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Class Information
Number: 439/912
Name: Electrical connectors > With testing means
Description: Art collection to be combined with structure for making some sort of study.
Patents under this class:
| Patent Number |
Title Of Patent |
Date Issued |
| 7563145 |
Plug-type connector having a contact chamber for a contact partner and a test slot in the contact chamber |
Jul. 21, 2009 |
| 7544064 |
Cyclindrical impedance matching connector standoff with optional common mode ferrite |
Jun. 9, 2009 |
| 7527517 |
Terminal and connector |
May. 5, 2009 |
| 7410369 |
Distribution connection module for telecommunications and data systems technology |
Aug. 12, 2008 |
| 7349223 |
Enhanced compliant probe card systems having improved planarity |
Mar. 25, 2008 |
| 7322857 |
Electric power connector adapting structure |
Jan. 29, 2008 |
| 7270551 |
Distributor module for use in telecommunications and data systems technology |
Sep. 18, 2007 |
| 7252561 |
Terminal fitting and a connector provided therewith |
Aug. 7, 2007 |
| 7172450 |
High temperature open ended zero insertion force (ZIF) test socket |
Feb. 6, 2007 |
| 7150638 |
Cover device and method for electrical connector |
Dec. 19, 2006 |
| 7140899 |
Connector easily enabling electrical inspection of contacts |
Nov. 28, 2006 |
| 7014511 |
Electrical connector |
Mar. 21, 2006 |
| 6994558 |
System for fixing an electrical connector to a disk-brake caliper |
Feb. 7, 2006 |
| 6932643 |
Short circuit electrical connector |
Aug. 23, 2005 |
| 6929482 |
Interconnection arrangement |
Aug. 16, 2005 |
| 6917525 |
Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
Jul. 12, 2005 |
| 6913483 |
Cable for electronic battery tester |
Jul. 5, 2005 |
| 6853207 |
Method for evaluating contact pin integrity of electronic components having multiple contact pins |
Feb. 8, 2005 |
| 6848933 |
System and methodology providing coordinated and modular conveyor zone control |
Feb. 1, 2005 |
| 6843685 |
Electrical connector with voltage detection point insulation shield |
Jan. 18, 2005 |
| 6814627 |
Cover, a joint connector and a method for mounting a joint connector |
Nov. 9, 2004 |
| 6811425 |
Controller module responsive to input signals for controlling an electrical appliance |
Nov. 2, 2004 |
| 6796818 |
Extender card with insertion/removal arrangement |
Sep. 28, 2004 |
| 6774659 |
Method of testing a semiconductor package device |
Aug. 10, 2004 |
| 6736683 |
Electrical terminal |
May. 18, 2004 |
| 6702589 |
Leadless socket for decapped semiconductor device |
Mar. 9, 2004 |
| 6642729 |
Probe card for tester head |
Nov. 4, 2003 |
| 6599144 |
Sealed testable electrical contact arrangement |
Jul. 29, 2003 |
| 6589079 |
Connector having at least one contact-pin inserting port for a conduction-test tool |
Jul. 8, 2003 |
| 6583359 |
Cover for electric meter |
Jun. 24, 2003 |
| 6511337 |
Environmentally sealed instrument loop adapter |
Jan. 28, 2003 |
| 6398581 |
Bus connector and method for integrating electrical test points in the bus connector |
Jun. 4, 2002 |
| 6384426 |
System for testing semiconductor chip leads constrained in dielectric media |
May. 7, 2002 |
| 6369594 |
Test clip for electrical testing of an electronic component |
Apr. 9, 2002 |
| 6326776 |
Sensor device |
Dec. 4, 2001 |
| 6293815 |
Connector having self-sealing membrane |
Sep. 25, 2001 |
| 6276964 |
Joint connector |
Aug. 21, 2001 |
| 6270356 |
IC socket |
Aug. 7, 2001 |
| 6129577 |
Connector testing system having connector latching |
Oct. 10, 2000 |
| 6129575 |
Testing system for a connector with a self-sealing connector housing |
Oct. 10, 2000 |
| 6062906 |
Electrical connector and retaining member therefor |
May. 16, 2000 |
| 5975944 |
Connector for pitch spaced electrical cables |
Nov. 2, 1999 |
| 5955888 |
Apparatus and method for testing ball grid array packaged integrated circuits |
Sep. 21, 1999 |
| 5942905 |
Contact arrangement |
Aug. 24, 1999 |
| 5926026 |
Male terminal inspecting tool of connector |
Jul. 20, 1999 |
| 5879172 |
Surface mounted adapter using elastomeric conductors |
Mar. 9, 1999 |
| 5855490 |
Wire cutting electrical connector having test probe access |
Jan. 5, 1999 |
| 5807104 |
Test socket for detachable IC chip |
Sep. 15, 1998 |
| 5800185 |
Adapter with a support having a contacting device |
Sep. 1, 1998 |
| 5781759 |
Emulator probe mountable to a target board at different orientation angles |
Jul. 14, 1998 |
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