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Class Information
Number: 700/108
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring
Description: Subject matter wherein the data processing system or calculating computer receives information on the various quantitative variables associated with the assembly process.










Sub-classes under this class:

Class Number Class Name Patents
700/109 Quality control 532
700/111 Worker or work station efficiency 134


Patents under this class:
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Patent Number Title Of Patent Date Issued
7363098 Method to identify machines causing excursion in semiconductor manufacturing Apr. 22, 2008
7359831 Diagnostic context Apr. 15, 2008
7359759 Method and system for virtual metrology in semiconductor manufacturing Apr. 15, 2008
7356440 Method and business process for the estimation of erosion costs in assemble-to-order manufacturing operations Apr. 8, 2008
7356377 System, method, and medium for monitoring performance of an advanced process control system Apr. 8, 2008
7353140 Methods for monitoring and controlling boiler flames Apr. 1, 2008
7353078 Semiconductor wafer processing apparatus and method for processing batch of wafers having variable number of wafer lots Apr. 1, 2008
7353075 Manufacturing system and controller, controlling method, controlling system, and control program for the manufacturing system Apr. 1, 2008
7353074 Production loss tracking system Apr. 1, 2008
7353073 Method for managing appliances Apr. 1, 2008
7349863 Dynamic planning method and system Mar. 25, 2008
7349754 Providing component-specific performance characterization data for an assembly or subsystem Mar. 25, 2008
7349750 Method for optimizing an industrial product, system for optimizing an industrial product and method for manufacturing an industrial product Mar. 25, 2008
7346476 Event tracing with time stamp compression Mar. 18, 2008
7346413 Productivity for tool having plurality of processing modules Mar. 18, 2008
7346409 Information processing apparatus, and information processing method Mar. 18, 2008
7346406 System and method for data retrieval in AC power tools via an AC line cord Mar. 18, 2008
7343271 Incorporation of a phase map into fast model-based optical proximity correction simulation kernels to account for near and mid-range flare Mar. 11, 2008
7343217 System for monitoring and controlling a semiconductor manufacturing apparatus using prediction model equation Mar. 11, 2008
7343213 System and method for analyzing and communicating transmission assembly failure information Mar. 11, 2008
7343212 Item substitution in the manufacture of products Mar. 11, 2008
7340361 Method and apparatus for analyzing computer system performance and proposing hardware component upgrades Mar. 4, 2008
7337092 Event-based automated diagnosis of known problems Feb. 26, 2008
7334145 Predictive processor speed governor Feb. 19, 2008
7333922 System and method of monitoring machine performance Feb. 19, 2008
7333876 Systems and methods for providing electronic quality control in a process for applying a polyurethane to a substrate Feb. 19, 2008
7333871 Automated design and execution of experiments with integrated model creation for semiconductor manufacturing tools Feb. 19, 2008
7333718 Work data collection method Feb. 19, 2008
7330117 Systems and methods for radio frequency trigger Feb. 12, 2008
7329168 Extended Kalman filter incorporating offline metrology Feb. 12, 2008
7328126 Method and system of diagnosing a processing system using adaptive multivariate analysis Feb. 5, 2008
7328078 Services portal Feb. 5, 2008
7324864 Apparatus and method for measuring forces imparted on valve assemblies of metered dose delivery containers during manufacture thereof Jan. 29, 2008
7324855 Process-state management system, management server and control server adapted for the system, method for managing process-states, method for manufacturing a product, and computer program produ Jan. 29, 2008
7321942 Performance counter for adding variable work increment value that is dependent upon clock frequency Jan. 22, 2008
7320115 Method for identifying a physical failure location on an integrated circuit Jan. 15, 2008
7318227 Method for monitoring or installing new program codes in an industrial installation Jan. 8, 2008
7315765 Automated control thread determination based upon post-process consideration Jan. 1, 2008
7310981 Method for regulating the temperature of strip metal Dec. 25, 2007
7308385 Diagnostic systems and methods for predictive condition monitoring Dec. 11, 2007
7308331 Apparatus and method for monitoring and maintaining plant equipment Dec. 11, 2007
7308329 Method and apparatus for inspecting semiconductor wafer Dec. 11, 2007
7305278 Enterprise factory control method and system Dec. 4, 2007
7302397 System for issue identification, prioritization, and resolution and associated method Nov. 27, 2007
7302362 System and method for efficient and collective adjustment of sensor reporting ranges for long-lived queries Nov. 27, 2007
7299106 Method and apparatus for scheduling metrology based on a jeopardy count Nov. 20, 2007
7299103 System and method for monitoring consumable usage in packaging machines Nov. 20, 2007
7295950 Monitoring multiple channels of data from real time process to detect recent abnormal behavior Nov. 13, 2007
7294039 Polishing system with in-line and in-situ metrology Nov. 13, 2007
7292960 Method for characterization, detection and prediction for target events Nov. 6, 2007

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