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Class Information
Number: 700/108
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring
Description: Subject matter wherein the data processing system or calculating computer receives information on the various quantitative variables associated with the assembly process.
Sub-classes under this class:
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7620511 |
Method for determining plasma characteristics |
Nov. 17, 2009 |
| 7610668 |
Automated sidewall assembly machine |
Nov. 3, 2009 |
| 7610111 |
Method and system for wafer lot order |
Oct. 27, 2009 |
| 7610113 |
Operational control system and a system providing for remote monitoring of a manufacturing device |
Oct. 27, 2009 |
| 7606681 |
System and method for process monitoring |
Oct. 20, 2009 |
| 7607135 |
Apparatus and method for enhancing performance of a computer system |
Oct. 20, 2009 |
| 7603598 |
Semiconductor device for testing semiconductor process and method thereof |
Oct. 13, 2009 |
| 7603201 |
Systems and methods for the automated pre-treatment and processing of biological samples |
Oct. 13, 2009 |
| 7603194 |
Fabrication system and fabrication method |
Oct. 13, 2009 |
| 7599755 |
System and method for dynamically simulating value stream and network maps |
Oct. 6, 2009 |
| 7596803 |
Method and system for generating access policies |
Sep. 29, 2009 |
| 7596421 |
Process control system, process control method, and method of manufacturing electronic apparatus |
Sep. 29, 2009 |
| 7596422 |
Determining one or more profile parameters of a structure using optical metrology and a correlation between profile models and key profile shape variables |
Sep. 29, 2009 |
| 7596423 |
Method and apparatus for verifying a site-dependent procedure |
Sep. 29, 2009 |
| 7593832 |
Energy efficient achievement of integrated circuit performance goals |
Sep. 22, 2009 |
| 7589845 |
Process control using an optical metrology system optimized with signal criteria |
Sep. 15, 2009 |
| 7587178 |
Signaling device |
Sep. 8, 2009 |
| 7584011 |
Method for optimizing an industrial product, system for optimizing an industrial product and method for manufacturing an industrial product |
Sep. 1, 2009 |
| 7584019 |
Systems and methods for the automated pre-treatment and processing of biological samples |
Sep. 1, 2009 |
| 7579944 |
Information provision system and terminal for same and program for same |
Aug. 25, 2009 |
| 7580767 |
Methods of and apparatuses for maintenance, diagnosis, and optimization of processes |
Aug. 25, 2009 |
| 7574279 |
Manufacturing system and controller, controlling method, controlling system, and control program for the manufacturing system |
Aug. 11, 2009 |
| 7567853 |
Method and system for the electronic provision of services for machines via a data communication link |
Jul. 28, 2009 |
| 7561940 |
Method for predictive maintenance of a cutting unit of an automatic machine |
Jul. 14, 2009 |
| 7561988 |
Customer support system |
Jul. 14, 2009 |
| 7558642 |
Method, apparatus, and product for optimizing manufacturing tests by integrating part and test objects in the same order configuration application |
Jul. 7, 2009 |
| 7558641 |
Recipe report card framework and methods thereof |
Jul. 7, 2009 |
| 7551974 |
Processing method of workpieces using combined processing machines |
Jun. 23, 2009 |
| 7551976 |
Industrial device receiving remote maintenance operation and outputting charge information |
Jun. 23, 2009 |
| 7548793 |
On-line process specification adjusting and component disposing based on predictive model of component performance |
Jun. 16, 2009 |
| 7546177 |
Automated state estimation system for cluster tools and a method of operating the same |
Jun. 9, 2009 |
| 7542821 |
Multi-unit process spatial synchronization of image inspection systems |
Jun. 2, 2009 |
| 7542819 |
Method and system for managing product output |
Jun. 2, 2009 |
| 7536764 |
Method and apparatus for monitoring blind fastener setting |
May. 26, 2009 |
| 7539552 |
Method and apparatus for implementing a universal coordinate system for metrology data |
May. 26, 2009 |
| 7539585 |
System and method for rule-based data mining and problem detection for semiconductor fabrication |
May. 26, 2009 |
| 7539597 |
Diagnostic systems and methods for predictive condition monitoring |
May. 26, 2009 |
| 7529644 |
Method of diagnosing an operations systems |
May. 5, 2009 |
| 7526794 |
Data perspectives in controller system and production management systems |
Apr. 28, 2009 |
| 7526699 |
Method for creating a built-in self test (BIST) table for monitoring a monolayer deposition (MLD) system |
Apr. 28, 2009 |
| 7526405 |
Statistical signatures used with multivariate statistical analysis for fault detection and isolation and abnormal condition prevention in a process |
Apr. 28, 2009 |
| 7519446 |
Manufacture condition setting system, manufacture condition setting method, control program, and computer-readable record medium recording control program therein |
Apr. 14, 2009 |
| 7519885 |
Monitoring a monolayer deposition (MLD) system using a built-in self test (BIST) table |
Apr. 14, 2009 |
| 7515984 |
Method and system for monitoring batch product manufacturing |
Apr. 7, 2009 |
| 7516047 |
Diagnostic method for manufacturing processes |
Apr. 7, 2009 |
| 7509177 |
Self-calibrating orienting system for a manipulating device |
Mar. 24, 2009 |
| 7505879 |
Method for generating multivariate analysis model expression for processing apparatus, method for executing multivariate analysis of processing apparatus, control device of processing apparatu |
Mar. 17, 2009 |
| 7505829 |
System, method, and article of manufacture for determining a productivity rate of a manufacturing system |
Mar. 17, 2009 |
| 7502702 |
Method and apparatus for dynamic adjustment of sensor and/or metrology sensitivities |
Mar. 10, 2009 |
| 7502659 |
Sorting a group of integrated circuit devices for those devices requiring special testing |
Mar. 10, 2009 |
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