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Class Information
Number: 438/745
Name: Semiconductor device manufacturing: process > Chemical etching > Liquid phase etching
Description: Processes wherein the chemical etchant is in a liquid state when brought into contact with the semiconductive substrate.


Sub-classes under this class:

Class Number Class Name Patents
438/754 Electrically conductive material (e.g., metal, conductive oxide, etc.) 390
438/752 Germanium 100
438/748 Projection of etchant against a moving substrate or controlling the angle or pattern of projected etchant 129
438/749 Sequential application of etchant 150
438/757 Silicon nitride 218
438/756 Silicon oxide 422
438/753 Silicon 427
438/746 Utilizing electromagnetic or wave energy 85
438/747 With relative movement between substrate and confined pool of etchant 143


Patents under this class:
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Patent Number Title Of Patent Date Issued
6475399 Method for fabricating a stencil mask Nov. 5, 2002
6475966 Plasma etching residue removal Nov. 5, 2002
6472331 Method and apparatus for measuring and dispensing a wafer etchant Oct. 29, 2002
6472332 Surface micromachined structure fabrication methods for a fluid ejection device Oct. 29, 2002
6468902 Semiconductor device and its manufacturing method Oct. 22, 2002
6468904 RPO process for selective CoSix formation Oct. 22, 2002
6468907 Method of manufacturing a copper wiring in a semiconductor device Oct. 22, 2002
6468911 Method of chemical/mechanical polishing of the surface of semiconductor device Oct. 22, 2002
6468913 Ready-to-use stable chemical-mechanical polishing slurries Oct. 22, 2002
6468914 Method of forming gate electrode in semiconductor device Oct. 22, 2002
6468917 Method for modifying a C4 semiconductor device Oct. 22, 2002
6468919 Method of making a local interconnect in an embedded memory Oct. 22, 2002
6465351 Method of forming a capacitor lower electrode using a CMP stopping layer Oct. 15, 2002
6465352 Method for removing dry-etching residue in a semiconductor device fabricating process Oct. 15, 2002
6465403 Silicate-containing alkaline compositions for cleaning microelectronic substrates Oct. 15, 2002
6461534 Low lead release plumbing components made of copper based alloys containing lead, and a method for obtaining the same Oct. 8, 2002
6461955 Yield improvement of dual damascene fabrication through oxide filling Oct. 8, 2002
6461965 Method for effecting a finishing operation on a semiconductor workpiece Oct. 8, 2002
6461978 Method of manufacturing a substrate for an electronic device by using etchant and electronic device having the substrate Oct. 8, 2002
6458692 Method of forming contact plug of semiconductor device Oct. 1, 2002
6458705 Method for forming via-first dual damascene interconnect structure Oct. 1, 2002
6458710 Process for forming uniform multiple contact holes Oct. 1, 2002
6458711 Self-aligned silicide process Oct. 1, 2002
6455433 Method for forming square-shouldered sidewall spacers and devices fabricated Sep. 24, 2002
6455479 Stripping composition Sep. 24, 2002
6451223 Thinner composition and methods and systems for using the thinner composition Sep. 17, 2002
6451451 Mask, and method and apparatus for making it Sep. 17, 2002
6451696 Method for reclaiming wafer substrate and polishing solution compositions therefor Sep. 17, 2002
6451697 Method for abrasive-free metal CMP in passivation domain Sep. 17, 2002
6451704 Method for forming PLDD structure with minimized lateral dopant diffusion Sep. 17, 2002
6451707 Method of removing reaction product due to plasma ashing of a resist pattern Sep. 17, 2002
6447634 Method and apparatus for selective removal of material from wafer alignment marks Sep. 10, 2002
6448186 Method and apparatus for use of hydrogen and silanes in plasma Sep. 10, 2002
6444581 AB etch endpoint by ABFILL compensation Sep. 3, 2002
6444589 Method and apparatus for etching silicon Sep. 3, 2002
6444590 Semiconductor processing methods, methods of forming hemispherical grain polysilicon, methods of forming capacitors, and methods of forming wordlines Sep. 3, 2002
6440871 Gas assisted method for applying resist stripper and gas-resist stripper combinations Aug. 27, 2002
6440872 Method for hybrid DRAM cell utilizing confined strap isolation Aug. 27, 2002
6440873 Post metal etch cleaning method Aug. 27, 2002
6436723 Etching method and etching apparatus method for manufacturing semiconductor device and semiconductor device Aug. 20, 2002
6436743 Method of preventing electrical shorts Aug. 20, 2002
6436809 Method of manufacturing semiconductor devices, etching compositions for manufacturing semiconductor devices, and semiconductor devices made using this method Aug. 20, 2002
6436832 Method to reduce polish initiation time in a polish process Aug. 20, 2002
6436833 Method for pre-STI-CMP planarization using poly-si thermal oxidation Aug. 20, 2002
6436834 Chemical-mechanical abrasive composition and method Aug. 20, 2002
6432618 Method for forming high quality multiple thickness oxide layers by reducing descum induced defects Aug. 13, 2002
6432836 Cleaning method for semiconductor substrate and cleaning solution Aug. 13, 2002
6428718 Selective back side wet etch Aug. 6, 2002
6429132 Combination CMP-etch method for forming a thin planar layer over the surface of a device Aug. 6, 2002
6429136 Method for forming a shallow trench isolation structure in a semiconductor device Aug. 6, 2002

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