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Class Information
Number: 438/706
Name: Semiconductor device manufacturing: process > Chemical etching > Vapor phase etching (i.e., dry etching)
Description: Processes wherein the chemical etchant is in a gaseous state when brought into contact with the semiconductive substrate.


Sub-classes under this class:

Class Number Class Name Patents
438/735 Differential etching of semiconductor substrate 235
438/734 Sequential etching steps on a single layer 508
438/707 Utilizing electromagnetic or wave energy 164


Patents under this class:

Patent Number Title Of Patent Date Issued
7371263 Plasmaless dry contact cleaning method using interhalogen compounds May. 13, 2008
7368394 Etch methods to form anisotropic features for high aspect ratio applications May. 6, 2008
7368393 Chemical oxide removal of plasma damaged SiCOH low k dielectrics May. 6, 2008
7368392 Method of fabricating a gate structure of a field effect transistor having a metal-containing gate electrode May. 6, 2008
7368064 Cleaning solution and manufacturing method for semiconductor device May. 6, 2008
7365018 Fabrication of semiconductor device for flash memory with increased select gate width Apr. 29, 2008
7365017 Method for finishing metal line for semiconductor device Apr. 29, 2008
7365016 Anhydrous HF release of process for MEMS devices Apr. 29, 2008
7364960 Methods for fabricating solid state image sensor devices having non-planar transistors Apr. 29, 2008
7361916 Coupled nano-resonating energy emitting structures Apr. 22, 2008
7361609 Mask patterns for semiconductor device fabrication and related methods Apr. 22, 2008
7361605 System and method for removal of photoresist and residues following contact etch with a stop layer present Apr. 22, 2008
7361604 Method for reducing dimensions between patterns on a hardmask Apr. 22, 2008
7361287 Method for etching structures in an etching body by means of a plasma Apr. 22, 2008
7358193 Apparatus for forming nanoholes and method for forming nanoholes Apr. 15, 2008
7358192 Method and apparatus for in-situ film stack processing Apr. 15, 2008
7357876 Eliminating printability of sub-resolution defects in imprint lithography Apr. 15, 2008
7354865 Method for removal of pattern resist over patterned metal having an underlying spacer layer Apr. 8, 2008
7354864 Method of producing semiconductor device Apr. 8, 2008
7354525 Specimen surface processing apparatus and surface processing method Apr. 8, 2008
7351664 Methods for minimizing mask undercuts and notches for plasma processing system Apr. 1, 2008
7351663 Removing whisker defects Apr. 1, 2008
7351643 Method of manufacturing a semiconductor device Apr. 1, 2008
7348231 Methods of fabricating semiconductor devices having insulating layers with differing compressive stresses Mar. 25, 2008
7344993 Low-pressure removal of photoresist and etch residue Mar. 18, 2008
7344992 Method for forming via hole and trench for dual damascene interconnection Mar. 18, 2008
7344991 Method and apparatus for multilayer photoresist dry development Mar. 18, 2008
7344955 Cut-and-paste imprint lithographic mold and method therefor Mar. 18, 2008
7344906 Structure and method for releasing stressy metal films Mar. 18, 2008
7344652 Plasma etching method Mar. 18, 2008
7341956 Disposable hard mask for forming bit lines Mar. 11, 2008
7341954 Method and apparatus for determining an operation status of a plasma processing apparatus, program and storage medium storing same Mar. 11, 2008
7341953 Mask profile control for controlling feature profile Mar. 11, 2008
7341952 Multi-layer hard mask structure for etching deep trench in substrate Mar. 11, 2008
7341951 Methods of forming semiconductor constructions Mar. 11, 2008
7338903 Sequential reducing plasma and inert plasma pre-treatment method for oxidizable conductor layer Mar. 4, 2008
7335602 Charge-free layer by layer etching of dielectrics Feb. 26, 2008
7332436 Process of removing residue from a precision surface using liquid or supercritical carbon dioxide composition Feb. 19, 2008
7332262 Photolithography scheme using a silicon containing resist Feb. 19, 2008
7329608 Method of processing a substrate Feb. 12, 2008
7329365 Etchant composition for indium oxide layer and etching method using the same Feb. 12, 2008
7326651 Method for forming damascene structure utilizing planarizing material coupled with compressive diffusion barrier material Feb. 5, 2008
7326650 Method of etching dual damascene structure Feb. 5, 2008
7326647 Dry etching process to form a conductive layer within an opening without use of a mask during the formation of a semiconductor device Feb. 5, 2008
7326358 Plasma processing method and apparatus, and storage medium Feb. 5, 2008
7320941 Plasma stabilization method and plasma apparatus Jan. 22, 2008
7316979 Method and apparatus for providing an integrated active region on silicon-on-insulator devices Jan. 8, 2008
7316975 Method of forming sidewall spacers Jan. 8, 2008
7314833 Method for manufacturing substrate for discrete track recording media and method for manufacturing discrete track recording media Jan. 1, 2008
7312158 Method of forming pattern Dec. 25, 2007



 
 
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