling in APC applications Nov. 15, 2005
6965855 Methods and apparatus for system and device design and control Nov. 15, 2005
6963786 Remote maintenance system Nov. 8, 2005
6961635 Method for yield improvement of manufactured products Nov. 1, 2005
6961672 Universal diagnostic platform for specimen analysis Nov. 1, 2005
6957115 Security-related bus automation system Oct. 18, 2005
6954677 Remote maintenance method for industrial device that generates maintenance charge information using received charge list Oct. 11, 2005
6954713 Cavitation detection in a process plant Oct. 11, 2005
6949007 System and method for multi-stage process control in film removal Sep. 27, 2005
6950783 Method and related system for semiconductor equipment prevention maintenance management Sep. 27, 2005
6947800 Smart machine tool system Sep. 20, 2005
6947801 Method and system for synchronizing control limit and equipment performance Sep. 20, 2005
6947804 Method for detecting sequential processing effects using on-tool randomization Sep. 20, 2005
6947805 Dynamic metrology sampling techniques for identified lots, and system for performing same Sep. 20, 2005
6944516 Method for error proofing body shop component selection Sep. 13, 2005
6941185 Operating method of vacuum processing system and vacuum processing system Sep. 6, 2005

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