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Browse by Category: Main > Tools & Hardware
Class Information
Number: 451/6
Name: Abrading > Precision device or process - or with condition responsive control > By optical sensor
Description: Subject matter in which a light responsive means regulates the abrading operation.


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14

Patent Number Title Of Patent Date Issued
7621798 Reducing polishing pad deformation Nov. 24, 2009
7614932 Method and system for endpoint detection Nov. 10, 2009
7614933 Polishing pad assembly with glass or crystalline window Nov. 10, 2009
7614934 Double-side polishing apparatus Nov. 10, 2009
7614936 Spectrum based endpointing for chemical mechanical polishing Nov. 10, 2009
7603762 Optical lapping guide for use in the manufacture of perpendicular magnetic write heads Oct. 20, 2009
7604527 Methods and systems for planarizing workpieces, e.g., microelectronic workpieces Oct. 20, 2009
7585204 Substrate polishing apparatus Sep. 8, 2009
7585202 Computer-implemented method for process control in chemical mechanical polishing Sep. 8, 2009
7581305 Method of manufacturing an optical component Sep. 1, 2009
7556554 Apparatus and method for manufacturing optical objects Jul. 7, 2009
7553214 Polishing article with integrated window stripe Jun. 30, 2009
7549909 Methods for optical endpoint detection during semiconductor wafer polishing Jun. 23, 2009
7547242 Substrate polishing apparatus Jun. 16, 2009
7547243 Method of making and apparatus having polishing pad with window Jun. 16, 2009
7537511 Embedded fiber acoustic sensor for CMP process endpoint May. 26, 2009
7530878 Grinding machine with a concentricity correction system May. 12, 2009
7527545 Methods and tools for controlling the removal of material from microfeature workpieces May. 5, 2009
7528922 Apparatus and method for measuring ground amounts of liquid crystal display panel May. 5, 2009
7510460 Substrate polishing apparatus Mar. 31, 2009
7510459 Eyeglass lens processing apparatus Mar. 31, 2009
7510458 Bit sharpening apparatus and method of using Mar. 31, 2009
7507144 Substrate polishing apparatus Mar. 24, 2009
7507145 Automated sectioning tomographic measurement system Mar. 24, 2009
7500901 Data processing for monitoring chemical mechanical polishing Mar. 10, 2009
7497763 Polishing pad, a polishing apparatus, and a process for using the polishing pad Mar. 3, 2009
7497762 Apparatus and method for correcting grinding amount of liquid crystal display panel Mar. 3, 2009
7495759 Damage and wear detection for rotary cutting blades Feb. 24, 2009
7489856 Electrical device for automatically adjusting operating speed of a tool Feb. 10, 2009
7481945 Polishing progress monitoring method and device thereof, polishing device, semiconductor device production method, and semiconductor device Jan. 27, 2009
7479056 Automated drill bit re-sharpening and verification system Jan. 20, 2009
7479206 Apparatus for in-situ optical endpointing on web-format planarizing machines in mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies Jan. 20, 2009
7473159 Detection of diamond contamination in polishing pad and reconditioning system therefor Jan. 6, 2009
7473161 Lapping machine and head device manufacturing method Jan. 6, 2009
7452262 Knife sharpeners with improved knife guides Nov. 18, 2008
7442111 Polishing pad, platen, method of monitoring, method of manufacturing, and method of detecting Oct. 28, 2008
7438627 Polishing state monitoring method Oct. 21, 2008
7416472 Systems for planarizing workpieces, e.g., microelectronic workpieces Aug. 26, 2008
7416474 Planarization apparatus Aug. 26, 2008
7413500 Methods for planarizing workpieces, e.g., microelectronic workpieces Aug. 19, 2008
7407433 Pad characterization tool Aug. 5, 2008
7409260 Substrate thickness measuring during polishing Aug. 5, 2008
7404754 CNC tungsten steel cutting machine Jul. 29, 2008
7384326 Facetting area setting device and eyeglass lens processing apparatus Jun. 10, 2008
7377837 Grinding or polishing arrangement May. 27, 2008
7367873 Substrate processing apparatus May. 6, 2008
7361601 Chemical mechanical polish process and method for improving accuracy of determining polish endpoint thereof Apr. 22, 2008
7357694 Jet singulation Apr. 15, 2008
7354334 Reducing polishing pad deformation Apr. 8, 2008
7354332 Technique for process-qualifying a semiconductor manufacturing tool using metrology data Apr. 8, 2008

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