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Class Information
Number: 438/706
Name: Semiconductor device manufacturing: process > Chemical etching > Vapor phase etching (i.e., dry etching)
Description: Processes wherein the chemical etchant is in a gaseous state when brought into contact with the semiconductive substrate.


Sub-classes under this class:

Class Number Class Name Patents
438/735 Differential etching of semiconductor substrate 236
438/734 Sequential etching steps on a single layer 515
438/707 Utilizing electromagnetic or wave energy 166


Patents under this class:

Patent Number Title Of Patent Date Issued
7226867 Method of etching a metal layer using a mask, a metallization method for a semiconductor device, a method of etching a metal layer, and an etching gas Jun. 5, 2007
7226836 Method of manufacturing substrate for electro-optical device, substrate for electro-optical device, electro-optical device, and electronic apparatus Jun. 5, 2007
7223701 In-situ sequential high density plasma deposition and etch processing for gap fill May. 29, 2007
7223700 Method for fabricating fine features by jet-printing and surface treatment May. 29, 2007
7223699 Plasma etch reactor and method May. 29, 2007
7223661 Method of manufacturing semiconductor device May. 29, 2007
7220678 Method for etching of a silicon substrate and etching apparatus May. 22, 2007
7220497 Yttria-coated ceramic components of semiconductor material processing apparatuses and methods of manufacturing the components May. 22, 2007
7214978 Semiconductor fabrication that includes surface tension control May. 8, 2007
7214624 Resist pattern forming method, magnetic recording medium manufacturing method and magnetic head manufacturing method May. 8, 2007
7208712 Structures and methods for coupling energy from an electromagnetic wave Apr. 24, 2007
7208422 Plasma processing method Apr. 24, 2007
7208421 Method and apparatus for production of metal film or the like Apr. 24, 2007
7208095 Method for fabricating bottom electrodes of stacked capacitor memory cells and method for cleaning and drying a semiconductor wafer Apr. 24, 2007
7205243 Process for producing a mask on a substrate Apr. 17, 2007
7205242 Method for forming isolation layer in semiconductor device Apr. 17, 2007
7202180 Methods of forming semiconductor devices using an etch stop layer Apr. 10, 2007
7202176 Enhanced stripping of low-k films using downstream gas mixing Apr. 10, 2007
7202171 Method for forming a contact opening in a semiconductor device Apr. 10, 2007
7202170 Method of improving etching profile of floating gates for flash memory devices Apr. 10, 2007
7199059 Method for removing polymer as etching residue Apr. 3, 2007
7199058 Method of manufacturing a semiconductor device and apparatus for manufacturing a semiconductor device Apr. 3, 2007
7196017 Method for etching smooth sidewalls in III-V based compounds for electro-optical devices Mar. 27, 2007
7196015 Pattern forming method and electric device fabricating method using the same Mar. 27, 2007
7192879 Method for manufacturing micro-structural unit Mar. 20, 2007
7192876 Transistor with independent gate structures Mar. 20, 2007
7192875 Processes for treating morphologically-modified silicon electrode surfaces using gas-phase interhalogens Mar. 20, 2007
7192874 Method for reducing foreign material concentrations in etch chambers Mar. 20, 2007
7192531 In-situ plug fill Mar. 20, 2007
7189655 Method of correcting amplitude defect in multilayer film of EUVL mask Mar. 13, 2007
7189654 Manufacturing method for wiring Mar. 13, 2007
7189653 Etching method and etching apparatus Mar. 13, 2007
7189332 Apparatus and method for detecting an endpoint in a vapor phase etch Mar. 13, 2007
7186659 Plasma etching method Mar. 6, 2007
7186658 Method and resulting structure for PCMO film to obtain etching rate and mask to selectively by inductively coupled plasma Mar. 6, 2007
7183220 Plasma etching methods Feb. 27, 2007
7183219 Method of plasma processing Feb. 27, 2007
7183215 Etching with electrostatically attracted ions Feb. 27, 2007
7179749 Method for fabricating semiconductor device capable of decreasing critical dimension in peripheral region Feb. 20, 2007
7179745 Method for offsetting a silicide process from a gate electrode of a semiconductor device Feb. 20, 2007
7179744 Method for fabricating semiconductor device Feb. 20, 2007
7176140 Adhesion promotion for etch by-products Feb. 13, 2007
7176139 Etching method in a semiconductor processing and etching system for performing the same Feb. 13, 2007
7175777 Method of forming a sub-micron tip feature Feb. 13, 2007
7173339 Semiconductor device having a substrate an undoped silicon oxide structure and an overlaying doped silicon oxide structure with a sidewall terminating at the undoped silicon oxide structure Feb. 6, 2007
7172973 System and method for selectively modifying a wet etch rate in a large area Feb. 6, 2007
7172972 Semiconductor device manufacture method and etching system Feb. 6, 2007
7172969 Method and system for etching a film stack Feb. 6, 2007
7172918 Infrared thermopile detector system for semiconductor process monitoring and control Feb. 6, 2007
7169695 Method for forming a dual damascene structure Jan. 30, 2007



 
 
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