Resources Contact Us Home
Browse by Category: Main > Tools & Hardware
Class Information
Number: 451/217
Name: Abrading > Machine > Rotary tool > Rotary cylinder > Reciprocating work holder > Rectilinear > Rocking > Hob, tap, or fluted thread
Description: Abrading machine which grinds teeth, grooves, or threads.

Patents under this class:

Patent Number Title Of Patent Date Issued
5906537 Five spindle fluting machine May. 25, 1999
5065549 Method and apparatus for manufacturing K-files and reamers Nov. 19, 1991
4999952 Method and apparatus for manufacturing K-files and reamers Mar. 19, 1991
4813188 Method of shaping workpieces especially forming undercut archimedean spirals Mar. 21, 1989
4358911 Machine for relief grinding tap threads Nov. 16, 1982
4202222 Method for preparation of spherical hob for generation of gear May. 13, 1980
4075790 Screw thread tap grinding with automatic loading means Feb. 28, 1978
4016680 Sharpener for twist drills including grinding wheel dressing means Apr. 12, 1977
3994099 Screw thread tap grinding Nov. 30, 1976

  Recently Added Patents
Charged particle source with integrated electrostatic energy filter
Architectural panel with bamboo rings heavy density embossed surface
Recording device, recording method, and program
Method and apparatus for diagnosing faults in a hybrid internet protocol network
Lifting apparatus
Automated processing machine used for processing samples placed on slides and having an output device
Method of providing user-tailored entertainment experience at hospitality location and hospitality media system thereof
  Randomly Featured Patents
Enhanced efficiency solar cells and method of manufacture
Supervised access computer network router
Resonant bio-assay device and test system for detecting molecular binding events
Sink protector rack
Semiconductor memory device technical field
Apparatus for positioning gravity fed components in an electrical test facility
OLED displays with varying sized pixels
2-Amino-4,5-dihydropyridine derivatives in pharmaceutical compositions
Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a wafer