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Class Information
Number: 438/770
Name: Semiconductor device manufacturing: process > Coating of substrate containing semiconductor region or of semiconductor substrate > By reaction with substrate > Reaction with silicon semiconductive region (e.g., oxynitride formation, etc.) > Oxidation
Description: Processes wherein the external agent supplies oxygen which reacts with the silicon substrate region to form a compound therewith.










Sub-classes under this class:

Class Number Class Name Patents
438/774 In atmosphere containing halogen 128
438/773 In atmosphere containing water vapor (i.e., wet oxidation) 218
438/771 Using electromagnetic or wave energy 180


Patents under this class:
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15

Patent Number Title Of Patent Date Issued
7307026 Method of forming an epitaxial layer for raised drain and source regions by removing contaminations Dec. 11, 2007
7304002 Method of oxidizing member to be treated Dec. 4, 2007
7303946 Method of manufacturing a semiconductor device using an oxidation process Dec. 4, 2007
7304003 Oxidizing method and oxidizing unit for object to be processed Dec. 4, 2007
7300847 MOS transistor on an SOI substrate with a body contact and a gate insulating film with variable thickness Nov. 27, 2007
7291566 Barrier layer for a processing element and a method of forming the same Nov. 6, 2007
7288490 Increased alignment in carbon nanotube growth Oct. 30, 2007
7282457 Apparatus for stabilizing high pressure oxidation of a semiconductor device Oct. 16, 2007
7282131 Methods of electrochemically treating semiconductor substrates Oct. 16, 2007
7279435 Apparatus for stabilizing high pressure oxidation of a semiconductor device Oct. 9, 2007
7273819 Method and apparatus for processing semiconductor substrates Sep. 25, 2007
7256114 Process for oxide cap formation in semiconductor manufacturing Aug. 14, 2007
7238625 Method for processing a semiconductor device comprising a silicon-oxy-nitride dielectric layer Jul. 3, 2007
7235498 Process for growing a dielectric layer on a silicon-containing surface using a mixture of N.sub.2O and O.sub.3 Jun. 26, 2007
7235497 Selective oxidation methods and transistor fabrication methods Jun. 26, 2007
7232772 Substrate processing method Jun. 19, 2007
7232728 High quality oxide on an epitaxial layer Jun. 19, 2007
7217578 Advanced process control of thermal oxidation processes, and systems for accomplishing same May. 15, 2007
7214628 Plasma gate oxidation process using pulsed RF source power May. 8, 2007
7211523 Method for forming field oxide May. 1, 2007
7202184 Method for fabricating semiconductor device Apr. 10, 2007
7192887 Semiconductor device with nitrogen in oxide film on semiconductor substrate and method of manufacturing the same Mar. 20, 2007
7192828 Capacitor with high dielectric constant materials and method of making Mar. 20, 2007
7189635 Reduction of a feature dimension in a nano-scale device Mar. 13, 2007
7186608 Masked nitrogen enhanced gate oxide Mar. 6, 2007
7186664 Methods and structures for metal interconnections in integrated circuits Mar. 6, 2007
7183223 Methods for forming small contacts Feb. 27, 2007
7183216 Methods to form oxide-filled trenches Feb. 27, 2007
7183143 Method for forming nitrided tunnel oxide layer Feb. 27, 2007
7179746 Method of surface treatment for manufacturing semiconductor device Feb. 20, 2007
7169714 Method and structure for graded gate oxides on vertical and non-planar surfaces Jan. 30, 2007
7166519 Method for isolating semiconductor devices with use of shallow trench isolation method Jan. 23, 2007
7166541 Method of forming dielectric layer using plasma enhanced atomic layer deposition technique Jan. 23, 2007
7160819 Method to perform selective atomic layer deposition of zinc oxide Jan. 9, 2007
7157383 Method for forming silicon dioxide film on silicon substrate, method for forming oxide film on semiconductor substrate, and method for producing semiconductor device Jan. 2, 2007
7153785 Method of producing annealed wafer and annealed wafer Dec. 26, 2006
7151059 MOS transistor and method of manufacture Dec. 19, 2006
7148101 Capacitors of semiconductor devices and methods of fabricating the same Dec. 12, 2006
7148153 Process for oxide fabrication using oxidation steps below and above a threshold temperature Dec. 12, 2006
7141513 Integrated ashing and implant annealing method using ozone Nov. 28, 2006
7141514 Selective plasma re-oxidation process using pulsed RF source power Nov. 28, 2006
7135370 Dielectric storage memory cell having high permittivity top dielectric and method therefor Nov. 14, 2006
7129188 Transistor fabrication methods Oct. 31, 2006
7129183 Method of forming grating microstrutures by anodic oxidation Oct. 31, 2006
7125811 Oxidation method for semiconductor process Oct. 24, 2006
7115469 Integrated ONO processing for semiconductor devices using in-situ steam generation (ISSG) process Oct. 3, 2006
7112540 Pretreatment for an electroplating process and an electroplating process in including the pretreatment Sep. 26, 2006
7109131 System and method for hydrogen-rich selective oxidation Sep. 19, 2006
7101812 Method of forming and/or modifying a dielectric film on a semiconductor surface Sep. 5, 2006
7098148 Method for heat treating a semiconductor wafer Aug. 29, 2006

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15










 
 
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