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Class Information
Number: 438/706
Name: Semiconductor device manufacturing: process > Chemical etching > Vapor phase etching (i.e., dry etching)
Description: Processes wherein the chemical etchant is in a gaseous state when brought into contact with the semiconductive substrate.


Sub-classes under this class:

Class Number Class Name Patents
438/735 Differential etching of semiconductor substrate 256
438/734 Sequential etching steps on a single layer 558
438/707 Utilizing electromagnetic or wave energy 177


Patents under this class:

Patent Number Title Of Patent Date Issued
7615163 Film formation apparatus and method of using the same Nov. 10, 2009
7611993 Plasma processing method and plasma processing apparatus Nov. 3, 2009
7608545 Semiconductor device Oct. 27, 2009
7608539 ALD method and apparatus Oct. 27, 2009
7605089 Method of manufacturing an electronic device Oct. 20, 2009
7605088 Method of uniformly etching refractory metals, refractory metal alloys and refractory metal silicides Oct. 20, 2009
7605076 Method of manufacturing a semiconductor device from which damage layers and native oxide films in connection holes have been removed Oct. 20, 2009
7601645 Methods for fabricating device features having small dimensions Oct. 13, 2009
7601641 Two step optical planarizing layer etch Oct. 13, 2009
7598178 Carbon precursors for use during silicon epitaxial film formation Oct. 6, 2009
7598177 Methods of filling trenches using high-density plasma deposition (HDP) Oct. 6, 2009
7595206 Manufacturing method for semiconductor light emitting device Sep. 29, 2009
7595005 Method and apparatus for ashing a substrate using carbon dioxide Sep. 29, 2009
7592261 Method for suppressing charging of component in vacuum processing chamber of plasma processing system and plasma processing system Sep. 22, 2009
7585780 Method for manufacturing semiconductor device Sep. 8, 2009
7585779 Fabrication method of semiconductor device Sep. 8, 2009
7585778 Method of etching an organic low-k dielectric material Sep. 8, 2009
7585776 Dry etching method of insulating film Sep. 8, 2009
7585775 System and method for faceting a masking layer in a plasma etch to slope a feature edge Sep. 8, 2009
7585774 Method for fabricating metal line of semiconductor device Sep. 8, 2009
7585685 Method of determining wafer voltage in a plasma reactor from applied bias voltage and current and a pair of constants Sep. 8, 2009
7582567 Method for forming CMOS device with self-aligned contacts and region formed using salicide process Sep. 1, 2009
7582532 Method for fabricating semiconductor device Sep. 1, 2009
7578945 Method and apparatus for tuning a set of plasma processing steps Aug. 25, 2009
7573116 Etch aided by electrically shorting upper and lower sidewall portions during the formation of a semiconductor device Aug. 11, 2009
7572736 Method of dry-etching semiconductor devices Aug. 11, 2009
7572732 Method to modulate etch rate in SLAM Aug. 11, 2009
7566664 Selective etching of MEMS using gaseous halides and reactive co-etchants Jul. 28, 2009
7566660 Semiconductor device and method for manufacturing the same Jul. 28, 2009
7566596 Method of manufacturing a thin film transistor substrate and stripping composition Jul. 28, 2009
7566574 Method of performing a double-sided process Jul. 28, 2009
7563723 Critical dimension control for integrated circuits Jul. 21, 2009
7563721 Method for fabricating semiconductor device capable of decreasing critical dimension in peripheral region Jul. 21, 2009
7563382 Mask and method of fabricating the same, and method of machining material Jul. 21, 2009
7563379 Dry etching method and photonic crystal device fabricated by use of the same Jul. 21, 2009
7560391 Forming of trenches or wells having different destinations in a semiconductor substrate Jul. 14, 2009
7560389 Method for fabricating semiconductor element Jul. 14, 2009
7560386 Method of manufacturing nonvolatile semiconductor memory device Jul. 14, 2009
7553769 Method for treating a dielectric film Jun. 30, 2009
7553761 Method of fabricating semiconductor device Jun. 30, 2009
7553679 Method of determining plasma ion density, wafer voltage, etch rate and wafer current from applied bias voltage and current Jun. 30, 2009
7547627 Method for manufacturing semiconductor device Jun. 16, 2009
7547621 LPCVD gate hard mask Jun. 16, 2009
7544531 Ground strap for suppressing stiction during MEMS fabrication Jun. 9, 2009
7541289 Process for removing high stressed film using LF or HF bias power and capacitively coupled VHF source power with enhanced residue capture Jun. 2, 2009
7541270 Methods for forming openings in doped silicon dioxide Jun. 2, 2009
7540971 Plasma etch process using polymerizing etch gases across a wafer surface and additional polymer managing or controlling gases in independently fed gas zones with time and spatial modulation of Jun. 2, 2009
7538377 Semiconductor memory device May. 26, 2009
7538038 Method of removing resist, semiconductor device thereby and method of manufacturing a semiconductor device May. 26, 2009
7538028 Barrier layer, IC via, and IC line forming methods May. 26, 2009



 
 
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