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Class Information
Number: 438/754
Name: Semiconductor device manufacturing: process > Chemical etching > Liquid phase etching > Electrically conductive material (e.g., metal, conductive oxide, etc.)
Description: Processes wherein the material undergoing wet chemical etching is an electrically conductive material.


Sub-classes under this class:

Class Number Class Name Patents
438/755 Silicide 51


Patents under this class:
1 2 3 4 5 6 7 8

Patent Number Title Of Patent Date Issued
6177349 Preventing Cu dendrite formation and growth Jan. 23, 2001
6174819 Low temperature photoresist removal for rework during metal mask formation Jan. 16, 2001
6165911 Method of patterning a metal layer Dec. 26, 2000
6156484 Gray scale etching for thin flexible interposer Dec. 5, 2000
6153460 Method of fabricating semiconductor memory device Nov. 28, 2000
6153526 Method to remove residue in wolfram CMP Nov. 28, 2000
6153528 Method of fabricating a dual damascene structure Nov. 28, 2000
6153531 Method for preventing electrochemical erosion of interconnect structures Nov. 28, 2000
6153535 Method for removing a thin film for a window glass Nov. 28, 2000
6150279 Reverse current gold etch Nov. 21, 2000
6150269 Copper interconnect patterning Nov. 21, 2000
6147002 Process for removing contaminant from a surface and composition useful therefor Nov. 14, 2000
6143642 Programmable semiconductor structures and methods for making the same Nov. 7, 2000
6140233 Method of manufacturing semiconductor devices, etching compositions for manufacturing semiconductor devices, and semiconductor devices thereby Oct. 31, 2000
6140239 Chemically removable Cu CMP slurry abrasive Oct. 31, 2000
6140243 Low temperature process for post-etch defluoridation of metals Oct. 31, 2000
6133158 Process for removing alkali metals from solvents used in the manufacture of semiconductor wafers Oct. 17, 2000
6130170 Process improvements for titanium-tungsten etching in the presence of electroplated C4's Oct. 10, 2000
6127282 Method for removing copper residue from surfaces of a semiconductor wafer Oct. 3, 2000
6123088 Method and cleaner composition for stripping copper containing residue layers Sep. 26, 2000
6117775 Polishing method Sep. 12, 2000
6117784 Process for integrated circuit wiring Sep. 12, 2000
6117790 Method for fabricating a capacitor for a semiconductor memory configuration Sep. 12, 2000
6114246 Method of using a polish stop film to control dishing during copper chemical mechanical polishing Sep. 5, 2000
6107201 Aluminum spiking inspection method Aug. 22, 2000
6096652 Method of chemical mechanical planarization using copper coordinating ligands Aug. 1, 2000
6093649 Polishing slurry compositions capable of providing multi-modal particle packing and methods relating thereto Jul. 25, 2000
6090721 Aqueous solutions of ammonium fluoride in propylene glycol and their use in the removal of etch residues from silicon substrates Jul. 18, 2000
6087272 Method of producing thin film transistor Jul. 11, 2000
6083837 Fabrication of components by coining Jul. 4, 2000
6083838 Method of planarizing a surface on a semiconductor wafer Jul. 4, 2000
6083840 Slurry compositions and method for the chemical-mechanical polishing of copper and copper alloys Jul. 4, 2000
6083847 Method for manufacturing local interconnect Jul. 4, 2000
6077789 Method for forming a passivation layer with planarization Jun. 20, 2000
6074949 Method of preventing copper dendrite formation and growth Jun. 13, 2000
6074960 Method and composition for selectively etching against cobalt silicide Jun. 13, 2000
6040002 Etching resist composition, pattern forming method making use of the same, printed-wiring board and its production Mar. 21, 2000
6037271 Low haze wafer treatment process Mar. 14, 2000
6028011 Method of forming electric pad of semiconductor device and method of forming solder bump Feb. 22, 2000
6027790 Etching process which protects metal Feb. 22, 2000
6010969 Method of depositing films on semiconductor devices by using carboxylate complexes Jan. 4, 2000
6007729 Carrier tape and manufacturing method of said carrier tape Dec. 28, 1999
6008141 Semiconductor device and fabrication method thereof Dec. 28, 1999
6007695 Selective removal of material using self-initiated galvanic activity in electrolytic bath Dec. 28, 1999
5998297 Method of etching copper or copper-doped aluminum Dec. 7, 1999
5993686 Fluoride additive containing chemical mechanical polishing slurry and method for use of same Nov. 30, 1999
5990021 Integrated circuit having self-aligned CVD-tungsten/titanium contact plugs strapped with metal interconnect and method of manufacture Nov. 23, 1999
5990022 Method of evaluating a silicon wafer Nov. 23, 1999
5968850 Wiring using chromium nitride and methods of fabrication therefor, liquid crystal display panels using the same wiring and methods of fabrication therefor Oct. 19, 1999
5963832 Removal of metal cusp for improved contact fill Oct. 5, 1999

1 2 3 4 5 6 7 8


 
 
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