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Browse by Category: Main > Tools & Hardware
Class Information
Number: 451/5
Name: Abrading > Precision device or process - or with condition responsive control > Computer controlled
Description: Subject matter in which the operation is regulated by an electronic device capable of performing calculations, or compiling, correlating, or selecting data.










Patents under this class:

Patent Number Title Of Patent Date Issued
8712720 Filtering method for improving the data quality of geometric tire measurements Apr. 29, 2014
8689430 Method for providing a perpendicular magnetic recording (PMR)head Apr. 8, 2014
8687197 Method of monitoring progress of substrate polishing and polishing apparatus Apr. 1, 2014
8684790 Method and arrangement for maintenance of gas-turbine blades Apr. 1, 2014
8678880 Apparatus and method for measuring tooth surface deviation, apparatus and method for forming grinding tool, and gear meshing method for gear grinding apparatus Mar. 25, 2014
8662956 Conditioner of chemical mechanical polishing apparatus Mar. 4, 2014
8662134 Tire tread buffing apparatus and method Mar. 4, 2014
8657648 Processing apparatus having four processing units Feb. 25, 2014
8657645 Methods for testing the polishability of materials Feb. 25, 2014
8657644 Eddy current sensor and polishing method and apparatus Feb. 25, 2014
8655478 Dressing method, method of determining dressing conditions, program for determining dressing conditions, and polishing apparatus Feb. 18, 2014
8647172 Wafer pads for fixed-spindle floating-platen lapping Feb. 11, 2014
8647171 Fixed-spindle floating-platen workpiece loader apparatus Feb. 11, 2014
8646168 Method for manufacturing a magnetic write pole of a perpendicular magnetic write head using novel mask fabrication Feb. 11, 2014
8641476 Coplanar alignment apparatus for rotary spindles Feb. 4, 2014
8639869 Portable controller for interfacing with process system components Jan. 28, 2014
8636559 Method for wafer back-grinding control Jan. 28, 2014
8628377 Flexure assembly Jan. 14, 2014
8628376 In-line wafer thickness sensing Jan. 14, 2014
8622783 Method and system for controlling chemical mechanical polishing by controllably moving a slurry outlet Jan. 7, 2014
8616935 Control of overpolishing of multiple substrates on the same platen in chemical mechanical polishing Dec. 31, 2013
8615868 Method for manufacturing a magnetic sensor using two step ion milling Dec. 31, 2013
8615317 Process and apparatus for generating control data for controlling a tool on a machine tool comprising at least 5 axes Dec. 24, 2013
8613644 Multi-sander Dec. 24, 2013
8602845 Strengthening by machining Dec. 10, 2013
8602842 Three-point fixed-spindle floating-platen abrasive system Dec. 10, 2013
8602839 Eyeglass lens processing device Dec. 10, 2013
8602838 Chemical mechanical polishing method and system Dec. 10, 2013
8597074 Methods and systems for imaging and cutting semiconductor wafers and other semiconductor workpieces Dec. 3, 2013
8597073 Method and device for machining the leading edge of a turbine engine blade Dec. 3, 2013
8591285 Ultrasonic trimming apparatus Nov. 26, 2013
8588956 Apparatus and method for deterministic control of surface figure during full aperture polishing Nov. 19, 2013
8585843 Tire tread buffing apparatus and method Nov. 19, 2013
8585465 Planarization of a material system in a semiconductor device by using a non-selective in situ prepared slurry Nov. 19, 2013
8585460 Method of making diagram for use in selection of wavelength of light for polishing endpoint detection, method and apparatus for selecting wavelength of light for polishing endpoint detection, Nov. 19, 2013
8582122 Polishing monitoring method, polishing method, and polishing monitoring apparatus Nov. 12, 2013
8579675 Methods of using optical metrology for feed back and feed forward process control Nov. 12, 2013
8574028 Grinder/polisher Nov. 5, 2013
8568198 Active coolant flow control for machining processes Oct. 29, 2013
8568197 Method of fluid jet machining Oct. 29, 2013
8567058 Surface finishing of rotor blades for wind turbine Oct. 29, 2013
8560111 Method of determining pressure to apply to wafers during a CMP Oct. 15, 2013
8556679 Substrate polishing metrology using interference signals Oct. 15, 2013
8556678 System and method pre-blocking ophthalmic lens for processing including articulation edging Oct. 15, 2013
8555486 Method for providing a pole in a magnetic recording transducer using a cathodic etch Oct. 15, 2013
8554356 Processing end point detection method, polishing method, and polishing apparatus Oct. 8, 2013
8554351 Spectrographic monitoring of a substrate during processing using index values Oct. 8, 2013
8550876 Force-controlled surface finishing through the use of a passive magnetic constant-force device Oct. 8, 2013
8550875 Method of operating substrate processing apparatus and substrate processing apparatus Oct. 8, 2013
8550874 Glass-plate working machine Oct. 8, 2013











 
 
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