Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Browse by Category: Main > Information Technology
Class Information
Number: 700/108
Name: Data processing: generic control systems or specific applications > Specific application, apparatus or process > Product assembly or manufacturing > Performance monitoring
Description: Subject matter wherein the data processing system or calculating computer receives information on the various quantitative variables associated with the assembly process.










Sub-classes under this class:

Class Number Class Name Patents
700/109 Quality control 532
700/111 Worker or work station efficiency 134


Patents under this class:

Patent Number Title Of Patent Date Issued
8713490 Managing aging of silicon in an integrated circuit device Apr. 29, 2014
8712730 Control system of substrate processing apparatus, collecting unit, substrate processing apparatus and control method of the substrate processing apparatus Apr. 29, 2014
8712571 Method and apparatus for wireless transmission of diagnostic information Apr. 29, 2014
8712570 Systems and methods for detecting and rejecting defective absorbent articles from a converting line Apr. 29, 2014
8712568 Substrate processing apparatus and display method of substrate processing apparatus Apr. 29, 2014
8707222 Lithography mask functional optimization and spatial frequency analysis Apr. 22, 2014
8706284 Method and system for diagnosing operating states of a production facility Apr. 22, 2014
8705079 Information processing apparatus Apr. 22, 2014
8694148 Tracking and marking specimens having defects formed during laser via drilling Apr. 8, 2014
8688256 Advanced process control system and method utilizing virtual metrology with reliance index Apr. 1, 2014
8686374 Drawing apparatus, and method of manufacturing article Apr. 1, 2014
8683366 Field device with means for performing diagnostic methods Mar. 25, 2014
8682466 Automatic virtual metrology for semiconductor wafer result prediction Mar. 25, 2014
8676368 System and method for optimizing a production process using electromagnetic-based local positioning capabilities Mar. 18, 2014
8676356 System and method for motor parameter estimation Mar. 18, 2014
8666703 Method for automated determination of an optimally parameterized scatterometry model Mar. 4, 2014
8660878 Model-driven assignment of work to a software factory Feb. 25, 2014
8660670 Controller with artificial intelligence based on selection from episodic memory and corresponding methods Feb. 25, 2014
8655469 Advanced process control optimization Feb. 18, 2014
8652412 Sterilization of consumable composition dispensers Feb. 18, 2014
8649990 Method for detecting variance in semiconductor processes Feb. 11, 2014
8645970 Method to route notifications to designated responder Feb. 4, 2014
8639379 Detecting device and detecting method Jan. 28, 2014
8639376 System for maintaining unified access to SCADA and manufacturing execution system (MES) information Jan. 28, 2014
8639375 Enhancing investigation of variability by inclusion of similar objects with known differences to the original ones Jan. 28, 2014
8634948 Method and system for providing automated high scale fabrication of custom items Jan. 21, 2014
8630728 System and method for generating indices to quantify operating transition performance of a continuous process Jan. 14, 2014
8626328 Discrete sampling based nonlinear control system Jan. 7, 2014
8620776 Self healing andon system and method Dec. 31, 2013
8620485 Electrical tagging device Dec. 31, 2013
8618497 Drawing apparatus, method of manufacturing article, and information processing apparatus Dec. 31, 2013
8612026 Method and device for planning an industrial automation arrangement Dec. 17, 2013
8606387 Adaptive and automatic determination of system parameters Dec. 10, 2013
8600539 Substrate processing apparatus Dec. 3, 2013
8600523 Control of an operation of a coordinate measuring device Dec. 3, 2013
8594826 Method and system for evaluating a machine tool operating characteristics Nov. 26, 2013
8594821 Detecting combined tool incompatibilities and defects in semiconductor manufacturing Nov. 26, 2013
8588950 Substrate processing apparatus Nov. 19, 2013
8583433 System and method for efficiently transcribing verbal messages to text Nov. 12, 2013
8571703 System, method and storage medium for controlling a processing system Oct. 29, 2013
8571696 Methods and apparatus to predict process quality in a process control system Oct. 29, 2013
8565910 Manufacturing execution system (MES) including a wafer sampling engine (WSE) for a semiconductor manufacturing process Oct. 22, 2013
8560107 Substrate processing system Oct. 15, 2013
8560106 Predictive maintenance for third party support equipment Oct. 15, 2013
8560098 System for remotely monitoring a site for anticipated failure and maintenance with a plurality of controls Oct. 15, 2013
8560097 Computer assisted method for remotely monitoring a site for anticipated failure and maintenance with a plurality of controls Oct. 15, 2013
8560096 Method for remotely monitoring a site for anticipated failure and maintenance with a plurality of controls Oct. 15, 2013
8548777 Automated recommendations from simulation Oct. 1, 2013
8548621 Production system control model updating using closed loop design of experiments Oct. 1, 2013
8548619 System and method for after-market support using as-built data Oct. 1, 2013











 
 
  Recently Added Patents
Deflection device for a scanner with Lissajous scanning
Optical recording medium, and method for producing optical recording medium
Method, system and computer program product for verifying floating point divide operation results
Anti-infective derivatives, method for the production thereof, pharmaceutical compositions containing same and uses of said derivatives in treatment
Autonomous primary-mirror synchronized reset
Build process management system
(4934
  Randomly Featured Patents
Articulating skateboard with springable connector
Boat motor compartment
Surgical collet
Ink dispenser for refilling ink jet cartridges
Portable theft alarm
Knitted fabric with a new pattern and a process for its production
Wide-band compression coupling
Optical sensor with a single continuous injection molded optical element with fresnel lenses
Apparatus and method for the pretreatment of biological specimens for use in scanning electron microscopes
Transistor switches